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Fullerenes in Ion SourcesBIRI, Sandor.IEEE transactions on plasma science. 2008, Vol 36, Num 4, pp 1489-1493, issn 0093-3813, 5 p., 2Article

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SIMS surface analysis takes on a new lookECCLES, J.Materials world. 1999, Vol 7, Num 10, pp 619-620, issn 0967-8638Article

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Vacuum arc ion sources : A brief historical reviewBROWN, I. G; OKS, E. M.IEEE transactions on plasma science. 1997, Vol 25, Num 6, pp 1222-1228, issn 0093-3813Article