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A generalization of Cattaneo-Mindlin of for thin stripsJÄGER, J.Journal of applied mechanics. 1999, Vol 66, Num 4, pp 1034-1037, issn 0021-8936Article
Texture of magnesium alloy films growth by physical vapour deposition (PVD)GARCES, G; CRISTINA, M. C; TORRALBA, M et al.Journal of alloys and compounds. 2000, Vol 309, Num 1-2, pp 229-238, issn 0925-8388Article
Lattice mismatched molecular beam epitaxy on compliant GaAs/AlxOy/GaAs substrates produced by lateral wet oxidationLUBYSHEV, D; MAYER, T. S; CAI, W.-Z et al.Journal of crystal growth. 1999, Vol 201202, pp 643-647, issn 0022-0248Conference Paper
Low temperature reactions of mesogenic cyanophenyls in solid phase and inert matricesSHABATINA, T. I; VOVK, E. V; ANDREEV, G. N et al.Molecular crystals and liquid crystals science and technology. Section A, Molecular crystals and liquid crystals. 1998, Vol 313, pp 347-354, issn 1058-725XConference Paper
Effect of lattice match and Zn addition on the properties of Hg1-x(Cd1-yZny)xTe epilayers grown by isothermal vapor phase epitaxyKOO, B. H; WANG, J. F; ISHIKAWA, Y et al.Materials science & engineering. B, Solid-state materials for advanced technology. 1999, Vol 60, Num 1, pp 40-45, issn 0921-5107Article
Electrical characterization of polymer thick film resistorWANG, W.-K; CHUNG, C.-T; SU, T.-Y et al.SPIE proceedings series. 1999, pp 619-624, isbn 0-930815-58-0Conference Paper
Firing Thick films in a muffle-less furnace with real-time process monitoringDOWNS, A.SPIE proceedings series. 1999, pp 544-547, isbn 0-930815-58-0Conference Paper
Textured polycrystalline diamond films on Cu metal substrates by hot filament chemical vapor depositionVEDAWYAS, M; SIVANANTHAN, G; KUMAR, Ashok et al.Materials science & engineering. B, Solid-state materials for advanced technology. 2000, Vol 78, Num 1, pp 16-21, issn 0921-5107Article
Diamond replicas from microstructured silicon mastersBJÖRKMAN, H; RANGSTEN, P; HOLLMAN, P et al.Sensors and actuators. A, Physical. 1999, Vol 73, Num 1-2, pp 24-29, issn 0924-4247Article
Atomic-scale surface structure determination : Comparison of techniquesVAN HOVE, M. A.Surface and interface analysis. 1999, Vol 28, Num 1, pp 36-43, issn 0142-2421Conference Paper
Titanium nitride - silicon nitride composite coatings deposited by reactive magnetron sputteringPATSCHEIDER, J; DISERENS, M; LEVY, F et al.Materials science forum. 1998, issn 0255-5476, isbn 0-87849-815-X, p. 267Conference Paper
In situ synchrotron X-ray studies of ferroelectric thin filmsFONG, D. D; EASTMAN, J. A; STEPHENSON, G. B et al.Journal of synchrotron radiation. 2005, Vol 12, pp 163-167, issn 0909-0495, 5 p., 2Conference Paper
Détermination de l'état de contraintes résiduelles dans des couches auto-supportées de diamant-CVD par diffraction de rayons X = Residual stresses determination of self-supported cvd-diamond layers by X-ray diffractionDURAND, O; OLIVIER, J; BISARO, R et al.Journal de physique. IV. 2000, Vol 10, Num 10, pp Pr10-171, issn 1155-4339, -10.183Conference Paper
Liquid phase epitaxy of films with langasite structureCHANI, V. I; TAKEDA, H; FUKUDA, T et al.Materials science & engineering. B, Solid-state materials for advanced technology. 1999, Vol 60, Num 3, pp 212-216, issn 0921-5107Article
Direct measurement of the lattice parameter of thick stable zinc-blende MgTe layerDYNOWSKA, E; JANIK, E; BAK-MISIUK, J et al.Journal of alloys and compounds. 1999, Vol 286, Num 1-2, pp 276-278, issn 0925-8388Conference Paper
Reflection and transmission X-ray topographic study of a SiC crystal and epitaxial waferYAMAGUCHI, H; NISHIZAWA, S; BAHNG, W et al.Materials science & engineering. B, Solid-state materials for advanced technology. 1999, Vol 61-62, pp 221-224, issn 0921-5107Conference Paper
Effect of multi-coating process on the orientation and microstmcture of lead zirconate titanate (PZT) thin films derived by chemical solution depositionKOBAYASHI, T; ICHIKI, M; TSAUR, J et al.Thin solid films. 2005, Vol 489, Num 1-2, pp 74-78, issn 0040-6090, 5 p.Article
Production of large scale polycrystalline MoS2 filmsLEMON, K. S; JAKOVIDIS, G; SINGH, A et al.Physica status solidi. A. Applied research. 2000, Vol 179, Num 2, pp 329-335, issn 0031-8965Article
Orientation transition in a thick laser deposited YBa2Cu3O7-x film observed by glancing angle X-ray diffractionJOO HYUNG PARK; SANG YEOL LEE.Physica. C. Superconductivity and its applications. 1999, Vol 314, Num 1-2, pp 112-116Article
Low temperature growth of p-type crystalline silicon films by ECR plasma CVDWANG, L; REEHAL, H. S.Thin solid films. 1999, Vol 343-4, pp 571-574, issn 0040-6090Conference Paper
Epitaxial growth of 4H-SiC by sublimation close space techniqueNISHINO, S; MATSUMOTO, K; YOSHIDA, T et al.Materials science & engineering. B, Solid-state materials for advanced technology. 1999, Vol 61-62, pp 121-124, issn 0921-5107Conference Paper
MicroRaman and phase stepping microscopy analysis of growth defects in GaAs/GaAs epilayersMARTIN, P; RAMOS, J; JIMENEZ, J et al.Materials science and technology. 1998, Vol 14, Num 12, pp 1286-1290, issn 0267-0836Conference Paper
Dip-coating of YBa2Cu3O7-δ and YBa2Cu3O7-δ-Ag films on polycrystalline rare-earth barium niobate substratesKURIAN, J; KOSHY, J.Journal of superconductivity. 1999, Vol 12, Num 2, pp 445-450, issn 0896-1107Conference Paper
Epitaxial growth of SiC in a new multi-wafer VPE reactorKARLSSON, S; NORDELL, N; SPADAFORA, F et al.Materials science & engineering. B, Solid-state materials for advanced technology. 1999, Vol 61-62, pp 143-146, issn 0921-5107Conference Paper
Purity and surface structure of thick 6H and 4H SiC layers grown by sublimation epitaxySYVÄJÄRVI, M; YAKIMOVA, R; JOHANSSON, E. A. M et al.Materials science & engineering. B, Solid-state materials for advanced technology. 1999, Vol 61-62, pp 147-150, issn 0921-5107Conference Paper