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Time-resolved valence band phtoelectron spectroscopy of liquid AuSnSTUPP, H; BOYEN, H.-G; GANTNER, G et al.Journal of physics. Condensed matter (Print). 1996, Vol 8, Num 47, pp 9373-9377, issn 0953-8984Conference Paper

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X-ray photoelectron spectroscopy of ZnCl₂ based glassesKADONO, K; KINUGAWA, K; TANAKA, H et al.Physics and chemistry of glasses. 1994, Vol 35, Num 2, pp 59-64, issn 0031-9090Article

X-ray photoelectron spectroscopy and ionic transport studies on lead fluoroborate glassesGOPALAKRISHNAN, R; TAN, K. L; CHOWDARI, B. V. R et al.Journal of physics. D, Applied physics (Print). 1994, Vol 27, Num 12, pp 2612-2618, issn 0022-3727Article

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Temperature dependent photoemission spectroscopy on lightly-doped sodium tungsten bronzePAUL, Sanhita; GHOSH, Anirudha; CHAKRABORTY, Anirban et al.Solid state communications. 2012, Vol 152, Num 6, pp 493-496, issn 0038-1098, 4 p.Article

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Effect of electron irradiation on Na-K silicate glass investigated using X-ray photoelectron spectroscopy and pattern recognition methodLESIAK, B; ZEMEK, J; JIRICEK, P et al.Journal of non-crystalline solids. 2008, Vol 354, Num 32, pp 3840-3848, issn 0022-3093, 9 p.Article

Investigation of gap states in phosphorous-doped ultra-thin a-Si:H by near-UV photoelectron spectroscopyKORTE, L; SCHMIDT, M.Journal of non-crystalline solids. 2008, Vol 354, Num 19-25, pp 2138-2143, issn 0022-3093, 6 p.Conference Paper

Xps study of amorphous carbon nitride (a-C:N) thin films deposited by reactive RF sputteringECH-CHAMIKH, E; ESSAFTI, A; IJDIYAOU, Y et al.Solar energy materials and solar cells. 2006, Vol 90, Num 10, pp 1420-1423, issn 0927-0248, 4 p.Conference Paper

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Structure and chemical studies of As₂S₃ glasses used for waveguide applicationsSEAL, S; RICHARDSON, K. A; LOPEZ, C et al.Physics and chemistry of glasses. 2002, Vol 43, Num 1, pp 59-65, issn 0031-9090Article

High resolution photoemission spectroscopy study near the Fermi edge for different surfaces prepared on the icosahedral AlPdMn phaseSCHAUB, T; DELAHAVE, J; BERGER, C et al.The European physical journal. B, Condensed matter physics. 2001, Vol 20, Num 2, pp 183-188, issn 1434-6028Article

Surface modification of a silicate glass during XPS experimentsSHARMA, A; JAIN, H; MILLER, A. C et al.Surface and interface analysis. 2001, Vol 31, Num 5, pp 369-374, issn 0142-2421Conference Paper

XPS study of the chemical bonding in hydrogenated amorphous germanium-carbon alloysVILCARROMERO, J; MARQUES, F. C.Applied physics. A, Materials science & processing (Print). 2000, Vol 70, Num 5, pp 581-585, issn 0947-8396Article

Photoemission studies of quasicrystalsSTADNIK, Zbigniew M.Materials science & engineering. A, Structural materials : properties, microstructure and processing. 2000, Vol 294-96, pp 470-474, issn 0921-5093Conference Paper

An EELS and EXELFS study of amorphous hydrogenated silicon carbideCOOK, A; FITZGERALD, A. G; FARIDAH IBRAHIM et al.Mikrochimica acta (1966. Print). 1994, Vol 114-15, pp 255-260, issn 0026-3672Conference Paper

X-ray photoelectron spectroscopy study of sodium―copper―germanate glassesMEKKI, A; KHATTAK, G. D.Physica status solidi. A, Applications and materials science (Print). 2010, Vol 207, Num 1, pp 73-79, issn 1862-6300, 7 p.Article

Chemical states of GeTe thin-film during structural phase-change by annealing in ultra-high vacuumKO, C; LEE, Y. M; SHIN, H. J et al.The European physical journal. B, Condensed matter physics (Print). 2008, Vol 66, Num 2, pp 171-174, issn 1434-6028, 4 p.Article

Electronic and structural changes induced by irradiation or annealing in pulsed laser deposited As₅₀Se₅₀ films. An XPS and UPS studyKALYVA, M; SIOKOU, A; YANNOPOULOS, S. N et al.The Journal of physics and chemistry of solids. 2007, Vol 68, Num 5-6, pp 906-910, issn 0022-3697, 5 p.Conference Paper