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Results 1 to 25 of 265

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Structural stability of Sm2Fe17 and its nitrideMING TAN.Materials science & engineering. B, Solid-state materials for advanced technology. 1992, Vol 15, Num 2, pp 105-107, issn 0921-5107Article

Circulation effect: response of precipitation δ18O to the ENSO cycle in monsoon regions of ChinaMING TAN.Climate dynamics. 2014, Vol 42, Num 3-4, pp 1067-1077, issn 0930-7575, 11 p.Article

Angular distributions of atoms sputtered from NiAl{1 10} and Ni{100}MING TAN.Applied surface science. 2007, Vol 253, Num 22, pp 8905-8910, issn 0169-4332, 6 p.Article

Improved estimators for the GMANOVA problem with application to Monte Carlo simulationMING TAN.Journal of multivariate analysis. 1991, Vol 38, Num 2, pp 262-274, issn 0047-259XArticle

Electromigration in ULSI interconnectsCHER MING TAN; ROY, Arijit.Materials science & engineering. R, Reports. 2007, Vol 58, Num 1-2, pp 1-75, issn 0927-796X, 75 p.Article

Deexcitation of sputtered metastable aluminum atomsMING TAN; KING, Bruce V.Surface science. 2006, Vol 600, Num 13, pp 2771-2777, issn 0039-6028, 7 p.Article

Molecular mechanism of tryptophan-dependent transcriptional regulation in Chlamydia trachomatisAKERS, Johnny C; MING TAN.Journal of bacteriology. 2006, Vol 188, Num 12, pp 4236-4243, issn 0021-9193, 8 p.Article

Electromigration reliability of interconnections in RF low noise amplifier circuitFEIFEI HE; CHER MING TAN.Microelectronics and reliability. 2012, Vol 52, Num 2, pp 446-454, issn 0026-2714, 9 p.Article

Effect of IC layout on the reliability of CMOS amplifiersFEIFEI HE; MING TAN, Cher.Microelectronics and reliability. 2012, Vol 52, Num 8, pp 1575-1580, issn 0026-2714, 6 p.Conference Paper

Probing into the asymmetric nature of electromigration performance of submicron interconnect via structureROY, Arijit; CHER MING TAN.Thin solid films. 2007, Vol 515, Num 7-8, pp 3867-3874, issn 0040-6090, 8 p.Article

Thermal stability of nanostructured materials Ti, TixN, Mo and Mo2NYONG ZHU; MING TAN.Materials science & engineering. A, Structural materials : properties, microstructure and processing. 1995, Vol 201, Num 1-2, pp L1-L4, issn 0921-5093Article

Modeling and analysis of gate-all-around silicon nanowire FET : RELIABILITY AND VARIABILITY OF DEVICES FOR CIRCUITS AND SYSTEMSXIANGCHEN CHEN; CHER MING TAN.Microelectronics and reliability. 2014, Vol 54, Num 6-7, pp 1103-1108, issn 0026-2714, 6 p.Article

The early gene product EUO is a transcriptional repressor that selectively regulates promoters of Chlamydia late genesROSARIO, Christopher J; MING TAN.Molecular microbiology (Print). 2012, Vol 84, Num 6, pp 1097-1107, issn 0950-382X, 11 p.Article

Comparison of stress-induced voiding phenomena in copper line-via structures with different dielectric materialsYUEJIN HOU; CHER MING TAN.Semiconductor science and technology. 2009, Vol 24, Num 8, issn 0268-1242, 095014.1-095014.8Article

Exact statistical solutions using the inverse Bayes formulaeTIAN, Guo-Liang; MING TAN.Statistics & probability letters. 2003, Vol 62, Num 3, pp 305-315, issn 0167-7152, 11 p.Article

Failure mechanisms of aluminum bondpad peeling during thermosonic bondingCHER MING TAN; ZHENGHAO GAN.IEEE transactions on device and materials reliability. 2003, Vol 3, Num 2, pp 44-50, issn 1530-4388, 7 p.Article

Single wafer miniature Hall-effect keyboardCHER MING TAN; ZUKOTYNSKI, S.IEEE transactions on industrial electronics (1982). 1989, Vol 36, Num 3, pp 446-450, issn 0278-0046, 5 p.Article

Covalent functionalization of carbon nanotubes and their use in dielectric epoxy composites to improve heat dissipationBAUDOT, Charles; CHER MING TAN.Carbon (New York, NY). 2011, Vol 49, Num 7, pp 2362-2369, issn 0008-6223, 8 p.Article

Circuit level interconnect reliability study using 3D circuit modelFEIFEI HE; CHER MING TAN.Microelectronics and reliability. 2010, Vol 50, Num 3, pp 376-390, issn 0026-2714, 15 p.Article

A bimodal three-parameter lognormal mixture distribution for electromigration failure analysisCHER MING TAN; RAGHAVAN, Nagarajan.Thin solid films. 2008, Vol 516, Num 23, pp 8804-8809, issn 0040-6090, 6 p.Article

Arginine-dependent gene regulation via the ArgR repressor is species specific in ChlamydiaSCHAUMBURG, Chris S; MING TAN.Journal of bacteriology. 2006, Vol 188, Num 3, pp 919-927, issn 0021-9193, 9 p.Article

The P domain of norovirus capsid protein forms a subviral particle that binds to histo-blood group antigen receptorsMING TAN; XI JIANG.Journal of virology. 2005, Vol 79, Num 22, pp 14017-14030, issn 0022-538X, 14 p.Article

Stress response gene regulation in Chlamydia is dependent on HrcA-CIRCE interactionsWILSON, Adam C; MING TAN.Journal of bacteriology. 2004, Vol 186, Num 11, pp 3384-3391, issn 0021-9193, 8 p.Article

Improved point and confidence interval estimators of mean response in simulation when control variates are usedMING TAN; GLESER, L. J.Communications in statistics. Simulation and computation. 1993, Vol 22, Num 4, pp 1211-1220, issn 0361-0918Article

A cost-sensitive machine learning method for the approach and recognize taskMING TAN; SCHLIMMER, J. C.Robotics and autonomous systems. 1991, Vol 8, Num 1-2, pp 31-45, issn 0921-8890Article

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