Dislocation core and pipe diffusion in Y₂O₃GABORIAUD, R. J.Journal of physics. D, Applied physics (Print). 2009, Vol 42, Num 13, issn 0022-3727, 135410.1-135410.7Article

Dislocations in olivine single crystals indented between 25 and 1100°C = Dislocation dans des monocristaux d'olivine entre 25 et 1100°CGABORIAUD, R.-J.Bulletin de minéralogie. 1986, Vol 109, Num 3, pp 185-191, issn 0180-9210Article

A chemical thinning technique for transmission electron microscopy cross-sectional samplesGABORIAUD, R. J.Journal of electronic materials. 1983, Vol 12, Num 5, pp 837-844, issn 0361-5235Article

Comportement thermique du couple intermétallique Ni/Ti en couches minces = Thermal behaviour of the Ni/Ti intermetallic couple in thin layersGABORIAUD, R. J.Mémoires et études scientifiques de la revue de métallurgie. 1984, Vol 81, Num 12, pp 657-662, issn 0245-8292Article

Angular distribution of rare gas atoms trapped in thin films deposited by ion beam sputtering of an YBa₂Cu₃O_7-x targetBENAYOUN, S; GABORIAUD, R. J.Thin solid films. 1995, Vol 265, Num 1-2, pp 29-32, issn 0040-6090Article

Interfacial reactions in Y₂O₃ thin films deposited on Si(100)PAUMIER, F; GABORIAUD, R. J.Thin solid films. 2003, Vol 441, Num 1-2, pp 307-310, issn 0040-6090, 4 p.Article

Ion-beam-induced mixing of the bilayered structure amorphous TiNi/NiGABORIAUD, R. J; DELAGE, J; ABEL, F et al.Thin solid films. 1991, Vol 200, Num 2, pp 275-282, issn 0040-6090, 8 p.Article

Etude de dislocations créées à la température ambiante dans l'olivine naturelle = Dislocations formed at room temperature in natural olivineGABORIAUD, R.-J; DENANOT, M.-F.Bulletin de minéralogie. 1984, Vol 107, Num 1, pp 35-39, issn 0180-9210Article

Microhardness of feldspar single crystals (Or₉₈ and An₅₈) as a function of temperature = Microdureté de monocristaux de feldspath (Or₉₈An₅₈) en fonction de la températureHUANG, Z. H; GANDAIS, M; GABORIAUD, R. J et al.Bulletin de minéralogie. 1985, Vol 108, Num 6, pp 835-841, issn 0180-9210Article

Ion-beam-induced atomic mixing of the metallic system Ti/Ni = Mélange atomique induit par faisceau ionique du système métallique Ti/NiGABORIAUD, R. J; DELAGE, J; ABEL, F et al.Journal of the less-common metals. 1988, Vol 145, pp 521-530, issn 0022-5088Conference Paper

Interfacial phases in epitaxial growth of Y₂O₃ on MgO studied via combining electron energy-loss spectroscopy and real-space self-consistent full multiple scattering calculationsPAILLOUX, F; JUBLOT, M; GABORIAUD, R. J et al.Physical review B. Condensed matter and materials physics. 2005, Vol 72, Num 12, pp 125425.1-125425.10, issn 1098-0121Article

Réalisation d'un appareillage à lame vibrante pour l'étude des lignes de flux dans les supraconducteurs à haute température critique = Elaboration of a vibrating reed apparatus for the study of flux lines in high T_C superconductorsWOIRGARD, J; SALMON, E; GABORIAUD, R. J et al.Journal de physique. III (Print). 1994, Vol 4, Num 3, pp 557-566, issn 1155-4320Article

Modification of surface mechanical properties of IBAD-CuNi coatingsVON STEBUT, J; ANOUN, K; RIVIERE, J. P et al.Thin solid films. 1989, Vol 181, Num 1-2, pp 417-422, issn 0040-6090, 6 p.Conference Paper

Crystalline growth rate and microstructure in YBaCuO thin filmsPAILLOUX, F; GABORIAUD, R. J; CHAMPEAUX, C et al.Physica. C. Superconductivity and its applications. 2001, Vol 351, Num 1, pp 9-12Conference Paper

Electron diffraction (LACBED) and HRTEM Moiré fringe pattern study of stress in YBaCuO thin film on MgOPAILLOUX, F; GABORIAUD, R. J.Journal de physique. IV. 2000, Vol 10, Num 6, pp Pr6.131-Pr6.135, issn 1155-4339Conference Paper

Epitaxial stress study by large angle convergent beam electron diffraction and high-resolution transmission electron microscopy Moiré fringe patternPAILLOUX, F; GABORIAUD, R. J; CHAMPEAUX, C et al.Materials science & engineering. A, Structural materials : properties, microstructure and processing. 2000, Vol 288, Num 2, pp 244-247, issn 0921-5093Conference Paper

Analyse de l'état mécanique et microstructural de films minces supraconducteurs YBa₂Cu₃O₇ par diffraction des rayons X = An X-ray diffraction study of microstructural and mechanical state of superconducting YBCO thin filmAUZARY, S; BADAWI, K. F; BIMBAULT, L et al.Journal de physique. III (Print). 1997, Vol 7, Num 1, pp 35-46, issn 1155-4320Article

Pulsed laser deposition of Y₂O₃ thin films on MgOGABORIAUD, R. J; PAILLOUX, F; PERRIERE, J et al.Applied surface science. 2002, Vol 186, Num 1-4, pp 477-482, issn 0169-4332Conference Paper

AFM, SEM, EDX and HRTEM study of the crystalline growth rate anisotropy-induced internal stress and surface roughness of YBaCuO thin filmPAILLOUX, F; GABORIAUD, R. J; CHAMPEAUX, C et al.Materials characterization. 2001, Vol 46, Num 1, pp 55-63, issn 1044-5803Article

Yttrium oxide thin films, Y₂O₃, grown by ion beam sputtering on SiGABORIAUD, R. J; PAILLOUX, F; GUERIN, P et al.Journal of physics. D, Applied physics (Print). 2000, Vol 33, Num 22, pp 2884-2889, issn 0022-3727Article

Angular distribution of ion-beam-sputtered elements from an YBa₂Cu₃O_7-x targetGABORIAUD, R. J; BENAYOUN, S; PERRIERE, J et al.Applied physics. A, Solids and surfaces. 1994, Vol 58, Num 4, pp 385-388, issn 0721-7250Article

Synthesis, structuring and characterization of rare earth oxide thin films: Modeling of the effects of stress and defects on the phase stabilityGABORIAUD, R. J; PAUMIER, F; LACROIX, B et al.Thin solid films. 2014, Vol 553, pp 43-46, issn 0040-6090, 4 p.Conference Paper

Optical and digital processing of H.R.T.E.M. images of Si thin films deposited by R.T.C.V.DPAILLOUX, F; MATHE, E. L; GAREM, H et al.Thin solid films. 1998, Vol 319, Num 1-2, pp 177-181, issn 0040-6090Conference Paper

Composition of thin films deposited by ion beam sputtering of a compound target : case of Y-Ba-Cu-OBENAYOUN, S; SALMON, E; GABORIAUD, R. J et al.Thin solid films. 1994, Vol 241, Num 1-2, pp 16-20, issn 0040-6090Conference Paper

Yttrium oxide thin films: Influence of the oxygen vacancy network organization on the microstructureJUBLOT, M; PAUMIER, F; PAILLOUX, F et al.Thin solid films. 2007, Vol 515, Num 16, pp 6385-6390, issn 0040-6090, 6 p.Conference Paper