The relation between the spherical and chromatic aberration coefficients in object and image planesEL GOMATI, M. M.Optik (Stuttgart). 1985, Vol 72, Num 1, pp 41-42, issn 0030-4026Article

Contrast reversal in SAM mapping due to changes in the substrate atomic number = Inversion de contraste dans la cartographie SAM due aux changements dans le nombre atomique du substratumEL GOMATI, M. M; WALKER, C. G. H.Applied surface science. 1988, Vol 35, Num 2, pp 177-185, issn 0169-4332Article

Fabrication of micro-field emitters on ceramic substratesCHEN, L; EL-GOMATI, M. M.Microelectronic engineering. 2007, Vol 84, Num 1, pp 95-100, issn 0167-9317, 6 p.Article

Stabilized emission from micro-field emitter for electron microscopyCHEN, L; EL-GOMATI, M. M.Microelectronics and reliability. 2006, Vol 46, Num 7, pp 1209-1213, issn 0026-2714, 5 p.Article

Scanning low energy electron loss microscopy (SLEELM)EL GOMATI, M. M; MATTHEW, J. A. D.Journal of microscopy (Print). 1987, Vol 147, Num 2, pp 137-147, issn 0022-2720Article

Sources of internal scattering of electrons in a cylindrical mirror analysis (CMA)EL GOMATI, M. M; EL BAKUSH, T. A.Surface and interface analysis. 1996, Vol 24, Num 3, pp 152-162, issn 0142-2421Article

Spectrum synthesis based on non-linear additionEL BAKUSH, T. A; EL GOMATI, M. M.Surface and interface analysis. 1996, Vol 24, Num 3, pp 163-172, issn 0142-2421Article

The role of zirconium and sulphur in the adherence of oxides on superalloys = Le rôle du zirconium et du soufre sur l'adhérence des oxydes sur les superalliagesWALKER, C. G. H; EL GOMATI, M. M.Applied surface science. 1988, Vol 35, Num 1, pp 164-172, issn 0169-4332Article

Scanning low energy electron loss microscopy (SLEELM): Au on Si = Microscopie à balayage de perte d'électrons de basse énergie (SLEELM): Au sur SiEL GOMATI, M. M; MATTHEW, J. A. D.Applied surface science. 1988, Vol 32, Num 3, pp 320-331, issn 0169-4332Article

Scanning low energy electron loss microscopy (SLEELM): metals on semiconductors = Microscopie de perte d'électrons de faible énergie à balayage (SLEELM): Métaux sur semiconducteursEL GOMATI, M. M; MATTHEW, J. A. D.Vacuum. 1988, Vol 38, Num 4-5, pp 209-211, issn 0042-207XConference Paper

Quantitative imaging in the scanning Auger microscope = Formation d'images quantitatives dans un microscope Auger à balayagePRUTTON, M; EL GOMATI, M. M; WALKER, C. G et al.Conference series - Institute of physics. 1987, Num 90, pp 1-8, issn 0305-2346Conference Paper

Surface compositions of the two phases of differently prepared Ni-Cr-Al and Ni-Cr-Al-Zr samples = Compositions de surface des deux phases d'échantillons Ni-Cr-Al et Ni-Cr-Al-Zr préparés différemmentEL GOMATI, M. M; PRUTTON, M; ROBERTS, R. H et al.Applications of surface science. 1985, Vol 22-23, pp 184-192, issn 0378-5963, 1-2Article

The relation between Auger signal-to-background ratios and atomic concentrationEL GOMATI, M. M; MATTHEW, J. A. D; PRUTTON, M et al.Applied surface science. 1985, Vol 24, Num 2, pp 147-156, issn 0169-4332Article

Recent developments in the understanding and application of backscattered and secondary electrons in the SEMEL GOMATI, M. M; WALKER, Cgh; MATTHEW, Jad et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7378, issn 0277-786X, isbn 978-0-8194-7654-8 0-8194-7654-4, 1Vol, 73780Z.1-73780Z.8Conference Paper

Field emission studies of tungsten-coated silicon-based field emittersCHEN, L; EL-GOMATI, M. M.Ultramicroscopy. 1999, Vol 79, Num 1-4, pp 135-140, issn 0304-3991Conference Paper

Automatic removal of substrate backscattering effects in Auger imaging and spectroscopyBARKSHIRE, I. R; PRUTTON, M; GREENWOOD, J. C et al.Surface and interface analysis. 1993, Vol 20, Num 12, pp 984-990, issn 0142-2421Article

Edge effects and image contrast in scanning Auger microscopy: a theory/experiment comparisonEL GOMATI, M. M; PRUTTON, M; LAMB, B et al.Surface and interface analysis. 1988, Vol 11, Num 5, pp 251-265, issn 0142-2421Article

On the role of rare earth additives in the oxidation of superalloys = Rôle des additifs de terre rare sur l'oxydation des superalliagesEL GOMATI, M. M; WALKER, C; PEACOCK, D. C et al.Corrosion science. 1985, Vol 25, Num 5, pp 351-359, issn 0010-938XArticle

Quantifying data from Auger spectra and imagesWALKER, C. G. K; PEACOCK, D. C; PRUTTON, M et al.Surface and interface analysis. 1988, Vol 11, Num 5, pp 266-278, issn 0142-2421Article

A SAM study of the surface homogeneity of LaNi₅ and La₇Ni₃ = Une étude SAM de l'homogénéité de surface de LaNi₅ et La₇Ni₃EL GOMATI, M. M; NETZER, F. P; PRUTTON, M et al.Conference series - Institute of physics. 1983, Num 68, pp 131-134, issn 0305-2346Article

Thickness dependence of the characteristic X-ray yield and the Auger backscattering factorEL GOMATI, M. M; ROSS, W. C. C; MATTHEW, J. A. D et al.Surface and interface analysis. 1991, Vol 17, Num 4, pp 183-189, issn 0142-2421, 7 p.Article

Monte Carlo calculations of the depth distribution function in multilayered structuresJACKSON, A. R; EL GOMATI, M. M; MATTHEW, J. A. D et al.Surface and interface analysis. 1997, Vol 25, Num 5, pp 341-351, issn 0142-2421Article

Monte Carlo simulations of nanometric structures analysis of micromachined field emittersASSA'D, A. M. D; EL-GOMATI, M. M; DELL, J et al.Ultramicroscopy. 1999, Vol 79, Num 1-4, pp 141-147, issn 0304-3991Conference Paper

Study of plasma CDV silicon-germanium films using electron beam techniquesWOOD, J; EL-GOMATI, M. M; WATERMAN, S. D et al.Vacuum. 1992, Vol 43, Num 1-2, pp 111-114, issn 0042-207XConference Paper

A miniature, all-electrostatic, field emission electron column for surface analytical microscopyROBERTS, R. H; EL GOMATI, M. M; KUDJOE, J et al.Measurement science & technology (Print). 1997, Vol 8, Num 5, pp 536-545, issn 0957-0233Article