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http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=PASCALGEODEBRGM8020098755

DETERMINATION OF TUNGSTEN IN ORES, CONCENTRATES AND PLANT PROCESS MATERIALS USING INTERNAL STANDARD X-RAY FLUORESCENCE SPECTROPHOTOMETRY

Author
HARRIS AM; HINGLE DN
CHARTER CONSOLIDATED LTD., ASHFORD KENT, GBR
Source
X-RAY SPECTROM.; GBR; DA. 1979; VOL. 8; NO 3; PP. 129-134; BIBL. 18 REF.
Document type
Article
Language
English
Keyword (fr)
METHODOLOGIE ANALYSE FLUORESCENCE RX W ROCHE PLANTE PRECISION MESURE MINERAI GEOCHIMIE GEOLOGIE SCIENCES DE LA TERRE
Keyword (en)
CHEMICAL ANALYSIS X-RAY FLUORESCENCE ROCKS PLANT MEASUREMENT ACCURACY ORE GEOCHEMISTRY GEOLOGY EARTH SCIENCES
Keyword (es)
GEOQUIMICA GEOLOGIA CIENCIAS DE LA TIERRA
Classification
Pascal
001 Exact sciences and technology / 001E Earth, ocean, space / 001E01 Earth sciences

Discipline
Earth sciences
Origin
Inist-CNRS ; BRGM
Database
PASCAL
INIST identifier
PASCALGEODEBRGM8020098755

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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