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Results 1 to 25 of 306

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Secondary electron emission from single-walled carbon nanotubesALAM, M. K; ESLAMI, S. P; NOJEH, A et al.Physica. E, low-dimentional systems and nanostructures. 2009, Vol 42, Num 2, pp 124-131, issn 1386-9477, 8 p.Article

Homogenization mechanism of the residual surface potential of insulating specimens under electron beam irradiationLI, Jing-Jing; ZHANG, Hai-Bo; FENG, Ren-Jian et al.Journal of physics. D, Applied physics (Print). 2007, Vol 40, Num 3, pp 826-833, issn 0022-3727, 8 p.Article

Electron emission from solids under electron irradiation: a Monte Carlo studyHAKALA, M; CORBEL, C; NIEMINEN, R. M et al.Journal of physics. D, Applied physics (Print). 2005, Vol 38, Num 5, pp 711-721, issn 0022-3727, 11 p.Article

Determination of the evolution of the surface potential of a charging insulator by measuring the intensity of its X-ray characteristic peaksASKRI, B; RENOUD, R; RAOUADI, K et al.EPJ. Applied physics (Print). 2005, Vol 32, Num 1, pp 29-36, issn 1286-0042, 8 p.Article

Abnormal electron emission from MgO thin film under ion irradiationTSUJITA, T; NAGATOMI, T; TAKAI, Y et al.Surface and interface analysis. 2005, Vol 37, Num 2, pp 137-140, issn 0142-2421, 4 p.Conference Paper

Secondary electron emission of an insulating target induced by a well-focused electron beam: Monte Carlo simulation studyRENOUD, R; MADY, F; ATTARD, C et al.Physica status solidi. A. Applied research. 2004, Vol 201, Num 9, pp 2119-2133, issn 0031-8965, 15 p.Article

Secondary electron emission from CVD diamond filmsDVORKIN, V. V; DZBANOVSKY, N. N; SUETIN, N. V et al.Diamond and related materials. 2003, Vol 12, Num 12, pp 2208-2218, issn 0925-9635, 11 p.Article

4th International Vacuum Electron Sources, Conference in Saratov, Russia, July 15-19, 2002 (IVESC 2002)GAERTNER, Georg; ANIKIN, Valery M; SINITSYN, Nikolai I et al.Applied surface science. 2003, Vol 215, Num 1-4, issn 0169-4332, 341 p.Conference Proceedings

The ion- and atom-induced secondary electron emission yield: numerical study for the effect of clean and dirty cathode surfacesBOGAERTS, Annemie; GIJBELS, Renaat.Plasma sources science & technology (Print). 2002, Vol 11, Num 1, pp 27-36, issn 0963-0252Article

Target material dependence of secondary electron images induced by focused ion beamsOHYA, K; ISHITANI, T.Surface & coatings technology. 2002, Vol 158-59, pp 8-13, issn 0257-8972Conference Paper

Spin-polarized low-energy (e, 2e) spectroscopy of non-magnetic surfacesGOLLISCH, H; XIAO YI; SCHEUNEMANN, T et al.Journal of physics. Condensed matter (Print). 1999, Vol 11, Num 48, pp 9555-9570, issn 0953-8984Article

Measurements of secondary electron-emission coefficients and cathodoluminescence spectra for annealed alumina ceramicsSATO, T; KOBAYASHI, S; MICHIZONO, S et al.Applied surface science. 1999, Vol 144-45, pp 324-328, issn 0169-4332Conference Paper

Real-time observation of surface charging on a cylindrical insulator in vacuumYAMAMOTO, O; TAKUMA, T; HAMADA, S et al.International symposium on discharges and electrical insulation in vacuum. 1998, isbn 0-7803-3953-3, 2Vol, Vol 1, 143-146Conference Paper

Band model for electron emission from diamond-like carbon and diamondROBERTSON, J; MILNE, W.Journal of non-crystalline solids. 1998, Vol 227-30, pp 558-564, issn 0022-3093, aConference Paper

Secondary electron emission coefficient for fission fragments with a fixed mass and kinetic energyRYKOV, V. A; D'YACHENKO, P. P.Atomic energy (New York, N.Y.). 1997, Vol 83, Num 4, pp 730-737, issn 1063-4258Article

Cooling effect of secondary electrons in high temperature divertor operationWANG, W. X; OKAMOTO, M; NAKAJIMA, N et al.Nuclear fusion. 1997, Vol 37, Num 10, pp 1445-1453, issn 0029-5515Article

Multiplicité des électrons secondaires émis par des cibles minces de carbone sous l'impact de projectiles H0, H+2 et H+3 d'énergie de l'ordre du MeV = Multiplicity of secondary electron emitted by thin carbon foils under the impact of H0, H+2 and H+3 projectiles having energies varying from 0.25 to 2.2 MeVVidovic, Zvonimir; Fallavier, Mireille.1997, 131 p.Thesis

Secondary electron emission studiesSHIH, A; YATER, J; HER, C et al.Applied surface science. 1997, Vol 111, pp 251-258, issn 0169-4332Conference Paper

Energy and angular distribution of secondary electrons emitted from Si(111)-7×7, √3×√3-Ag and 5×2-Au surfacesENDO, A; INO, S.Surface science. 1996, Vol 346, Num 1-3, pp 40-48, issn 0039-6028Article

Study of secondary emission from plasma polymerized materialsNOVAK, S; HIRACH, R; CALUSINSKI, B et al.International journal of electronics. 1995, Vol 78, Num 1, pp 139-142, issn 0020-7217Conference Paper

Extended fine structure in the secondary electron emission spectra of graphite and glassy carbonHOFFMAN, A; BRENER, R; CYTERMANN, C et al.Surface and interface analysis. 1994, Vol 22, Num 1-12, pp 590-593, issn 0142-2421Conference Paper

Electron backscattering and secondary electron emission from carbon targets : comparison of experimental results with Monte Carlo simulationsFARHANG, H; NAPCHAN, E; BLOTT, B. H et al.Journal of physics. D, Applied physics (Print). 1993, Vol 26, Num 12, pp 2266-2271, issn 0022-3727Article

Secondary electrons induced by fast ions under channeling conditions. II, Screening of fast heavy ions in solidsKUDO, H; SHIMA, K; SEKI, S et al.Physical review. B, Condensed matter. 1991, Vol 43, Num 16A, pp 12736-12743, issn 0163-1829, 8 p.Article

Bulk and surface electron emission induced by ion bombardment : methods of observationSOSZKA, W.Journal of physics. Condensed matter (Print). 1991, Vol 3, Num 42, pp 8289-8296, issn 0953-8984Article

Electron-beam-induced current images of sectioned p/n junctions in silicon : influence of surface states at low acceleration voltagesKUHNERT, R.Journal of applied physics. 1991, Vol 70, Num 1, pp 476-484, issn 0021-8979Article

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