Three-fold astigmatism on high-resolution transmission electron microscopyKRIVANEK, O. L.Ultramicroscopy. 1994, Vol 55, Num 4, pp 419-433, issn 0304-3991Article

A universal mesh for calculating the properties of highly saturated magnetic electron lenses by the finite element methodPODBRDSKY, J; KRIVANEK, O. L.Optik (Stuttgart). 1988, Vol 79, Num 4, pp 177-182, issn 0030-4026Article

Sub-ångstrom resolution using aberration corrected electron opticsBATSON, P. E; DELLBY, N; KRIVANEK, O. L et al.Nature (London). 2002, Vol 418, Num 6898, pp 617-620, issn 0028-0836Article

EELS in the electron microscopy: a review of present trendsCOLLIEX, C; MANOUBI, T; KRIVANEK, O. L et al.Journal of electron microscopy. 1986, Vol 35, Num 4, pp 307-313, issn 0022-0744Article

Applications of slow-scan CCD cameras in transmission electron microscopyKRIVANEK, O. L; MOONEY, P. E.Ultramicroscopy. 1993, Vol 49, Num 1-4, pp 95-108, issn 0304-3991Article

Elnes of 3d transition-metal oxides. I, Variations across the periodic tableKRIVANEK, O. L; PATERSON, J. H.Ultramicroscopy. 1990, Vol 32, Num 4, pp 313-318, issn 0304-3991, 6 p.Article

Elnes of 3d transition-metal oxides. II, Variations with oxidation state and crystal structurePATERSON, J. H; KRIVANEK, O. L.Ultramicroscopy. 1990, Vol 32, Num 4, pp 319-325, issn 0304-3991, 7 p.Article

Surface imaging an analysis with high spatial resolution. Workshop, Wickenburg Inn, Arizona, USA, 12-15 January 1983KRIVANEK, O. L.Ultramicroscopy. 1983, Vol 11, Num 2-3, pp 87-221, issn 0304-3991Conference Proceedings

The inelastic contribution to high resolution images of defectsKRIVANEK, O. L; AHN, C. C; WOOD, G. J et al.Ultramicroscopy. 1990, Vol 33, Num 3, pp 177-185, issn 0304-3991Article

Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected MicroscopyMULLER, D. A; FITTING KOURKOUTIS, L; MURFITT, M et al.Science (Washington, D.C.). 2008, Vol 319, Num 5866, pp 1073-1076, issn 0036-8075, 4 p.Article

Commercial spectrometer modifications for energy filtering of electron diffraction patterns and imagesHOLMESTAD, R; KRIVANEK, O. L; HØIER, R et al.Ultramicroscopy. 1993, Vol 52, Num 3-4, pp 454-458, issn 0304-3991Conference Paper

An imaging filter for high voltage electron microscopyGUBBENS, A. J; KRAUS, B; KRIVANEK, O. L et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 255-265, issn 0304-3991Conference Paper

Aberration-corrected scanning transmission electron microscopy: the potential for nano- and interface sciencePENNYCOOK, S. J; LUPINI, A. R; DUSCHER, G et al.Zeitschrift für Metallkunde. 2003, Vol 94, Num 4, pp 350-357, issn 0044-3093, 8 p.Article

Conference on atomic-scale structure and properties of interfaces, Wickenburg Inn, AZ, 10-13 January 1984CARPENTER, R. W; GIBSON, J. M; KRIVANEK, O. L et al.Ultramicroscopy. 1984, Vol 14, Num 1-2, pp 1-160, issn 0304-3991Conference Proceedings

An imaging filter for biological applicationsKRIVANEK, O. L; FRIEDMAN, S. L; GUBBENS, A. J et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 267-282, issn 0304-3991Conference Paper

Measurement of TEM primary energy with an electron energy-loss spectrometerMEYER, C. E; BOOTHROYD, C. B; GUBBENS, A. J et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 283-285, issn 0304-3991Conference Paper

Direct sub-angstrom imaging of a crystal latticeNELLIST, P. D; CHISHOLM, M. F; DELLBY, N et al.Science (Washington, D.C.). 2004, Vol 305, Num 5691, issn 0036-8075, p. 1741Article

Towards sub-0.5 Å electron beamsKRIVANEK, O. L; NELLIST, P. D; DELLBY, N et al.Ultramicroscopy. 2003, Vol 96, Num 3-4, pp 229-237, issn 0304-3991, 9 p.Conference Paper

Applications of a post-column imaging filter in biology and materials scienceGUBBENS, A. J; KRIVANEK, O. L.Ultramicroscopy. 1993, Vol 51, Num 1-4, pp 146-159, issn 0304-3991Conference Paper

Structure of the InP/SiO₂ interfaceLILIENTAL, Z; KRIVANEK, O. L; WAGER, J. F et al.Applied physics letters. 1985, Vol 46, Num 9, pp 889-891, issn 0003-6951Article

Surface roughness at the Si(100)-SiO₂ interfaceGOODNICK, S. M; FERRY, D. K; WILMSEN, C. W et al.Physical review. B, Condensed matter. 1985, Vol 32, Num 12, pp 8171-8186, issn 0163-1829Article

Towards sub-Å electron beamsKRIVANEK, O. L; DELLBY, N; LUPINI, A. R et al.Ultramicroscopy. 1999, Vol 78, Num 1-4, pp 1-11, issn 0304-3991Conference Paper

Temperature-dependent transmission extended electron energy-loss fine-structure of aluminumDISKO, M. M; MEITZNER, G; AHN, C. C et al.Journal of applied physics. 1989, Vol 65, Num 8, pp 3295-3297, issn 0021-8979, 3 p.Article