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USE OF THE CONCEPT OF EQUIVALENT LAYERS IN THE DESIGN OF MULTILAYER DIELECTRIC REFLECTORS WITH MINIMUM ABSORPTIONGIBSON DR; LISSBERGER PH.1980; OPT. ACTA; ISSN 0030-3909; GBR; DA. 1980; VOL. 27; NO 9; PP. 1295-1299; BIBL. 8 REF.Article

DETERMINATION OF THE OPTICAL AND MAGNETO-OPTICAL CONSTANTS OF THIN FILM MANGANESE BISMUTH IN THE VISIBLE SPECTRUM.ATKINSON R; LISSBERGER PH.1974; INTERNATION. J. MAGNET.; G.B.; DA. 1974; VOL. 6; NO 3-4; PP. 227-241; BIBL. 17 REF.Article

A HIGH-PRECISION ADAPTATION OF THE "TURNING-POINT" METHOD OF MONITORING THE OPTICAL THICKNESS OF DIELECTRIC LAYERS USING MICROPROCESSORSGIBSON DR; LISSBERGER PH; SALTER I et al.1982; OPT. ACTA; ISSN 0030-3909; GBR; DA. 1982; VOL. 29; NO 2; PP. 221-234; BIBL. 9 REF.Article

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AUTOMATIC ELLIPSOMETRY WITHOUT A PHASE PLATE.LISSBERGER PH; SALTER IW; FITZPATRICK M et al.1977; J. PHYS. E; G.B.; DA. 1977; VOL. 10; NO 6; PP. 635-641; BIBL. 13 REF.Article