Noise Variable Settings in Robust Design ExperimentsBINGHAM, Derek; NAIR, Vijayan N.Technometrics. 2012, Vol 54, Num 4, pp 388-397, issn 0040-1706, 10 p.Article

Extreme (X-)testing with binary data and applications to reliability demonstrationMEASE, David; NAIR, Vijayan N.Technometrics. 2006, Vol 48, Num 3, pp 399-410, issn 0040-1706, 12 p.Article

Optimal design of experiments for modeling processes with feedback control variablesNAIR, Vijayan N; XU, Li-An.Journal of statistical planning and inference. 2003, Vol 113, Num 1, pp 269-284, issn 0378-3758, 16 p.Article

Edge detection, spatial smoothing, and image reconstruction with partially observed multivariate dataDASS, Sarat C; NAIR, Vijayan N.Journal of the American Statistical Association. 2003, Vol 97, Num 461, pp 77-89, issn 0162-1459, 13 p.Article

Estimating network loss rates using active tomographyXI, Bowei; MICHAILIDIS, George; NAIR, Vijayan N et al.Journal of the American Statistical Association. 2006, Vol 101, Num 476, pp 1430-1448, issn 0162-1459, 19 p.Article

Graphical estimators from probability plots with right-censored dataSOMBOONSAVATDEE, Anupap; NAIR, Vijayan N; SEN, Ananda et al.Technometrics. 2007, Vol 49, Num 4, pp 420-429, issn 0040-1706, 10 p.Article

Network delay tomography using flexicast experimentsLAWRENCE, Earl; MICHAILIDIS, George; NAIR, Vijayan N et al.Journal of the Royal Statistical Society. Series B, statistical methodology. 2006, Vol 68, pp 785-813, issn 1369-7412, 29 p., 5Article

Bayesian Inference for Multivariate Ordinal Data Using Parameter ExpansionLAWRENCE, Earl; LIU, Chuanhai; BINGHAM, Derek et al.Technometrics. 2008, Vol 50, Num 2, pp 182-191, issn 0040-1706, 10 p.Article

Methodology for feedback variable selection for control of semiconductor manufacturing processes-Part 1: Analytical and simulation resultsPATTERSON, Oliver D; XIAOBIN DONG; KHARGONEKAR, Pramod P et al.IEEE transactions on semiconductor manufacturing. 2003, Vol 16, Num 4, pp 575-587, issn 0894-6507, 13 p.Article

Methodology for feedback variable selection for control of semiconductor manufacturing processes-Part 2: Application to reactive ion etchingPATTERSON, Oliver D; XIAOBIN DONG; KHARGONEKAR, Pramod P et al.IEEE transactions on semiconductor manufacturing. 2003, Vol 16, Num 4, pp 588-597, issn 0894-6507, 10 p.Article

Statistical aspects of the analysis of data networksDENBY, Lorraine; LANDWEHR, James M; MALLOWS, Colin L et al.Technometrics. 2007, Vol 49, Num 3, pp 318-334, issn 0040-1706, 17 p.Article