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Precision semiconductor spectrometry of ionsVERBITSKAYA, E. M; EREMIN, V. K; MALYARENKO, A. M et al.Semiconductors (Woodbury, N.Y.). 1993, Vol 27, Num 11-12, pp 1127-1136, issn 1063-7826Article
Use of CR-39 in Pd/D co-deposition experimentsMOSIER-BOSS, P. A; SZPAK, S; GORDON, F. E et al.EPJ. Applied physics (Print). 2007, Vol 40, Num 3, pp 293-303, issn 1286-0042, 11 p.Article
