Sub-ångstrom resolution using aberration corrected electron opticsBATSON, P. E; DELLBY, N; KRIVANEK, O. L et al.Nature (London). 2002, Vol 418, Num 6898, pp 617-620, issn 0028-0836Article

Towards sub-Å electron beamsKRIVANEK, O. L; DELLBY, N; LUPINI, A. R et al.Ultramicroscopy. 1999, Vol 78, Num 1-4, pp 1-11, issn 0304-3991Conference Paper

Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected MicroscopyMULLER, D. A; FITTING KOURKOUTIS, L; MURFITT, M et al.Science (Washington, D.C.). 2008, Vol 319, Num 5866, pp 1073-1076, issn 0036-8075, 4 p.Article

Aberration-corrected scanning transmission electron microscopy: the potential for nano- and interface sciencePENNYCOOK, S. J; LUPINI, A. R; DUSCHER, G et al.Zeitschrift für Metallkunde. 2003, Vol 94, Num 4, pp 350-357, issn 0044-3093, 8 p.Article

Direct sub-angstrom imaging of a crystal latticeNELLIST, P. D; CHISHOLM, M. F; DELLBY, N et al.Science (Washington, D.C.). 2004, Vol 305, Num 5691, issn 0036-8075, p. 1741Article

Towards sub-0.5 Å electron beamsKRIVANEK, O. L; NELLIST, P. D; DELLBY, N et al.Ultramicroscopy. 2003, Vol 96, Num 3-4, pp 229-237, issn 0304-3991, 9 p.Conference Paper