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Quantification of Thin Film Crystallographic Orientation Using X-ray Diffraction with an Area DetectorBAKER, Jessy L; JIMISON, Leslie H; MANNSFELD, Stefan et al.Langmuir. 2010, Vol 26, Num 11, pp 9146-9151, issn 0743-7463, 6 p.Article

Device-Scale Perpendicular Alignment of Colloidal NanorodsBAKER, Jessy L; WIDMER-COOPER, Asaph; TONEY, Michael F et al.Nano letters (Print). 2010, Vol 10, Num 1, pp 195-201, issn 1530-6984, 7 p.Article

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