au.\*:("SCOGGAN G")
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COMPARISON OF INTERFACE-STATE GENERATION BY 25-KEV ELECTRON BEAM IRRADIATION IN P-TYPE AND N-TYPE MOS CAPACITORS.MA TP; SCOGGAN G; LEONE R et al.1975; APPL. PHYS. LETTERS; U.S.A.; DA. 1975; VOL. 27; NO 2; PP. 61-63; BIBL. 11 REF.Article
