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FAST VOLUME DETERMINATION USING A DIFFERENTIAL CAPACITANCE MANOMETER.NORSTROM H; BERG S; ANDERSSON LP et al.1977; VACUUM; G.B.; DA. 1977; VOL. 27; NO 3; PP. 99-101; BIBL. 2 REF.; (INT. SYMP. VAC. THIN FILM TECHNOL. PROC.; UPPSALA; 1976)Conference Paper

ELECTRICAL DEFECTS IN SILICON INTRODUCED BY SPUTTERING AND SPUTTER-ETCHINGGRUSELL E; BERG S; ANDERSSON LP et al.1980; J. ELECTROCHEM. SOC.; ISSN 0013-4651; USA; DA. 1980; VOL. 127; NO 7; PP. 1573-1576; BIBL. 10 REF.Article

THE PARALLEL-PLATE ELECTRON MULTIPLIERANDERSSON LP; GRUSELL E; BERG S et al.1979; J. PHYS. E; ISSN 0022-3735; GBR; DA. 1979; VOL. 12; NO 11; PP. 1015-1022; BIBL. 2 P.Article

THE EFFECTS OF ACETIC ACID ON COLLAGEN CROSS-LINKSDAVISON PF; CANNON DJ; ANDERSSON LP et al.1972; CONNECT. TISSUE RES.; G.B.; DA. 1972; VOL. 1; NO 3; PP. 205-216; BIBL. 30 REF.Serial Issue

SUBSTRATE SURFACE DAMAGES BY RF-SPUTTERING.BERG S; ANDERSSON LP; NORSTROM H et al.1977; VACUUM; G.B.; DA. 1977; VOL. 27; NO 3; PP. 189-191; BIBL. 9 REF.; (INT. SYMP. VAC. THIN FILM TECHNOL. PROC.; UPPSALA; 1976)Conference Paper

MULTIDETECTOR ARRAY OF PARALLEL PLATE ELECTRON MULTIPLIERSOLAISON R; GELIN B; BERG S et al.1978; PHYS. SCRIPTA; SWE; DA. 1978; VOL. 18; NO 6; PP. 364-366; BIBL. 6 REF.Article

APPLICATION OF THE LANGMUIR PROBE IN SPUTTERING TECHNIQUESNORSTROM H; OLAISON R; BERG S et al.1980; J. ELECTROCHEM. SOC.; ISSN 0013-4651; USA; DA. 1980; VOL. 127; NO 12; PP. 2680-2682; BIBL. 6 REF.Article