Proceedings of symposium I on thin films for large area electronics: EMRS 2007[2006] conference, Nice, FranceROCA I CABAROCCAS, Pere.Thin solid films. 2007, Vol 515, Num 19, issn 0040-6090, 326 p.Conference Proceedings

The role of structural defects and texture variability in the performance of poly-Si thin film transistorsVOUTSAS, A. T.Thin solid films. 2007, Vol 515, Num 19, pp 7406-7412, issn 0040-6090, 7 p.Conference Paper

Electronic and atomic structure of Ge₂Sb₂Te₅ phase change memory materialROBERTSON, J; XIONG, K; PEACOCK, P. W et al.Thin solid films. 2007, Vol 515, Num 19, pp 7538-7541, issn 0040-6090, 4 p.Conference Paper

Large area deposition of Al₂O₃ thin films with molecular beams in high vacuumMULTONE, X; BORCA, C. N; HOFFMANN, P et al.Thin solid films. 2007, Vol 515, Num 19, pp 7542-7545, issn 0040-6090, 4 p.Conference Paper

Carrier mobilities in microcrystalline silicon filmsBRONGER, T; CARIUS, R.Thin solid films. 2007, Vol 515, Num 19, pp 7486-7489, issn 0040-6090, 4 p.Conference Paper

Fourier transform photocurrent spectroscopy applied to a broad variety of electronically active thin films (silicon, carbon, organics)VANECEK, Milan; PORUBA, Ales.Thin solid films. 2007, Vol 515, Num 19, pp 7499-7503, issn 0040-6090, 5 p.Conference Paper

Chromium silicide film on ceramic substrate for pressure measurementCAPUTO, D; DE CESARE, G; NASCETTI, A et al.Thin solid films. 2007, Vol 515, Num 19, pp 7647-7649, issn 0040-6090, 3 p.Conference Paper

Silicon-carbon-oxynitrides grown by plasma-enhanced chemical vapor deposition techniqueMANDRACCI, Pietro; RICCIARDI, Carlo.Thin solid films. 2007, Vol 515, Num 19, pp 7639-7642, issn 0040-6090, 4 p.Conference Paper

Phase-change optical recording : Past, present, futureKOLOBOV, A. V; FONS, P; TOMINAGA, J et al.Thin solid films. 2007, Vol 515, Num 19, pp 7534-7537, issn 0040-6090, 4 p.Conference Paper

A comparison between bottom contact and top contact all organic field effect transistors assembled by soft lithographyCOSSEDDU, P; BONFIGLIO, A.Thin solid films. 2007, Vol 515, Num 19, pp 7551-7555, issn 0040-6090, 5 p.Conference Paper

An examination of trace surface on diamond-like carbon film after ball-on disk measurementWON SEOK CHOI; PARK, Mungi; HONG, Byungyou et al.Thin solid films. 2007, Vol 515, Num 19, pp 7560-7565, issn 0040-6090, 6 p.Conference Paper

Annealing optimization of silicon nitride film for solar cell applicationYOO, Jinsu; SURESH KUMAR DHUNGEL; JUNSIN YI et al.Thin solid films. 2007, Vol 515, Num 19, pp 7611-7614, issn 0040-6090, 4 p.Conference Paper

Photodetectors based on amorphous and microcrystalline siliconSTIEBIG, H; MOULIN, E; RECH, B et al.Thin solid films. 2007, Vol 515, Num 19, pp 7522-7525, issn 0040-6090, 4 p.Conference Paper

Modelling velocity saturation and kink effects in p-channel polysilicon thin-film transistorsVALLETTA, A; GAUCCI, P; MARIUCCI, L et al.Thin solid films. 2007, Vol 515, Num 19, pp 7417-7421, issn 0040-6090, 5 p.Conference Paper

Non-uniform deposition in the early stage of hot-wire chemical vapor deposition of silicon : The charge effect approachSONG, Jean-Ho; JO, Wook; HWANG, Nong-Moon et al.Thin solid films. 2007, Vol 515, Num 19, pp 7446-7450, issn 0040-6090, 5 p.Conference Paper

Bias sensitive multispectral structures for imaging applicationsVIEIRA, M; FANTONI, A; FEMANDES, M et al.Thin solid films. 2007, Vol 515, Num 19, pp 7566-7570, issn 0040-6090, 5 p.Conference Paper

Deposition of dielectrics using a matrix distributed electron cyclotron resonance plasma enhanced chemical vapor deposition systemBOTHA, R; HAJ IBRAHIM, B; BULKIN, P et al.Thin solid films. 2007, Vol 515, Num 19, pp 7594-7597, issn 0040-6090, 4 p.Conference Paper

Electrical stability in self-aligned p-channel polysilicon thin film transistorsGAUCCI, P; MARIUCCI, L; VALLETTA, A et al.Thin solid films. 2007, Vol 515, Num 19, pp 7571-7575, issn 0040-6090, 5 p.Conference Paper

Characterization of SiN_x/a-Si: H crystalline silicon surface passivation under UV light exposureTUCCI, M; SERENELLI, L; DE IULIIS, S et al.Thin solid films. 2007, Vol 515, Num 19, pp 7625-7628, issn 0040-6090, 4 p.Conference Paper

Organic thin-film transistors using thin ormosil-based hybrid dielectricJEONG, Sunho; KIM, Dongjo; LEE, Sul et al.Thin solid films. 2007, Vol 515, Num 19, pp 7701-7705, issn 0040-6090, 5 p.Conference Paper

Direct writing of copper conductive patterns by ink-jet printingBONG KYUN PARK; KIM, Dongjo; JEONG, Sunho et al.Thin solid films. 2007, Vol 515, Num 19, pp 7706-7711, issn 0040-6090, 6 p.Conference Paper

Role of microstmcture in electronic transport behavior of highly crystallized undoped microcrystalline Si filmsRAM, Sanjay K; KUMAR, Satyendra; ROCA I CABARROCAS, P et al.Thin solid films. 2007, Vol 515, Num 19, pp 7469-7474, issn 0040-6090, 6 p.Conference Paper

Silane versus silicon tetrafluoride in the growth of microcrystalline silicon films by standard radio frequency glow dischargeDJERIDANE, Y; ABRAMOV, A; ROCA I CABARROCAS, P et al.Thin solid films. 2007, Vol 515, Num 19, pp 7451-7454, issn 0040-6090, 4 p.Conference Paper

Low temperature short channel polycrystalline silicon thin film transistors with high reliability for flat panel displayPARK, Joong-Hyun; SONG, In-Hyuk; HAN, Min-Koo et al.Thin solid films. 2007, Vol 515, Num 19, pp 7402-7405, issn 0040-6090, 4 p.Conference Paper

Polysilicon high frequency devices for large area electronics : Characterization, simulation and modelingBOTREL, J. L; SAVRY, O; ROZEAU, O et al.Thin solid films. 2007, Vol 515, Num 19, pp 7422-7427, issn 0040-6090, 6 p.Conference Paper