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AN INTENSE ELECTRON BEAM SOURCE

Author
YEHESKEL J; GAZIT D; AVIDA R; FRIEDMAN M
NUCLEAR RES. CENT.-NEGEV/BEER-SHEVA/ISR
Source
JOURNAL OF PHYSICS D: APPLIED PHYSICS; ISSN 0022-3727; GBR; DA. 1983; VOL. 16; NO 4; PP. 499-504; BIBL. 5 REF.
Document type
Article
Language
English
Keyword (fr)
ELECTRONIQUE
Keyword (en)
MIS STRUCTURE VOLTAGE CURRENT CURVE CHEMICAL REACTION IMPURITY DIFFUSION AUGER ELECTRON SPECTROMETRY IMPURITY ALUMINIUM TRANSITION METAL ALLOYS PALLADIUM SILICON ALLOYS SCHOTTKY BARRIER VOLTAGE CURRENT CURVE ELECTRONICS
Keyword (es)
ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL83X0477553

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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