Pascal and Francis Bibliographic Databases

Help

Search results

Your search

au.\*:("PASSACANTANDO, M")

Document Type [dt]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Publication Year[py]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Discipline (document) [di]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Author Country

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Results 1 to 25 of 139

  • Page / 6
Export

Selection :

  • and

Stability for equilibrium problems: From variational inequalities to dynamical systemsPAPPALARDO, M; PASSACANTANDO, M.Journal of optimization theory and applications. 2002, Vol 113, Num 3, pp 567-582, issn 0022-3239Article

Surface electronic and structural properties of CeO2 nanoparticles: a study by core-level photoemission and peak diffractionPASSACANTANDO, M; SANTUCCI, S.Journal of nanoparticle research. 2013, Vol 15, Num 8, issn 1388-0764, 1785.1-1785.6Article

The comparative effect of two different annealing temperatures and times on the sensitivity and long-term stability of WO3 thin films for detecting NO2CANTALINI, C; LOZZI, Luca; PASSACANTANDO, M et al.IEEE sensors journal. 2003, Vol 3, Num 2, pp 171-179, issn 1530-437X, 9 p.Article

Synthesis and characterisation of cadmium titanium oxide thin films by sol-gel techniquePHANI, A. R; PASSACANTANDO, M; SANTUCCI, S et al.The Journal of physics and chemistry of solids. 2002, Vol 63, Num 3, pp 383-392, issn 0022-3697Article

On the spatially resolved electronic structure of polycrystalline WO3 films investigated with scanning tunneling spectroscopyOTTAVIANO, L; LOZZI, L; PASSACANTANDO, M et al.Surface science. 2001, Vol 475, Num 1-3, pp 73-82, issn 0039-6028Article

Morphological and electronic properties of the thin film phase of pentacene investigated by AFM and STM/STSPARISSE, P; PASSACANTANDO, M; OTTAVIANO, L et al.Applied surface science. 2006, Vol 252, Num 20, pp 7469-7472, issn 0169-4332, 4 p.Article

Structural, compositional, thermal resistant and hydro-oleophobic properties of fluorine based block-co-polymer films on quartz substrates by wet chemical processPHANI, A. R; PASSACANTANDO, M; SANTUCCI, S et al.The Journal of physics and chemistry of solids. 2006, Vol 67, Num 8, pp 1703-1711, issn 0022-3697, 9 p.Article

Synthesis and characterization of cadmium titanium oxide powders by sol-gel techniquePHANI, A. R; PASSACANTANDO, M; SANTUCCI, S et al.Journal of materials science. 2000, Vol 35, Num 21, pp 5295-5299, issn 0022-2461Article

Experiments and theory on pentacene in the thin film phase : structural, electronic, transport properties, and gas response to oxygen, nitrogen, and ambient airPARISSE, P; PICOZZI, S; PASSACANTANDO, M et al.Thin solid films. 2007, Vol 515, Num 23, pp 8316-8321, issn 0040-6090, 6 p.Conference Paper

Synthesis and characterization of zinc aluminum oxide thin films by sol-gel techniquePHANI, A. R; PASSACANTANDO, M; SANTUCCI, S et al.Materials chemistry and physics. 2001, Vol 68, Num 1-3, pp 66-71, issn 0254-0584Article

Synthesis of nanocrystalline ZnTiO3 perovskite thin films by sol-gel process assisted by microwave irradiationPHANI, A. R; PASSACANTANDO, M; SANTUCCI, S et al.The Journal of physics and chemistry of solids. 2007, Vol 68, Num 3, pp 317-323, issn 0022-3697, 7 p.Article

Conductivity of the thin film phase of pentacenePARISSE, P; PASSACANTANDO, M; PICOZZI, S et al.Organic electronics. 2006, Vol 7, Num 5, pp 403-409, issn 1566-1199, 7 p.Article

Nash equilibria, variational inequalities, and dynamical systemsCAVAZZUTI, E; PAPPALARDO, M; PASSACANTANDO, M et al.Journal of optimization theory and applications. 2002, Vol 114, Num 3, pp 491-506, issn 0022-3239Article

