On the adaptive lattice notch filter for the detection of sinusoidsCHO, N. I; LEE, S. U.IEEE transactions on circuits and systems. 2, Analog and digital signal processing. 1993, Vol 40, Num 7, pp 405-416, issn 1057-7130Article

The formation of Ni-Zn ferrites through self-propagating high-temperature synthesisCHOI, Y; CHO, N. I.Journal of materials science letters. 1999, Vol 18, Num 8, pp 655-658, issn 0261-8028Article

Study of Co- and Ni-based ohmic contacts to n-type 4H-SiCYANG, S. J; KIM, C. K; NOH, I. H et al.Diamond and related materials. 2004, Vol 13, Num 4-8, pp 1149-1153, issn 0925-9635, 5 p.Conference Paper

The possibility of pulsed laser deposited organic thin films for light-emitting diodesHONG, C; CHAE, H. B; LEE, K. H et al.Thin solid films. 2002, Vol 409, Num 1, pp 37-42, issn 0040-6090, 6 p.Conference Paper

Voice activity detection using phase vector in microphone arrayKIM, G; CHO, N. I.Electronics Letters. 2007, Vol 43, Num 14, pp 783-784, issn 0013-5194, 2 p.Article

Clamping effect on the microwave properties of ferroelectric thin filmsPOPLAVKO, Y; CHO, N.-I.Semiconductor science and technology. 1999, Vol 14, Num 11, pp 961-966, issn 0268-1242Article

1/f noise in thin metal films interacting with silicon substrates = Bruit «1/f» dans les couches minces métalliques en interaction avec des supports de siliciumBENE, R. W; LEE, G. S; CHO, N. I et al.Thin solid films. 1985, Vol 129, Num 3-4, pp 195-204, issn 0040-6090Article

IKONOS image fusion by minimisation of spectral distortion using MAP estimatorKIM, H. C; KUK, J. G; SONG, H. S et al.Electronics Letters. 2007, Vol 43, Num 18, pp 970-971, issn 0013-5194, 2 p.Article

Cu/Si/Cu multilayer structures for Ohmic contact on n-type 4H-SiC substratesCHO, N. I; CHOI, Y; NOH, S. J et al.Diamond and related materials. 2004, Vol 13, Num 4-8, pp 1154-1157, issn 0925-9635, 4 p.Conference Paper

Laser annealing effect of SiC films prepared by PECVD (plasma enhanced chemical vapor deposition)CHO, N. I; KIM, Y. M; LIM, J. S et al.Thin solid films. 2002, Vol 409, Num 1, pp 1-7, issn 0040-6090, 7 p.Conference Paper

Measurements of fractal dimension for Co-Si interfacial layers = Mesures de la dimension fractale des couches interfaciales Co-SiCHO, N. I; BENE, R. W.Applied physics letters. 1989, Vol 54, Num 10, pp 898-900, issn 0003-6951Article

Microscopic mechanism of electrical noise in Co/Si thin film structuresCHO, N.-I; NAM, H. G; YU, S. J et al.Japanese journal of applied physics. 1996, Vol 35, Num 6A, pp L695-L698, issn 0021-4922, 2Article

Preparation of copper films by metal organic chemical vapor deposition on various substratesCHO, N.-I; YONGTAE SUL.Materials science & engineering. B, Solid-state materials for advanced technology. 2000, Vol 72, Num 2-3, pp 184-188, issn 0921-5107Conference Paper