QUALITATIVE AND QUANTITATIVE ANALYSIS OF TECHNICAL ALUMINIUM PHOSPHIDEMANTLER M; WERNISCH J.1980; X-RAY SPECTROM.; ISSN 0049-8246; GBR; DA. 1980; VOL. 9; NO 4; PP. 163-169; BIBL. 8 REF.Article

QUANTITATIVE ANALYSIS OF MICROPARTICLES WITH AN ELECTRON MICROPROBEWERNISCH J; KETTNER E.1982; MIKROCHIM. ACTA; AUT; DA. 1982; VOL. PT.; NO 12; PP. 73-83; BIBL. 4 REF.Conference Paper

QUANTITATIVE ANALYSIS OF MICROPARTICLES WITH AN ELECTRON MICROPROBEWERNISCH J; KETTNER E.1981; MIKROCHIM. ACTA; ISSN 0026-3672; USA; DA. 1981; VOL. 1; NO 1-2; PP. 73-83; ABS. GER; BIBL. 4 REF.Article

HOMOGENEOUS PRECIPITATION IN CO₅SM CRYSTALSFIDLER J; KIRCHMAYR H; WERNISCH J et al.1980; J. LESS-COMMON METALS; NLD; DA. 1980; VOL. 71; NO 2; PP. 245-257; BIBL. 32 REF.Article

HOMOGENEOUS PRECIPITATION IN CO₅SM CRYSTALSFIDLER J; KIRCHMAYR H; WERNISCH J et al.1980; J. LESS-COMMON MET.; CHE; DA. 1980-06; VOL. 71; NO 2; PP. 245-257; BIBL. 32 REF.Article

DETERMINATION OF THE THICKNESS OF SIO₂ LAYERS ON SI BY X-RAY SPECTROMETRYEBEL MF; EBEL H; WERNISCH J et al.1980; X-RAY SPECTROM.; GBR; DA. 1980; VOL. 9; NO 2; PP. 66-69; BIBL. 6 REF.Article

Theoretical prediction of the electron backscattering coefficient for multilayer structuresAUGUST, H.-J; WERNISCH, J.Journal of microscopy (Print). 1990, Vol 157, pp 247-254, issn 0022-2720, 2Article

Calculation of the electron backscattering coefficient for thin films using a simple electron scattering modelAUGUST, H.-J; WERNISCH, J.Journal de microscopie et de spectroscopie électroniques. 1989, Vol 14, Num 4, pp 189-201, issn 0395-9279Article

QUALITATIVE ANALYSE DER BINDUNG VON FIBRIN IN ORGANISCHEM GEWEBE. = ANALYSE QUALITATIVE DE LA LIAISON DE LA FIBRINE DANS LES TISSUS ORGANIQUESBRAUN F; WERNISCH J; SPANGLER HP et al.1977; WIEN. KLIN. WSCHR.; OESTERR.; DA. 1977; VOL. 89; NO 14; PP. 489-494; ABS. ANGL.; BIBL. 11 REF.Article

EICHPROBENFREIE BESTIMMUNG DER MASSENBELEGUNG EBENER DUENNER SCHICHTEN MIT EINEM ENERGIEDISPERSIVEN SPEKTROMETER = ANALYSE SANS ETALON, DE COUCHES MINCES, AVEC UTILISATION D'UN SPECTROMETRE A DISPERSION D'ENERGIEEHEL H; FUCHS G; GURKER N et al.1974; X-RAY SPECTROM.; G.B.; DA. 1974; VOL. 3; NO 4; PP. 176-178Article

Calculation of depth distribution functions for characteristic X-radiation using an electron scattering model. II, ResultsAUGUST, H.-J; WERNISCH, J.X-ray spectrometry. 1991, Vol 20, Num 3, pp 141-148, issn 0049-8246, 8 p.Article