3D island growth of 6,13 Pentacenequinone on silicon oxide and goldPARISSE, P; BUSSOLOTTI, F; PASSACANTANDO, M et al.Journal of non-crystalline solids. 2010, Vol 356, Num 37-40, pp 2079-2082, issn 0022-3093, 4 p.Conference Paper

Structural, electrical, electronic and optical properties of melanin filmsABBAS, M; D'AMICO, F; GUNNELLA, R et al.The European physical journal. E, Soft matter (Print). 2009, Vol 28, Num 3, pp 285-291, issn 1292-8941, 7 p.Article

XPS study of the surface chemistry of Ag-covered L-CVD SnO2thin filmsKWOKA, M; OTTAVIANO, L; PASSACANTANDO, M et al.Applied surface science. 2008, Vol 254, Num 24, pp 8089-8092, issn 0169-4332, 4 p.Conference Paper

XPS study of the surface chemistry of L-CVD SnO2 thin films after oxidationKWOKA, M; OTTAVIANO, L; PASSACANTANDO, M et al.Thin solid films. 2005, Vol 490, Num 1, pp 36-42, issn 0040-6090, 7 p.Conference Paper

Growth and magnetic properties of MnGe films for spintronic applicationPINTO, N; MORRESI, L; GUNNELLA, R et al.Journal of materials science. Materials in electronics. 2003, Vol 14, Num 5-7, pp 337-340, issn 0957-4522, 4 p.Conference Paper

De-alloying behaviour of metal nanoclusters in SiO2 upon irradiation and thermal treatmentsMATTEI, G; BATTAGLIN, G; BELLO, V et al.Journal of non-crystalline solids. 2003, Vol 322, Num 1-3, pp 17-21, issn 0022-3093, 5 p.Conference Paper

Luminescence and absorption in type III silica implanted with multi-energy Si, O and Ar ionsMAGRUDER, R. H; WEEKS, R. A; WELLER, R. A et al.Journal of non-crystalline solids. 2003, Vol 322, Num 1-3, pp 58-67, issn 0022-3093, 10 p.Conference Paper

Model for negative bias temperature instability in p-MOSFETs with ultrathin oxynitride layersHOUSSA, M; PARTHASARATHY, C; ESPREUX, N et al.Journal of non-crystalline solids. 2003, Vol 322, Num 1-3, pp 100-104, issn 0022-3093, 5 p.Conference Paper

Defect generation in low-energy ion-assisted thermal deposited lithium fluoride filmsCRICENTI, A; MONTEREALI, R. M; MUSSI, V et al.Journal of non-crystalline solids. 2003, Vol 322, Num 1-3, pp 111-116, issn 0022-3093, 6 p.Conference Paper

Infrared-to-visible CW frequency upconversion in erbium activated silica-hafnia waveguides prepared by sol-gel routeGONCALVES, Rogéria R; CARTURAN, Giovanni; ZAMPEDRI, Luca et al.Journal of non-crystalline solids. 2003, Vol 322, Num 1-3, pp 306-310, issn 0022-3093, 5 p.Conference Paper

Structure evolution of atomic layer deposition grown ZrO2films by deep-ultra-violet Raman and far-infrared spectroscopiesBONERA, E; SCAREL, G; FANCIULLI, M et al.Journal of non-crystalline solids. 2003, Vol 322, Num 1-3, pp 105-110, issn 0022-3093, 6 p.Conference Paper

The effects of silicon nitride and silicon oxynitride intermediate layers on the properties of tantalum pentoxide films on silicon: X-ray photoelectron spectroscopy, X-ray reflectivity and capacitance-voltage studiesPASSACANTANDO, M; JOLLY, F; LOZZI, L et al.Journal of non-crystalline solids. 2003, Vol 322, Num 1-3, pp 225-232, issn 0022-3093, 8 p.Conference Paper

  • Page / 6