au.\*:("MÄHLMANN, K. H")
Results 1 to 1 of 1
Selection :
Long term reverse annealing in silicon detectorsSCHULZ, T; FEICK, H; FRETWURST, E et al.IEEE transactions on nuclear science. 1994, Vol 41, Num 4, pp 791-795, issn 0018-9499, 1Conference Paper