au.\*:("BINDLEY, Glenn")
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Uniformity of Charge Collection Efficiency in Frisch Collar Spectrometer with THM Grown CdZnTe CrystalsKARGAR, Alireza; BROOKS, Adam C; HARRISON, Mark J et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7449, issn 0277-786X, isbn 978-0-8194-7739-2 0-8194-7739-7, 1Vol, 744908.1-744908.13Conference Paper
Dual-illumination NIR system for wafer level defect inspectionWILLIAMS, Yana; HARDING, Kevin; ABRAMOVICH, Gil et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7793, issn 0277-786X, isbn 978-0-8194-8289-1, 77930I.1-77930I.9Conference Paper
Performance of CdZnTe Pixellated Radiation Detectors Assembled by a New Attachment MethodPINGHE LU; CHEN, Henry; AWADALLA, Salah et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7805, issn 0277-786X, isbn 978-0-8194-8301-0, 78051T.1-78051T.7Conference Paper
The Final Surface Treatment Effect on Performance of CdZnTe Frisch Collar Gamma Ray DetectorsKARGAR, Alireza; BROOKS, Adam C; KOHMAN, Kyle T et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7079, pp 70790B.1-70790B.12, issn 0277-786X, isbn 978-0-8194-7299-1 0-8194-7299-9Conference Paper