High resolution photoemission study of the formation and thermal stability of Mg silicide on siliconCASEY, Patrick; HUGHES, Greg.Thin solid films. 2011, Vol 519, Num 6, pp 1861-1865, issn 0040-6090, 5 p.Article

The effect of a post processing thermal anneal on pre-existing and stress induced electrically active defects in ultra-thin SiON dielectric layersO'CONNOR, Robert; HUGHES, Greg.Microelectronics and reliability. 2011, Vol 51, Num 3, pp 524-528, issn 0026-2714, 5 p.Article

Interfacial analysis of InP surface preparation using atomic hydrogen cleaning and Si interfacial control layers prior to MgO depositionCASEY, Patrick; HUGHES, Greg.Applied surface science. 2010, Vol 256, Num 24, pp 7530-7534, issn 0169-4332, 5 p.Article

Coastal cruise ship waste managementDIXON, Doug; HUGHES, Greg.Marine technology and SNAME news. 2000, Vol 37, Num 4, pp 216-222Conference Paper

Sulphur overlayers on the Au(110) surface : LEED and TPD studyKRASNIKOV, Sergey A; HUGHES, Greg; CAFOLLA, Attilio A et al.Surface science. 2007, Vol 601, Num 16, pp 3506-3511, issn 0039-6028, 6 p.Article

Charge trapping in MOSFETs with HfSiON dielectrics during electrical stressingO'CONNOR, Robert; HUGHES, Greg; DEGRAEVE, Robin et al.Microelectronic engineering. 2005, Vol 77, Num 3-4, pp 302-309, issn 0167-9317, 8 p.Article

Temperature-accelerated breakdown in ultra-thin SiON dielectricsO'CONNOR, Robert; HUGHES, Greg; DEGRAEVE, Robin et al.Semiconductor science and technology. 2004, Vol 19, Num 11, pp 1254-1258, issn 0268-1242, 5 p.Article

Synchrotron radiation photoemission study of the thermal annealing and atomic hydrogen cleaning of native oxide covered InAs(100) surfacesRAJESH KUMAR CHELLAPPAN; ZHESHEN LI; HUGHES, Greg et al.Applied surface science. 2013, Vol 276, pp 609-612, issn 0169-4332, 4 p.Article

High resolution photoemission study of interface formation between MgO and the selenium passivated InAs (100) surfaceRAJESH KUMAR CHELLAPPAN; ZHESHEN LI; HUGHES, Greg et al.Applied surface science. 2013, Vol 285, pp 153-156, issn 0169-4332, 4 p., bArticle

Photoemission studies of the initial interface formation of ultrathin MgO dielectric layers on the Si( 111 ) surfaceBRENNAN, Barry; MCDONNELL, Stephen; HUGHES, Greg et al.Thin solid films. 2010, Vol 518, Num 8, pp 1980-1984, issn 0040-6090, 5 p.Article

High temperature thermal stability investigations of ammonium sulphide passivated InGaAs and interface formation with Al₂O₃ studied by synchrotron radiation based photoemissionCHAUHAN, Lalit; DURGA RAO GAJULA; McNEILL, David et al.Applied surface science. 2014, Vol 317, pp 696-700, issn 0169-4332, 5 p.Article

Estimation of Cost Comparison of Lithography Technologies at the 22 nm Half-pitch NodeWÜEST, Andrea; HAZELTON, Andrew J; HUGHES, Greg et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7271, issn 0277-786X, isbn 978-0-8194-7524-4 0-8194-7524-6, 72710Y.1-72710Y.10, 2Conference Paper

Planning for climate change : Identifying minimum-dispersal corridors for the cape proteaceaeWILLIAMS, Paul; HANNAH, Lee; ANDELMAN, Sandy et al.Conservation biology. 2005, Vol 19, Num 4, pp 1063-1074, issn 0888-8892, 12 p.Article

Structural study of the Cu{1 0 0}-p(2 × 2)-Sb surface alloy using low energy electron diffractionALSHAMAILEH, Ehab; PUSSI, Katariina; MCEVOY, Thomas et al.Surface science. 2004, Vol 566-68, pp 52-57, issn 0039-6028, 6 p., 1Conference Paper

The 2002 to 2010 Mask Survey Trend AnalysisHUGHES, Greg; CHAN, David.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 7985, issn 0277-786X, isbn 978-0-8194-8553-3, 798502.1-798502.12Conference Paper

Mask Industry Assessment: 2010HUGHES, Greg; CHAN, David Y.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7823, issn 0277-786X, isbn 978-0-8194-8337-9, Part I, 782303.1-782303.13 [13 p.], 2Conference Paper

Mask Industry Assessment: 2008HUGHES, Greg; YUN, Henry.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7122, issn 0277-786X, isbn 978-0-8194-7355-4 0-8194-7355-3, 712204.1-712204.12, 2Conference Paper

A changing climate is eroding the geographical range of the Namib Desert tree Aloe through population declines and dispersal lagsFODEN, Wendy; MIDGLEY, Guy F; HUGHES, Greg et al.Diversity and distributions. 2007, Vol 13, Num 5, pp 645-653, issn 1366-9516, 9 p.Article

Low voltage stress-induced leakage current in 1.4-2.1 nm SiON and HfSiON gate dielectric layersO'CONNOR, Robert; MCDONNELL, Stephen; HUGHES, Greg et al.Semiconductor science and technology. 2005, Vol 20, Num 8, pp 668-672, issn 0268-1242, 5 p.Article

In Situ Investigations into the Mechanism of Oxygen Catalysis on Ruthenium/Manganese Surfaces and the Thermodynamic Stability of Ru/Mn-Based Copper Diffusion Barrier LayersCASEY, Patrick; MCCOY, Anthony P; BOGAN, Justin et al.Journal of physical chemistry. C. 2013, Vol 117, Num 31, pp 16136-16143, issn 1932-7447, 8 p.Article

Reliability of thin ZrO₂ gate dielectric layersO'CONNOR, Robert; HUGHES, Greg; KAUERAUF, Thomas et al.Microelectronics and reliability. 2011, Vol 51, Num 6, pp 1118-1122, issn 0026-2714, 5 p.Article

Practical Synthesis of a Potent Bradykinin B₁ Antagonist via Enantioselective Hydrogenation of a Pyridyl N-Acyl EnamideO'SHEA, Paul D; GAUVREAU, Danny; GOSSELIN, Francis et al.Journal of organic chemistry. 2009, Vol 74, Num 12, pp 4547-4553, issn 0022-3263, 7 p.Article

Nucleophilic displacements of non-racemic α-trifluoromethyl benzylic triflatesHUGHES, Greg; O'SHEA, Paul; GOLL, Julie et al.Tetrahedron (Oxford. Print). 2009, Vol 65, Num 16, issn 0040-4020, 3031, 3189-3196 [9 p.]Article

Weibull slope and voltage acceleration of ultra-thin (1.1-1.45 nm EOT) oxynitridesO'CONNOR, Robert; DEGRAEVE, Robin; KACZER, Ben et al.Microelectronic engineering. 2004, Vol 72, Num 1-4, pp 61-65, issn 0167-9317, 5 p.Conference Paper

Binary halftone chromeless PSM technology for λ/4 optical lithographyFUNG CHEN, J; PETERSEN, John S; SOCHA, Robert et al.SPIE proceedings series. 2001, pp 515-533, isbn 0-8194-4032-9, 2VolConference Paper