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Results 1 to 25 of 1444

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Growth, optical and microstructural properties of PbB4O7 plate crystalsZAITSEV, A. I; ALEKSANDROVSKY, A. S; KOZHUKHOV, A. S et al.Optical materials (Amsterdam). 2014, Vol 37, pp 298-301, issn 0925-3467, 4 p.Article

Luminescent guest-host composite films based on an azomethine dye in different matrix polymersMARIN, Luminita; ZABULICA, Andrei; MOLEAVIN, Ioana-Andreea et al.Optical materials (Amsterdam). 2014, Vol 38, pp 290-296, issn 0925-3467, 7 p.Article

Photoconductive NSOM for mapping optoelectronic phases in nanostructuresDAS, Anshuman J; SHIVANNA, Ravichandran; NARAYAN, K. S et al.Nanophotonics. 2014, Vol 3, Num 1-2, pp 19-31, 13 p.Article

Integrating electron and near-field optics: dual vision for the nanoworldHAEGEL, Nancy M.Nanophotonics. 2014, Vol 3, Num 1-2, pp 75-89, 15 p.Article

Optically induced forces in scanning probe microscopyKOHLGRAF-OWENS, Dana C; SUKHOV, Sergey; GREUSARD, Léo et al.Nanophotonics. 2014, Vol 3, Num 1-2, pp 105-116, 12 p.Article

Thickness and structure change of titanium(IV) oxide thin films synthesized by the sol-gel spin coating methodLEWKOWICZ, Aneta; SYNAK, Anna; GROBELNA, Beata et al.Optical materials (Amsterdam). 2014, Vol 36, Num 10, pp 1739-1744, issn 0925-3467, 6 p.Conference Paper

Haptics and graphic analogies for the understanding of atomic force microscopyMILLET, Guillaume; LECUYER, Anatole; BURKHARDT, Jean-Marie et al.International journal of human-computer studies. 2013, Vol 71, Num 5, pp 608-626, issn 1071-5819, 19 p.Article

Bifurcation and chaos analysis of atomic force microscope systemWANG, Cheng-Chi; HUANG, Chung-Neng; YAU, Her-Terng et al.Microsystem technologies. 2013, Vol 19, Num 11, pp 1795-1805, issn 0946-7076, 11 p.Article

Fabrication of PZT nano dot array and their ferroelectric propertiesGAOYANG ZHAO; ZHEZHE WANG; GUOMIN XU et al.Microsystem technologies. 2012, Vol 18, Num 5, pp 531-535, issn 0946-7076, 5 p.Article

Fine-resolution patterning of copper nanoparticles through electrohydrodynamic jet printingRAHMAN, Khalid; KHAN, Arshad; NAUMAN MALIK MUHAMMAD et al.Journal of micromechanics and microengineering (Print). 2012, Vol 22, Num 6, issn 0960-1317, 065012.1-065012.8Article

Mechanical Writing of Ferroelectric PolarizationLU, H; BARK, C.-W; ESQUE DE LOS OJOS, D et al.Science (Washington, D.C.). 2012, Vol 336, Num 6077, pp 59-61, issn 0036-8075, 3 p.Article

Dual-Stage Vertical Feedback for High-Speed Scanning Probe MicroscopyFLEMING, Andrew J.IEEE transactions on control systems technology. 2011, Vol 19, Num 1, pp 156-165, issn 1063-6536, 10 p.Article

In situ Study of Cracking and Buckling of Chromium Films on PET SubstratesJIN, H; LU, W.-Y; CORDILL, M. J et al.Experimental mechanics. 2011, Vol 51, Num 2, pp 219-227, issn 0014-4851, 9 p.Article

Influence of Local Material Properties on the Nonlinear Dynamic Behavior of an Atomic Force Microscope ProbeWEI HUANG; DICK, Andrew J.Journal of computational and nonlinear dynamics. 2011, Vol 6, Num 4, issn 1555-1415, 041009.1-041009.9Article

In-situ AFM Experiments with Discontinuous DIC Applied to Damage Identification in BiomaterialsGREGOIRE, D; LOH, O; JUSTER, A et al.Experimental mechanics. 2011, Vol 51, Num 4, pp 591-607, issn 0014-4851, 17 p.Article

A comb-drive scanning-head array for fast Scanning-Probe Microscope measurementsGAO, S; WOLFF, H; HERRMANN, K et al.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8066, issn 0277-786X, isbn 978-0-8194-8655-4, 806626.1-806626.8Conference Paper

Development and Calibration of a Compact Self-sensing Atomic Force Microscope Head for Micro-Nano CharacterizationTONG GUO; SIMING WANG; JIAN ZHAO et al.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8321, issn 0277-786X, isbn 978-0-8194-7940-2, 83213G.1-83213G.9, 2Conference Paper

Evaluation of thermal expansion coefficient of Fabry-Perot cavity using an optical frequency combOULEHLA, Jindřich; SMID, Radek; BUCHTA, Zdenek et al.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8082, issn 0277-786X, isbn 978-0-8194-8678-3, 80823Q.1-80823Q.9, 2Conference Paper

Exciton-polariton coupling and enhanced emission in SiC nanocrystalsPOLUPAN, Georgiy; MORALES-RODRIGUEZ, Miguel.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8102, issn 0277-786X, isbn 978-0-8194-8712-4, 81020T.1-81020T.6Conference Paper

Laser-assisted nanoprocessing and growth of semiconductor nanostructuresHWANG, David J; RYU, Sang-Gil; KIM, Eunpa et al.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8031, issn 0277-786X, isbn 978-0-8194-8605-9, 803106.1-803106.9, 2Conference Paper

Low loss dual-wave laser optics coatings at 1060nm and 530nmJUE WANG; SCHREIBER, Horst.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8016, issn 0277-786X, isbn 978-0-8194-8590-8, 80160Y.1-80160Y.9Conference Paper

MBE growth and electrical properties of InSb film on GaAs substrateZHANG, Y. H; CHEN, P. P; Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 7995, issn 0277-786X, isbn 978-0-8194-8568-7, 79952G.1-79952G.4Conference Paper

Measurement strategies and uncertainty estimations for pitch and step height calibrations by metrological AFMKORPELAINEN, V; SEPPA, J; LASSILA, A et al.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8036, issn 0277-786X, isbn 978-0-8194-8610-3, 80360Q.1-80360Q.9Conference Paper

Metrology of micro-step height structures using 3D scatterometry in 4xnm advanced DRAMDUAN, Mason; CHEN, Clark; HSU, Calvin et al.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 7971, issn 0277-786X, isbn 978-0-8194-8530-4, 79712J.1-79712J.7, 2Conference Paper

Preparation and characterization of tungsten oxide thin films with high electrochromic performanceGANG LV; YONGGANG WU; HEYUN WU et al.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 7995, issn 0277-786X, isbn 978-0-8194-8568-7, 79951C.1-79951C.4Conference Paper

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