TH INTERNATIONAL CONFERENCE ON X-RAY OPTICS AND MICROANALYSIS. PROCEEDINGS. OSAKA
- Source
- TOKYO UNIV. TOKYO PRESS ?; 1972, P. 1 A 919
- Document type
- Miscellaneous
- Language
- English; French
- Keyword (fr)
- REUNION OSAKA 1971 RAYON X MICROSCOPIE ELECTRONIQUE MICROSONDE ELECTRONIQUE GEOLOGIE GENERALE GEOLOGIE SCIENCES DE LA TERRE
- Keyword (en)
- MEETING X RAY ELECTRON MICROSCOPY MICROPROBE GENERAL GEOLOGY GEOLOGY EARTH SCIENCES
- Keyword (es)
- GEOLOGIA GENERAL GEOLOGIA CIENCIAS DE LA TIERRA
- Classification
- Pascal
- 001 Exact sciences and technology / 001E Earth, ocean, space / 001E01 Earth sciences / 001E01I Stratigraphy
- Discipline
- Earth sciences
- Origin
- Inist-CNRS ; BRGM
- Database
- PASCAL
- INIST identifier
- PASCALGEODEBRGM732242516
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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Istex access
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Europe PubMed Central access
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