Pascal and Francis Bibliographic Databases

Help

Search results

Your search

cc.\*:("001B70I60D")

Document Type [dt]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Publication Year[py]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Discipline (document) [di]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Language

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Author Country

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Results 1 to 25 of 787

  • Page / 32
Export

Selection :

  • and

X-ray photoelectron spectroscopy studies the cation valencies and distributions in crednerite-Cu1.1Mn0.9O2 thin filmsCHEN, Hong-Ying; HSU, Da-Je.Journal of alloys and compounds. 2014, Vol 598, pp 23-26, issn 0925-8388, 4 p.Article

Direct graphene growth on Co3O4(111) by molecular beam epitaxyMI ZHOU; PASQUALE, Frank L; DOWBEN, Peter A et al.Journal of physics. Condensed matter (Print). 2012, Vol 24, Num 7, issn 0953-8984, 072201.1-072201.6Article

In situ investigation on transformation of valence on the surface of the Zr0.9Ti0.1V2 alloy during thermal activationXIAOWEI YANG; JINSHAN LI; TIEBANG ZHANG et al.Solid state communications. 2011, Vol 151, Num 11, pp 842-845, issn 0038-1098, 4 p.Article

Femtosecond-laser photoemission and photodesorption from magnesia supported gold clustersVAIDA, Mihai E; GLEITSMANN, Tobias; TCHITNGA, Robert et al.Physica status solidi. B. Basic research. 2010, Vol 247, Num 5, pp 1139-1146, issn 0370-1972, 8 p.Article

Self-assembled monolayers of flufenaminate anions on mild steel surface formed in aqueous solutionKAZANSKY, Leonid P; KUZNETSOV, Yuri I; ANDREEVA, Nina P et al.Applied surface science. 2010, Vol 257, Num 4, pp 1166-1174, issn 0169-4332, 9 p.Article

Angle-resolved photoelectron spectroscopy study of hydrogen adsorption on ZnO(1010)OZAWA, K; MASE, K.Physica status solidi. A, Applications and materials science (Print). 2010, Vol 207, Num 2, pp 277-281, issn 1862-6300, 5 p.Conference Paper

Changes in the adsorbate dipole layer with changing d-filling of the metal (II) (Co, Ni, Cu) phthalocyanines on Au(111)JIE XIAO; DOWBEN, Peter A.Journal of physics. Condensed matter (Print). 2009, Vol 21, Num 5, issn 0953-8984, 052001.1-052001.5Article

Low pressure oxidation of ordered Sn/Pd(110) surface alloysTSUD, N; SKALA, T; SUTARA, F et al.Journal of physics. Condensed matter (Print). 2009, Vol 21, Num 18, issn 0953-8984, 185011.1-185011.9Article

O-and H-induced surface core level shifts on Ru(0001) : prevalence of the additivity ruleLIZZIT, S; ZHANG, Y; KOSTOV, K. L et al.Journal of physics. Condensed matter (Print). 2009, Vol 21, Num 13, issn 0953-8984, 134009.1-134009.9Article

Infrared reflectance and photoemission spectroscopy studies across the phase transition boundary in thin film vanadium dioxideRUZMETOV, Dmitry; ZAWILSKI, Kevin T; SENANAYAKE, Sanjaya D et al.Journal of physics. Condensed matter (Print). 2008, Vol 20, Num 46, issn 0953-8984, 465204.1-465204.5Article

Surface characterization of TiO2 thin films obtained by high-energy reactive magnetron sputteringWASIELEWSKI, R; DOMARADZKI, J; WOJCIESZAK, D et al.Applied surface science. 2008, Vol 254, Num 14, pp 4396-4400, issn 0169-4332, 5 p.Conference Paper

Towards a full Heusler alloy showing room temperature half-metallicity at the surface : New materials with high spin polarization: Half-metallic Heusler compoundsCINCHETTI, M; WÜSTENBERG, J.-P; SANCHEZ ALBANEDA, M et al.Journal of physics. D, Applied physics (Print). 2007, Vol 40, Num 6, pp 1544-1547, issn 0022-3727, 4 p.Article

