On the Origin of Gate-Induced Floating-Body Effect in PD SOI p-MOSFETsDAI, Chih-Hao; CHANG, Ting-Chang; GUANGRUI XIA et al.IEEE electron device letters. 2011, Vol 32, Num 7, pp 847-849, issn 0741-3106, 3 p.Article

Impact of strain on gate-induced floating body effect for partially depleted silicon-on-insulator p-type metal―oxide―semiconductor-field-effect-transistorsLO, Wen-Hung; CHANG, Ting-Chang; HUANG, Cheng-Tung et al.Thin solid films. 2013, Vol 528, pp 10-18, issn 0040-6090, 9 p.Conference Paper

Enhanced gate-induced floating-body effect in PD SOI MOSFET under external mechanical strainDAI, Chih-Hao; CHANG, Ting-Chang; CHENG TUNG HUANG et al.Surface & coatings technology. 2010, Vol 205, Num 5, pp 1470-1474, issn 0257-8972, 5 p.Conference Paper

On the Origin of Anomalous Off-Current Under Hot Carrier Stress in p-Channel DDDMOS Transistors With STI StructureCHEN, Ching-En; CHANG, Ting-Chang; TAI, Ya-Hsiang et al.IEEE electron device letters. 2014, Vol 35, Num 6, pp 651-653, issn 0741-3106, 3 p.Article

Impact of Mechanical Strain on GIFBE in PD SOI p-MOSFETs as Indicated From NBTI DegradationLO, Wen-Hung; CHANG, Ting-Chang; DAI, Chih-Hao et al.IEEE electron device letters. 2012, Vol 33, Num 3, pp 303-305, issn 0741-3106, 3 p.Article

An investigation of total bacterial communities, culturable antibiotic-resistant bacterial communities and integrons in the river water environments of Taipei cityYANG, Chu-Wen; CHANG, Yi-Tang; CHAO, Wei-Liang et al.Journal of hazardous materials (Print). 2014, Vol 277, pp 159-168, issn 0304-3894, 10 p.Conference Paper

Charge trapping induced frequency-dependence degradation in n-MOSFETs with high-k/metal gate stacksDAI, Chih-Hao; CHANG, Ting-Chang; CHEN, Hua-Mao et al.Thin solid films. 2011, Vol 520, Num 5, pp 1511-1515, issn 0040-6090, 5 p.Conference Paper