A review of spurious currents in the lattice Boltzmann method for multiphase flowsCONNINGTON, Kevin; LEE, Taehun.Journal of mechanical science and technology. 2012, Vol 26, Num 12, pp 3857-3863, issn 1738-494X, 7 p.Conference Paper

Single bubble rising dynamics for moderate Reynolds number using Lattice Boltzmann MethodAMAYA-BOWER, Luz; LEE, Taehun.Computers & fluids. 2010, Vol 39, Num 7, pp 1191-1207, issn 0045-7930, 17 p.Article

A spectral-element discontinuous Galerkin lattice Boltzmann method for nearly incompressible flowsMISUN MIN; LEE, Taehun.Journal of computational physics (Print). 2011, Vol 230, Num 1, pp 245-259, issn 0021-9991, 15 p.Article

Numerical simulation of single bubble rising in vertical and inclined square channel using lattice Boltzmann methodAMAYA-BOWER, Luz; LEE, Taehun.Chemical engineering science. 2011, Vol 66, Num 5, pp 935-952, issn 0009-2509, 18 p.Article

A stable discretization of the lattice Boltzmann equation for simulation of incompressible two-phase flows at high density ratioLEE, Taehun; LIN, Ching-Long.Journal of computational physics (Print). 2005, Vol 206, Num 1, pp 16-47, issn 0021-9991, 32 p.Article

Testing Measurement Invariance Using MIMIC: Likelihood Ratio Test With a Critical Value AdjustmentEUN SOOK KIM; YOON, Myeongsun; LEE, Taehun et al.Educational and psychological measurement. 2012, Vol 72, Num 3, pp 469-492, issn 0013-1644, 24 p.Article

A lattice Boltzmann algorithm for calculation of the laminar jet diffusion flameLEE, Taehun; LIN, Ching-Long; CHEN, Lea-Der et al.Journal of computational physics (Print). 2006, Vol 215, Num 1, pp 133-152, issn 0021-9991, 20 p.Article

A level set characteristic Galerkin finite element method for free surface flowsLIN, Ching-Long; LEE, Haegyun; LEE, Taehun et al.International journal for numerical methods in fluids. 2005, Vol 49, Num 5, pp 521-547, issn 0271-2091, 27 p.Article

Harmonic generation of an obliquely incident ultrasonic wave in solid-solid contact interfacesNAM, Taehyung; LEE, Taehun; KIM, Chungseok et al.Ultrasonics (Guildford). 2012, Vol 52, Num 6, pp 778-783, issn 0041-624X, 6 p.Article

TEM Observation of Crack-and Pit-Shaped Defects in Electrically Degraded GaN HEMTsCHOWDHURY, Uttiya; JIMENEZ, Jose L; JOH, Jungwoo et al.IEEE electron device letters. 2008, Vol 29, Num 10, pp 1098-1100, issn 0741-3106, 3 p.Article