au.\*:("GUJRATHI, S")
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A GAS JET TRANSPORT SYSTEM FOR THE RADIOACTIVE PRODUCTS OF FAST- NEUTRON INDUCED FISSIONDAUTET H; GUJRATHI S; WIESEHAHN WJ et al.1973; NUCL. INSTRUM. METHODS; NETHERL.; DA. 1973; VOL. 107; NO 1; PP. 49-59; BIBL. 18 REF.Serial Issue
Characterization of a-SiC:H films produced in a standard plasma enhanced chemical vapor deposition system for x-ray mask applicationJEAN, A; CHAKER, M; DIAWARA, Y et al.Journal of applied physics. 1992, Vol 72, Num 7, pp 3110-3115, issn 0021-8979Article
Optical properties and chemical reactivity of hydogenated amorphous boron thin filmsGODET, C; SCHMIRGELD, L; ZUPPIROLI, L et al.Journal of materials science. 1991, Vol 26, Num 23, pp 6408-6418, issn 0022-2461Article
XPS and FTIR analysis of nitrogen incorporation in CNx thin filmsTABBAL, M; MEREL, P; MOISA, S et al.Surface & coatings technology. 1998, Vol 98, Num 1-3, pp 1092-1096, issn 0257-8972Conference Paper
Local order and H-bonding in N-rich amorphous silicon nitrideSENEMAUD, C; GHEORGHIU, A; AMOURA, L et al.Journal of non-crystalline solids. 1993, Vol 164-66, pp 1073-1076, issn 0022-3093, 2Conference Paper
Progress in amorphous-silicon photovoltaic-device researchBREBNER, J. L; COCHRANE, R. W; AZELMAD, A et al.Canadian journal of physics (Print). 1985, Vol 63, Num 6, pp 786-797, issn 0008-4204Article
Electrical characterization of amorphous silicon carbide thin films deposited via polymeric source chemical vapor depositionFANAEI, T; CAMIRE, N; AKTIK, C et al.Thin solid films. 2008, Vol 516, Num 12, pp 3755-3760, issn 0040-6090, 6 p.Article
TENOR risk score predicts healthcare in adults with severe or difficult-to-treat asthmaMILLER, M. K; LEE, J. H; BLANC, P. D et al.The European respiratory journal. 2006, Vol 28, Num 6, pp 1145-1155, issn 0903-1936, 11 p.Article
Preparation and characterization of sputtered TiB2 filmsZDANIEWSKI, W. A; WU, J; GUJRATHI, S. C et al.Journal of materials research. 1991, Vol 6, Num 5, pp 1066-1072, issn 0884-2914Article
Microstructure and mechanical properties of Cr-Si-N coatings prepared by pulsed reactive dual magnetron sputteringBENKAHOUL, M; ROBIN, P; GUJRATHI, S. C et al.Surface & coatings technology. 2008, Vol 202, Num 16, pp 3975-3980, issn 0257-8972, 6 p.Article
Structure-property relationships in dual-frequency plasma deposited hard a-C : H filmsRAVEH, A; MARTINU, L; GUJRATHI, S. C et al.Surface & coatings technology. 1992, Vol 53, Num 3, pp 275-282, issn 0257-8972Article
Preliminary impurity analysis of CuInSe2 thin films using the elastic recoil detection methodGUJRATHI, S. C; QIU, C. X; LUNNEY, M. D. N et al.Materials letters (General ed.). 1988, Vol 7, Num 4, pp 131-133, issn 0167-577XArticle
The use of elastic recoil detection for stoichiometry determination of reactively evaporated TiN layersGAGNON, G; CURRIE, J. F; BREBNER, J. L et al.Journal of applied physics. 1993, Vol 74, Num 6, pp 4233-4235, issn 0021-8979Article
Etching of a-C:H films by an atomic oxygen beamBOURDON, E. B. D; RAVEH, A; GUJRATHI, S. C et al.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1993, Vol 11, Num 5, pp 2530-2535, issn 0734-2101Article
Hydrogen profiling by elastic recoil detection in mycrocrystalline germanium thin filmsGODET, C; ROCA I CABARROCAS, P; GUJRATHI, S. C et al.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1992, Vol 10, Num 6, pp 3517-3521, issn 0734-2101Article
Hard carbon films deposited under high ion fluxMARTINU, L; RAVEH, A; DOMINGUE, A et al.Thin solid films. 1992, Vol 208, Num 1, pp 42-47, issn 0040-6090Article
Characterization of titanium nitride thin filmsWU, H. Z; CHOU, T. C; MISHRA, A et al.Thin solid films. 1990, Vol 191, Num 1, pp 55-67, issn 0040-6090Article
Effect of rapid thermal annealing on both the stress and the bonding states of a-SiC:H filmsEL KHAKANI, M. A; CHAKER, M; JEAN, A et al.Journal of applied physics. 1993, Vol 74, Num 4, pp 2834-2840, issn 0021-8979Article
Caractérisation des dispositifs photovoltaïques au a-Si:H = Caracterization of photovoltaic cells made of hydrogenated amorphous siliconDIAWARA, Y; CURRIE, J. F; NAJAFI, S. I et al.Canadian journal of physics (Print). 1991, Vol 69, Num 3-4, pp 530-537, issn 0008-4204, 8 p.Conference Paper
Configurational statistics in a-SixNyHz alloys: a quantitative bonding analysisBUSTARRET, E; BENSOUDA, M; BAHRARD, M. C et al.Physical review. B, Condensed matter. 1988, Vol 38, Num 12, pp 8171-8184, issn 0163-1829, 14 p.Article
Optical and electrical characterization of OMVPE-grown AlGaAsSb epitaxial layers on InP substratesRAO, T. S; SO, M. G; JIANG, W. Y et al.Journal of crystal growth. 2006, Vol 287, Num 2, pp 532-535, issn 0022-0248, 4 p.Conference Paper
Mechanical properties of silicon carbide films for X-ray lithography applicationJEAN, A; EL KHAKANI, M. A; MADOURI, A et al.Canadian journal of physics (Print). 1992, Vol 70, Num 10-11, pp 834-837, issn 0008-4204Conference Paper