Thickness measurement of SiO2 films thinner than 1 nm by X-ray photoelectron spectroscopyKYUNG JOONG KIM; KI TAE PARK; JONG WAN LEE et al.Thin solid films. 2006, Vol 500, Num 1-2, pp 356-359, issn 0040-6090, 4 p.Article

Dependence of the band structure of C60 monolayers on molecular orientations and doping observed by angle resolved photoemissionBROUET, V; YANG, W. L; ZHOU, X. J et al.The Journal of physics and chemistry of solids. 2006, Vol 67, Num 1-3, pp 218-222, issn 0022-3697, 5 p.Conference Paper

Effect of the adsorbate motion on the femtosecond time dependence of the two-photon photoemission signal in the Cs/Cu(111) systemGAUYACQ, J. P; KAZANSKY, A. K.Physical review B. Condensed matter and materials physics. 2005, Vol 72, Num 4, pp 045418.1-045418.12, issn 1098-0121Article

Interaction of oxygen with ZrC(001) and VC(001) : Photoemission and first-principles studiesRODRIGUEZ, J. A; LIU, P; GOMES, J et al.Physical review B. Condensed matter and materials physics. 2005, Vol 72, Num 7, pp 075427.1-075427.11, issn 1098-0121Article

Surface and electronic structure of Ga0.92In0.08N thin film investigated by photoelectron spectroscopyKOWALSKI, B. J; KOWALIK, I. A; POROWSKI, S et al.Thin solid films. 2005, Vol 476, Num 2, pp 396-404, issn 0040-6090, 9 p.Article

Variations in the physico-chemical properties of near-stoichiometric silica deposited from SiH4-N2O and SiH4-N2O-He radiofrequency dischargesCHAYANI, M; CAQUINEAU, H; DESPAX, B et al.Thin solid films. 2005, Vol 471, Num 1-2, pp 53-62, issn 0040-6090, 10 p.Article

Chemical modification of DLC films with perfluorooctyl functionalityNAKAMURA, T; OHANA, T; SUZUKI, M et al.Diamond and related materials. 2005, Vol 14, Num 3-7, pp 1019-1022, issn 0925-9635, 4 p.Conference Paper

Surface and nanomechanical properties of Si:C:H films prepared by RF plasma beam CVDTOTH, A; MOHAI, M; UJVARI, T et al.Diamond and related materials. 2005, Vol 14, Num 3-7, pp 954-958, issn 0925-9635, 5 p.Conference Paper

Catalytic surface oxidation by rare-earth metals: A photoemission study of Gd- and Y-promoted oxidation of W(110)BLYTH, R. I. R; SEARLE, C; TUCKER, N. P et al.Physical review B. Condensed matter and materials physics. 2004, Vol 70, Num 4, pp 045402.1-045402.8, issn 1098-0121Article

A comparative photoemission study of polar and nonpolar SiC surfaces oxidized in N2OJOHANSSON, L. I; VIROJANADARA, C; EICKHOFF, Th et al.Surface science. 2004, Vol 552, Num 1-3, pp 251-259, issn 0039-6028, 9 p.Article

Influence of dopant concentration and type of substrate on the local organization of low-pressure chemical vapour deposition in situ boron doped silicon films from silane and boron trichlorideGAUSSAT, B; SCHEID, E; DE MAUDUIT, B et al.Thin solid films. 2004, Vol 446, Num 2, pp 218-226, issn 0040-6090, 9 p.Article

Influence of Ar, Kr, and Xe layers on the energies and lifetimes of image-potential states on Cu(100)BERTHOLD, W; REBENTROST, F; FEULNER, P et al.Applied physics. A, Materials science & processing (Print). 2004, Vol 78, Num 2, pp 131-140, issn 0947-8396, 10 p.Article

Growth of highly-oriented diamond films on 6H-SiC (0001) and Si (111) substrates and the effect of carburizationLEE, Tae-Hoon; SEO, Soo-Hyung; KANG, Seung-Min et al.Thin solid films. 2004, Vol 447-48, pp 231-238, issn 0040-6090, 8 p.Conference Paper

  • Page / 32