Carbon 1s near-edge-absorption fine structure in graphiteBATSON, P. E.Physical review. B, Condensed matter. 1993, Vol 48, Num 4, pp 2608-2610, issn 0163-1829Article

Electronic structure in confined volumes using spatially resolved electron energy loss scatteringBATSON, P. E.Materials science & engineering. B, Solid-state materials for advanced technology. 1992, Vol 14, Num 3, pp 297-303Conference Paper

High-energy resolution electron spectrometer for 1-nm spatial analysisBATSON, P. E.Review of scientific instruments. 1986, Vol 57, Num 1, pp 43-48, issn 0034-6748Article

Silicon L_2,3 near-edge fine structure in confined volumesBATSON, P. E.Ultramicroscopy. 1993, Vol 50, Num 1, pp 1-12, issn 0304-3991Article

Symmetry-selected electron-energy-loss scattering in diamondBATSON, P. E.Physical review letters. 1993, Vol 70, Num 12, pp 1822-1825, issn 0031-9007Article

Surface plasmon scattering on flat surfaces at grazing incidenceBATSON, P. E.Ultramicroscopy. 1983, Vol 11, Num 4, pp 299-302, issn 0304-3991Article

Distortion of the core exciton by the swift electron and plasmon wake in spatially resolved electron-energy-loss scatteringBATSON, P. E.Physical review. B, Condensed matter. 1993, Vol 47, Num 12, pp 6898-6910, issn 0163-1829Article

Silicon L_2,3 core absorption obtained at the buried Al/Si(111) interfaceBATSON, P. E.Physical review. B, Condensed matter. 1991, Vol 44, Num 11, pp 5556-5561, issn 0163-1829Article

Parallel detection for high-resolution electron energy loss studies in the scanning transmission electron microscopeBATSON, P. E.Review of scientific instruments. 1988, Vol 59, Num 7, pp 1132-1138, issn 0034-6748Article

Simultaneous STEM imaging and electron energy-loss spectroscopy with atomic-column sensitivityBATSON, P. E.Nature (London). 1993, Vol 366, Num 6457, pp 727-728, issn 0028-0836Article

Dynamic screening of the core exciton by swift electrons in electron-energy-loss scatteringBATSON, P. E; BRULEY, J.Physical review letters. 1991, Vol 67, Num 3, pp 350-353, issn 0031-9007, 4 p.Article

Experimental energy-loss function, Im[-1/∈(q,ω)], for aluminium = Fonction de perte d'énergie expérimentale, Im[-1/∈(q,ω)], pour l'aluminiumBATSON, P. E; SILCOX, J.Physical review. B, Condensed matter. 1983, Vol 27, Num 9, pp 5224-5239, issn 0163-1829Article

Electron-energy-loss studies of dislocations in diamondBRULEY, J; BATSON, P. E.Physical review. B, Condensed matter. 1989, Vol 40, Num 14, pp 9888-9894, issn 0163-1829, 7 p.Article

Spatial resolution energy loss spectroscopyBATSON, P. E.Ultramicroscopy. 1992, Vol 47, Num 1-3, pp 133-144, issn 0304-3991Conference Paper

Single electron calculations for the Si L_2,3 near edge structureXUDONG WENG; REZ, P; BATSON, P. E et al.Solid state communications. 1990, Vol 74, Num 9, pp 1013-1016, issn 0038-1098, 4 p.Article

Sub-ångstrom resolution using aberration corrected electron opticsBATSON, P. E; DELLBY, N; KRIVANEK, O. L et al.Nature (London). 2002, Vol 418, Num 6898, pp 617-620, issn 0028-0836Article

Electron energy loss spectroscopy of single silicon nanocrystals : the conduction bandBATSON, P. E; HEATH, J. R.Physical review letters. 1993, Vol 71, Num 6, pp 911-914, issn 0031-9007Article

Anisotropy in the near-edge absorption fine structure of YBa₂Cu₃O_7-δBATSON, P. E; CHISHOLM, M. F.Physical review. B, Condensed matter. 1988, Vol 37, Num 1, pp 635-637, issn 0163-1829Article

Conduction bandstructure in strained silicon by spatially resolved electron energy loss spectroscopyBATSON, P. E.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 63-70, issn 0304-3991Conference Paper

Conduction band structure of Ge_xSi_1-x using spatially resolved electron energy-loss scatteringBATSON, P. E; MORAR, J. F.Applied physics letters. 1991, Vol 59, Num 25, pp 3285-3287, issn 0003-6951Article

Quantum size effects in the surface-plasmon excitation of small metallic particles by electron-energy-loss spectroscopyOUYANG, F; BATSON, P. E; ISAACSON, M et al.Physical review. B, Condensed matter. 1992, Vol 46, Num 23, pp 15421-15425, issn 0163-1829Article

Aberration correction results in the IBM STEM instrumentBATSON, P. E.Ultramicroscopy. 2003, Vol 96, Num 3-4, pp 239-249, issn 0304-3991, 11 p.Conference Paper

Heterojunction band lineups in Si-Ge alloys using spatially resolved electron-energy-loss spectroscopyMORAR, J. F; BATSON, P. E; TERSOFF, J et al.Physical review. B, Condensed matter. 1993, Vol 47, Num 7, pp 4107-4110, issn 0163-1829Article

Advanced spatially resolved EELS in the STEMBATSON, P. E.Ultramicroscopy. 1999, Vol 78, Num 1-4, pp 33-42, issn 0304-3991Conference Paper

Graded electronic structure in a 3 nm strained Ge₄₀Si₆₀ quantum wellBATSON, P. E; MORAR, J. F.Physical review letters. 1993, Vol 71, Num 4, pp 609-612, issn 0031-9007Article