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DENSITY OF STATES IN AMORPHOUS SILICON PRODUCED BY MICROWAVE GLOW DISCHARGEAKTIK M; CURRIE JF; YELON A et al.1982; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1982; VOL. 53; NO 1; PP. 439-441; BIBL. 11 REF.Article

A SIMPLE METHOD FOR BREAKDOWN VOLTAGE. MEASUREMENTS IN THIN FILMSSAPIEHA S; WERTHEIMER MR; YELON A et al.1979; I.E.E.E. TRANS. ELECTR. INSULAT.; USA; DA. 1979; VOL. 14; NO 4; PP. 229-230; BIBL. 7 REF.Article

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TRAPS IN AL₂O₃ DETECTED BY TUNNELING.SKARLATOS Y; BARKER RC; YELON A et al.1976; J. APPL. PHYS.; U.S.A.; DA. 1976; VOL. 47; NO 10; PP. 4593-4597; BIBL. 6 REF.Article

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CHARGE TRAPPING IN PLASMA-POLYMERIZED THIN FILMSKLEMBERG SAPIEHA JE; SAPIEHA S; WERTHEIMER MR et al.1980; APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1980; VOL. 37; NO 1; PP. 104-105; BIBL. 8 REF.Article

DETECTION OF DILUTE ORGANIC ACIDS IN WATER BY INELASTIC TUNNELING SPECTROSCOPYSKARLATOS Y; BARKER RC; HALLER GL et al.1974; SURF. SCI.; NETHERL.; DA. 1974; VOL. 43; NO 2; PP. 353-368; BIBL. 14 REF.Article

Microscopic explanation of the compensation (Meyer-Neldel) ruleYELON, A; MOVAGHAR, B.Physical review letters. 1990, Vol 65, Num 5, pp 618-620, issn 0031-9007, 3 p.Article

Birefringence measurements of thin dielectric films by the prism coupler methodLECLERC, G; YELON, A.Applied optics. 1984, Vol 23, Num 16, pp 2760-2762, issn 0003-6935Article

THERMALLY STIMULATED DISCHARGE OF POLYETHYLENE FOLLOWING AC STRESSINGDORLANNE O; SAPIEHA S; WERTHEIMER MR et al.1982; IEEE TRANS. ELECTR. INSUL.; ISSN 0018-9367; USA; DA. 1982; VOL. 17; NO 3; PP. 199-202; BIBL. 18 REF.Article

FERROMAGNETIC-RESONANCE FIELD AND LINEWIDTH IN AN ANISOTROPIC MAGNETIC METALLIC MEDIUMVITTORIA C; BAILEY GC; BARKER RC et al.1973; PHYS. REV. B; U.S.A.; DA. 1973; VOL. 7; NO 5; PP. 2112-2121; BIBL. 29 REF.Serial Issue

Injection currents in insulators: exact resultsTANNOUS, C; YELON, A.Journal of applied physics. 1988, Vol 63, Num 1, pp 224-225, issn 0021-8979Article

Investigation of intrinsic crystalline Si(111) and amorphous silicon surfaces in air with STMOKONIEWSKI, A. M; YELON, A.Journal of microscopy (Print). 1988, Vol 152, Num 2, pp 481-486, issn 0022-2720Article

SURFACE ANISOTROPY OF NI-CO FROM FERROMAGNETIC RESONANCE.QUACH HT; FRIEDMANN A; WU CY et al.1978; PHYS. REV., B; U.S.A.; DA. 1978; VOL. 17; NO 1; PP. 312-317; BIBL. 13 REF.Article

THE RELATIONSHIP BETWEEN CHEMICAL COMPOSITION AND ELECTRICAL CONDUCTIVITY OF SOME NORTH AMERICAN MICAS.CRINE JP; FRIEDMANN A; WERTHEIMER MR et al.1977; CANAD. J. PHYS.; CANADA; DA. 1977; VOL. 55; NO 3; PP. 270-275; ABS. FR.; BIBL. 17 REF.; 7 ILL.Article

OZONATION OF PHENOL IN WATER STUDIED BY ELECTRON TUNNELINGSKARLATOS Y; BARKER RC; HALLER GL et al.1975; J. PHYS. CHEM.; U.S.A.; DA. 1975; VOL. 79; NO 24; PP. 2587-2592; BIBL. 19 REF.Article

Pulp and paper research and education at Polytechnique : a growing partnership. The university has solidified the program since its formation 15 years agoPARIS, J; YELON, A.Pulp & paper Canada. 1999, Vol 100, Num 5, pp 35-37, issn 0316-4004Article

Static charge fluctuations in Ga⁺-implanted siliconLU, Z.-H; YELON, A.Physical review. B, Condensed matter. 1990, Vol 41, Num 5, pp 3284-3286, issn 0163-1829Article

Electrochemical effects and charge-transport phenomena in metal₁-polymer-metal₂ systems under vacuum and water-vapor atmosphereLECLERC, G; YELON, A.Journal of applied physics. 1988, Vol 64, Num 7, pp 3713-3717, issn 0021-8979Article

Chemical sensitivity of the thickness-shear-mode quartz-resonator nanobalanceIVANOV, D. V; YELON, A.Journal of the Electrochemical Society. 1996, Vol 143, Num 9, pp 2835-2841, issn 0013-4651Article

Conduction mechanisms in polysiloxane films deposited by microwave glow dischargeOKONIEWSKI, A. M; YELON, A.Journal of applied physics. 1985, Vol 58, Num 1, pp 414-419, issn 0021-8979Article