An analytical model of the microstructure in near-bamboo interconnectsDWYER, V. M.Journal of physics. D, Applied physics (Print). 2004, Vol 37, Num 3, pp 422-431, issn 0022-3727, 10 p.Article

Quantitative analysis in low-energy-electron transmission and reflection spectroscopyDWYER, V. M.Physical review. A. 1993, Vol 47, Num 4A, pp 3044-3049, issn 1050-2947, BArticle

Reconstruction of the depth profile from angle-resolved AES/XPS : Quantive surface analysisDWYER, V. M.Surface and interface analysis. 1993, Vol 20, Num 8, pp 687-695, issn 0142-2421Conference Paper

An analysis of the weakest-link model for early electromigration failureDWYER, V. M.Journal of physics. D, Applied physics (Print). 2004, Vol 37, Num 14, pp 2035-2046, issn 0022-3727, 12 p.Article

Incorporation of elastic scattering into composition-depth profile reconstruction from angle-resolved Auger/XPS dataDWYER, V. M.Surface and interface analysis. 1994, Vol 21, Num 9, pp 637-642, issn 0142-2421Article

A confirmation of the double-exponential approximation of the depth distribution function for AES/XPS using reciprocal two-stream methodsDWYER, V. M.Surface science. 1993, Vol 291, Num 1-2, pp 261-270, issn 0039-6028Article

Angular distribution of electrons elastically backscattered from surfacesDWYER, V. M.Surface and interface analysis. 1993, Vol 20, Num 6, pp 513-518, issn 0142-2421Article

Exact analytical solutions and close approximations to the depth distribution function in AES and XPSDWYER, V. M; RICHARDS, J. M.Surface and interface analysis. 1993, Vol 20, Num 4, pp 271-275, issn 0142-2421Article

Latent damage and parametric drift in electrostatically damaged MOS transistorsTUNNICLIFFE, M. J; DWYER, V. M; CAMPBELL, D. S et al.Journal of electrostatics. 1993, Vol 31, Num 2-3, pp 91-110, issn 0304-3886Conference Paper

Empirical tight binding cluster method for semiseconductor surface structuresCARTER, J. N; DWYER, V. M; HOLLAND, B. W et al.Surface science. 1987, Vol 188, Num 3, pp L723-L728, issn 0039-6028Article

Bidirectional electromigration failureLIM, M. K; CHOULIARAS, V. A; GAN, C. L et al.Microelectronics and reliability. 2013, Vol 53, Num 9-11, pp 1261-1265, issn 0026-2714, 5 p.Conference Paper

Diffusivity variation in Electromigration failureDWYER, V. M.Microelectronics and reliability. 2012, Vol 52, Num 9-10, pp 1960-1965, issn 0026-2714, 6 p.Conference Paper

Quantifying the benefit of thread and data parallelism for fast motion estimation in MPEG-2CHOULIARAS, V. A; AGHA, S; JACOBS, T. R et al.Electronics Letters. 2006, Vol 42, Num 13, pp 747-748, issn 0013-5194, 2 p.Article

Thermal failure in semiconductor devicesDWYER, V. M; FRANKLIN, A. J; CAMPBELL, D. S et al.Solid-state electronics. 1990, Vol 33, Num 5, pp 553-560, issn 0038-1101, 8 p.Article

A critical examination of a new version of the equation-of-motion methodDWYER, V. M; WEAIRE, D. L.Philosophical magazine. B. Physics of condensed matter. Electronic, optical and magnetic properties. 1986, Vol 53, Num 1, pp L35-L41, issn 0141-8637Article

Nonlinear interference devices for all-optical self-routeingSMITH, P. R; DWYER, V. M.Journal of modern optics (Print). 1991, Vol 38, Num 12, pp 2491-2504, issn 0950-0340Article

Electrostatic discharge thermal failure in semiconductor devicesDWYER, V. M; FRANKLIN, A. J; CAMPBELL, D. S et al.I.E.E.E. transactions on electron devices. 1990, Vol 37, Num 11, pp 2381-2387, issn 0018-9383, 7 p.Article

The depth distribution function in Auger/XPS analysisDWYER, V. M; RICHARDS, J. M.Surface and interface analysis. 1992, Vol 18, Num 7, pp 555-560, issn 0142-2421Article

ESD degradation in GaAs MES structuresFRANKLIN, A. J; DWYER, V. M.Solid-state electronics. 1991, Vol 34, Num 10, pp 1091-1102, issn 0038-1101Article

Background intensity determination in AES/XPSDWYER, V. M; MATTHEW, J. A. D.Surface science. 1988, Vol 193, Num 3, pp 549-568, issn 0039-6028Article

The effects of elastic backscattering on the Auger or X-ray photoelectron spectra of solidsDWYER, V. M; MATTHEW, J. A. D.Surface science. 1984, Vol 143, Num 1, pp 57-83, issn 0039-6028Article

Customization of an embedded RISC CPU with SIMD extensions for video encoding : A case studyCHOULIARAS, V. A; DWYER, V. M; AGHA, S et al.Integration (Amsterdam). 2008, Vol 41, Num 1, pp 135-152, issn 0167-9260, 18 p.Article

Electrical characterisation of ESD degradation in GaAs devicesFRANKLIN, A. J; DWYER, V. M.Journal of electrostatics. 1993, Vol 31, Num 1, pp 35-50, issn 0304-3886Article

Structure of the α phase of Ge(111)√3×√3-PbCARTER, J. N; DWYER, V. M; HOLLAND, B. W et al.Solid state communications. 1988, Vol 67, Num 6, pp 643-645, issn 0038-1098Article

Towards microbiological quality assurance in radiation sterilization processing: a limiting case modelDOOLAN, P. T; DWYER, J; DWYER, V. M et al.Journal of applied bacteriology. 1985, Vol 58, Num 3, pp 303-306, issn 0021-8847Article