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ON THE USE OF AN ELECTRON SPECTROMETER AS DETECTOR FOR SOFT X-RAY SPECTRAEBEL MF.1975; X-RAY SPECTROM.; G.B.; DA. 1975; VOL. 4; NO 1; PP. 43-46; BIBL. 6 REF.Article

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ZUR PROBENAUFLADUNG IN ROENTGENPHOTOELEKTRONENSPEKTROMETER. = SUR LA CHARGE DES ECHANTILLONS DANS LES SPECTROMETRES DE PHOTOELECTRONS PAR RAYONS XEBEL MF.1975; ACTA PHYS. AUSTR.; AUTR.; DA. 1975; VOL. 41; NO 2; PP. 125-132; ABS. ANGL.; BIBL. 3 REF.Article

SPECTROSCOPIE PAR PHOTOELECTRONSEBEL MF.1974; BANYASZ. KOHASZ. LAPOK, KOHASZ.; MAGYAR.; DA. 1974; VOL. 107; NO 4; PP. 166-169; ABS. RUSSE ALLEM. ANGL.; BIBL. 3 REF.Article

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ABSOLUTBESTIMMUNG DER AUSTRITTSARBEIT VON PALLADIUM MIT EINEM ROENTGENPHOTOELEKTRONENSPEKTROMETER = DETERMINATION ABSOLUE DU TRAVAIL DE SORTIE DU PALLADIUM AVEC UN SPECTROMETRE DE PHOTOELECTRONS EMIS PAR RAYONS XSCHULTES KAG; EBEL MF.1976; J. ELECTRON. SPECTROSC. RELAT. PHENOMENA; NETHERL.; DA. 1976; VOL. 8; NO 6; PP. 449-458; ABS. ANGL.; BIBL. 4 REF.Article

QUANTITATIVE ROENTGENFLUORESCENZANALYSE AN PROBEN MIT ALLGEMEINER OBERFLAECHE = ANALYSE QUANTITATIVE PAR FLUORESCENCE AUX RX D'ECHANTILLONS DE SURFACE QUELCONQUEEBEL H; EBEL MF.1973; Z. (FRESENIUS') ANAL. CHEM.; DTSCH.; DA. 1973; VOL. 264; NO 5; PP. 361-364; ABS. ANGL.; BIBL. 3 REF.Serial Issue

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QUANTITATIVE ANALYSIS BY X-RAY PHOTOELECTRON SPECTROSCOPY WITHOUT REFERENCE SAMPLESEBEL MF; EBEL H; HIROKAWA K et al.1982; SPECTROCHIM. ACTA, B: AT. SPECTROSC.; ISSN 0584-8547; GBR; DA. 1982; VOL. 37; NO 6; PP. 461-471; BIBL. 33 REF.Article

UN APPAREIL ESCA COMME SPECTROMETRE DE RAYONS X MOUS.EBEL MF; GURKER N; HASLAUER N et al.1976; J. ELECTRON. SPECTROSC. RELAT. PHENOMENA; NETHERL.; DA. 1976; VOL. 9; NO 6; PP. 441-447; ABS. ANGL.; BIBL. 5 REF.Article

A MODIFIED BIAS-METHOD FOR THE DETERMINATION OF SPECTROMETER FUNCTIONSEBEL H; ZUBA G; EBEL MF et al.1983; JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA; ISSN 0368-2048; NLD; DA. 1983; VOL. 31; NO 2; PP. 123-130; BIBL. 3 REF.Article

DETERMINATION OF THE THICKNESS OF SIO₂ LAYERS ON SI BY X-RAY SPECTROMETRYEBEL MF; EBEL H; WERNISCH J et al.1980; X-RAY SPECTROM.; GBR; DA. 1980; VOL. 9; NO 2; PP. 66-69; BIBL. 6 REF.Article

ENTMISCHUNGSBEDINGTE LINIENVERBREITERUNG DER ROENTGENINTERFERENZEN BINAERER KUPFER-NICKEL-LEGIERUNGEN = ELARGISSEMENT DES RAIES D'INTERFERENCES DE RX DUE A LA DEMIXTION D'ALLIAGES CU-NI BINAIRESEBEL MF; EBEL H; LIHL F et al.1972; ACTA PHYS. AUSTR.; AUTR.; DA. 1972; VOL. 36; NO 4; PP. 289-306; BIBL. 28 REF.Serial Issue

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THE SURFACE MORPHOLOGY OF ION-SELECTIVE MEMBRANE ELECTRODES. III: STUDIES ON THE LEAD ION-SELECTIVE MEMBRANEPUNGOR E; TOTH K; NAGY G et al.1983; ANALYTICA CHIMICA ACTA; ISSN 0003-2670; NLD; DA. 1983; VOL. 147; PP. 23-32; BIBL. 20 REF.Article

THE SURFACE MORPHOLOGY OF ION-SELECTIVE MEMBRANE ELECTRODES. II: STUDIES ON THE COPPER(II)-SELECTIVE ELECTRODEPUNGOR E; TOTH K; PAPAY MK et al.1979; ANAL. CHIM. ACTA; NLD; DA. 1979; VOL. 109; NO 2; PP. 279-290; BIBL. 14 REF.Article