SEM-analysis of the electrically active subsurface P-N junctions in MOS configurationKAITNA, R; WERNISCH, J.Solid state technology. 1982, Vol 25, Num 3, pp 98-101, issn 0038-111XArticle

Caluclation of depth distribution functions for characteristic X-radiation using an electron scattering model. I, TheoryAUGUST, H.-J; WERNISCH, J.X-ray spectrometry. 1991, Vol 20, Num 3, pp 131-140, issn 0049-8246, 10 p.Article

Energy distribution of electrons transmitted through thin foilsAUGUST, H.-J; WERNISCH, J.Ultramicroscopy. 1990, Vol 32, Num 2, pp 113-120, issn 0304-3991, 8 p.Article

Methoden zur Optimierung des Nachweises dünner Schichten in der energiedispersiven ElektronenstrahlmikroanalyseAUGUST, H.-J; WERNISCH, J.Zeitschrift für Metallkunde. 1990, Vol 81, Num 12, pp 923-930, issn 0044-3093Article

Influences of the composition of sintered-MgO on it's electrical insulating behaviorWERNISCH, J; TILLER, G.Radex Rundschau. 1984, Vol 2, pp 378-381, issn 0370-3657Article

AN X-RAY SPECTROMETER WITH A POSITION-SENSITIVE WIRE DETECTOR (PSD)EBEL H; MANTLER M; GURKER N et al.1983; X-RAY SPECTROMETRY; ISSN 0049-8246; GBR; DA. 1983; VOL. 12; NO 1; PP. 47-49Article

Diffusionsuntersuchungen an Phasengrenzen von Al₂O₃/TiC = Etudes de diffusion aux interfaces de phases de Al₂O₃/TiC = Diffusion studies at phase boundaries of Al₂O₃/TiCWERNISCH, J; WRUSS, W; NISSEL, C et al.Sprechsaal (1976). 1985, Vol 118, Num 10, pp 921-927, issn 0341-0676Article

Electron transmission coefficient for tilted specimensANDRAE, M; KLEIN, P; RÖHRBACHER, K et al.X-ray spectrometry. 1996, Vol 25, Num 2, pp 78-82, issn 0049-8246Article

Fluorescence yields, ω_k (12≤Z≤42) and ω_Ld3 (38≤Z≤79), from a comparison of literature and experiments (SEM)HANKE, W; WERNISCH, J; PÖHN, C et al.X-ray spectrometry. 1985, Vol 14, Num 1, pp 43-47, issn 0049-8246Article

Surface composition of the ordered Al50-Co50 alloy = Oberflaechenzusammensetzung der geordneten Al-50 At.-% Co-LegierungMROZEK, P; JABLONSKI, A; MENYHARD, M et al.Physica status solidi. A. Applied research. 1984, Vol 84, Num 1, pp 39-48, issn 0031-8965Article

Investigating cyanide electrodes by surface analytical methods with different depths of informationEBEL, M. F; WERNISCH, J; PUNGOR, E et al.Surface and interface analysis. 1984, Vol 6, Num 5, pp 255-256, issn 0142-2421Conference Paper

Least-squares fits of fundamental parameters for quantitative X-ray analysis as a function of Z(11≤Z≤83) and E(1 keV≤E≤50 keV)POEHN, C; WERNISCH, J; HANKE, W et al.X-ray spectrometry. 1985, Vol 14, Num 3, pp 120-124, issn 0049-8246Article

Atomabsorptionsspektrometrie. Eine physikalische Methode zur Unterstützung der Zuordnung keramischer FundeWERNISCH, J; GROGER, W; KIES, A et al.Zeitschrift für Archäologie des Mittelalters Koln. 1980, Vol 8, pp 129-137Article

Effect of mating surface on the high temperature wear of 253 MA alloyROY, M; PAUSCHITZ, A; WERNISCH, J et al.Materials and corrosion (1995). 2004, Vol 55, Num 4, pp 259-273, issn 0947-5117, 15 p.Article