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Jump processes in surface diffusionANTCZAK, Grazyna; EHRLICH, Gert.Surface science reports. 2007, Vol 62, Num 2, pp 39-61, issn 0167-5729, 23 p.Article

The field emission from carbon nanotubesFURSEY, G. N; NOVIKOV, D. V; DYUZHEV, G. A et al.Applied surface science. 2003, Vol 215, Num 1-4, pp 135-140, issn 0169-4332, 6 p.Conference Paper

Nanoscale microstructural analysis of metallic materials by atom probe field ion microscopyHONO, K.Progress in materials science. 2002, Vol 47, Num 6, pp 621-729, issn 0079-6425Article

Focused ion-beam specimen preparation for atom probe field-ion microscopy characterization of multilayer film structuresLARSON, D. J; FOORD, D. T; PETFORD-LONG, A. K et al.Nanotechnology (Bristol. Print). 1999, Vol 10, Num 1, pp 45-50, issn 0957-4484Conference Paper

Some aspects of analysis and physical interpretation of LEIS spectraKOKSA, V; DRIMAL, J.Surface and interface analysis. 1995, Vol 23, Num 11, pp 771-778, issn 0142-2421Article

A general protocol for the reconstruction of 3D atom probe dataBAS, P; BOSTEL, A; DECONIHOUT, B et al.Applied surface science. 1995, Vol 87-88, pp 298-304, issn 0169-4332Conference Paper

Field ion microscope studies of single-atom surface diffusion and cluster nucleation on metal surfacesKELLOGG, G. L.Surface science reports. 1994, Vol 21, Num 1-2, pp 1-88, issn 0167-5729Article

Charge-density analyses of the antiferromagnets NiF2 and FeF2 by means of γ-ray diffractionPALMER, A; JAUCH, W.Physical review. B, Condensed matter. 1993, Vol 48, Num 14, pp 10304-10310, issn 0163-1829Article

Layer-by-layer growth of GaAs studied by glancing angle scattering of fast ionsFUJII, Y; NARUMI, K; KIMURA, K et al.Applied physics letters. 1993, Vol 63, Num 15, pp 2070-2072, issn 0003-6951Article

Growth of thin Ti films on Al(110) surfacesSALEH, A. A; SHUTTHANANDAN, V; SMITH, R. J et al.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1993, Vol 11, Num 4, pp 1982-1986, issn 0734-2101, 2Conference Paper

Measurement of the surface dynamics of RbCl(001) via high resolution He atom scatteringBISHOP, G. G; DUAN, J; GILLMAN, E. S et al.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1993, Vol 11, Num 4, pp 2008-2012, issn 0734-2101, 2Conference Paper

Diffusion and desorption of submonolayer platinum deposited on the multi-faceted surface of a tungsten micro-crystalBRYL, Robert; BLASZCZYSZYN, Ryszard.Applied surface science. 2007, Vol 253, Num 14, pp 6096-6102, issn 0169-4332, 7 p.Article

Imaging micropatterned organosilane self-assembled monolayers on silicon by means of scanning electron microscopy and Kelvin probe force microscopyYUNYING WU; HAYASHI, Kazuyuki; SAITO, Nagahiro et al.Surface and interface analysis. 2003, Vol 35, Num 1, pp 94-98, issn 0142-2421, 5 p.Article

A historic perspective of FIM and STM studies of surface diffusionTSONG, Tien T.Materials science & engineering. A, Structural materials : properties, microstructure and processing. 2003, Vol 353, Num 1-2, pp 1-5, issn 0921-5093, 5 p.Conference Paper

An investigation of charged MDO-coatings using proton backscatteringBESPALOVA, O. V; BORISOV, A. M; MICHURINA, V. P et al.Fizika i himiâ obrabotki materialov. 2002, Num 2, pp 63-66, issn 0015-3214Article

Imaging columns of the light elements carbon, nitrogen and oxygen with sub Ångstrom resolutionKISIELOWSKI, C; HETHERINGTON, C. J. D; WANG, Y. C et al.Ultramicroscopy. 2001, Vol 89, Num 4, pp 243-263, issn 0304-3991Article

Field emission 2000: proceedings of the 46th International Field Emission Symposium, Pittsburgh, PA, USA, 23-28 July 2000DANOIX, F; SEIDMAN, D. N.Ultramicroscopy. 2001, Vol 89, Num 1-3, issn 0304-3991, 220 p.Conference Proceedings

3D reconstruction of antiphase boundaries in Cu3Au from field ion imagesDUVAL, S; CHAMBRELAND, S; BLAVETTE, D et al.Applied surface science. 1995, Vol 87-88, pp 284-290, issn 0169-4332Conference Paper

Application of low-energy ion scattering to studies of growthBRONGERSMA, H. H; JACOBS, J.-P.Applied surface science. 1994, Vol 75, Num 1-4, pp 133-138, issn 0169-4332Conference Paper

Absolute atomic-scale measurements of the Gibbsian interfacial excess of solute at internal interfacesKRAKAUER, B. W; SEIDMAN, D. N.Physical review. B, Condensed matter. 1993, Vol 48, Num 9, pp 6724-6727, issn 0163-1829Article

He scattering from substitutionally disordered mixed monolayers : experimental and theoretical studies of Xe+Kr on Pt(111)YANUKA, M; YINNON, A. T; GERBER, R. B et al.The Journal of chemical physics. 1993, Vol 99, Num 10, pp 8280-8289, issn 0021-9606Article

Surface morphology study on CdZnTe single crystals by atomic force microscopyAZOULAY, M; GEORGE, M. A; BURGER, A et al.Journal of vacuum science & technology. B. Microelectronics and nanometer structures. Processing, measurement and phenomena. 1993, Vol 11, Num 2, pp 148-151, issn 1071-1023Conference Paper

The influence of the oxygen exposure on the thermal faceting of W[1 1 1] tipBRYL, Robert; SZCZEPKOWICZ, Andrzej.Applied surface science. 2006, Vol 252, Num 24, pp 8526-8532, issn 0169-4332, 7 p.Article

A method of microtip fabrication based on oxygen induced facetingBRYL, Robert; SZCZEPKOWICZ, Andrzej.Applied surface science. 2005, Vol 241, Num 3-4, pp 431-434, issn 0169-4332, 4 p.Article

Faceting of Pt-covered W, Pt-covered Ir, and Pd-covered Mo field emitter tipsANTCZAK, Grazyna; MADEY, Theodore E; BŁASZCZYSZYN, Maria et al.Vacuum. 2001, Vol 63, Num 1-2, pp 43-51, issn 0042-207XArticle

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