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Results 1 to 25 of 1966

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An analytical model for the mechanical deformation of locally graphitized diamondPICCARDO, M; BOSIA, F; OLIVERO, P et al.Diamond and related materials. 2014, Vol 48, pp 73-81, issn 0925-9635, 9 p.Article

Diamond wear properties in cold plasma jetWENJI XU; SHUAI HUANG; FAZE CHEN et al.Diamond and related materials. 2014, Vol 48, pp 96-103, issn 0925-9635, 8 p.Article

Hyperthermal atomic oxygen beam irradiation effect on the Ti-containing DLC filmKANDA, Kazuhiro; FUKUDA, Kazuhiro; KIDENA, Kengo et al.Diamond and related materials. 2014, Vol 41, pp 49-52, issn 0925-9635, 4 p.Article

Numerical simulation on the temperature field induced by a nanosecond pulsed excimer laser in the phase-change filmLIU, F. R; HAN, X. X; BAI, N et al.Thin solid films. 2014, Vol 551, pp 102-109, issn 0040-6090, 8 p.Article

Polymorphous transformation in the crystal structure of [Mg(H2O)6Br2][(C7H14N4)2] • 4 (H2O) studied by powder and single crystal X-ray diffractionRIVERA, Augusto; ROHLICEK, Jan; SADAT-BERNAL, John et al.Zeitschrift für Kristallographie. Crystalline materials. 2014, Vol 229, Num 4, pp 319-327, issn 2194-4946, 9 p.Article

Structural transformation and functional properties of vanadium oxide films after low-temperature annealingGOLTVYANSKYI, Yu; KHATSEVYCH, I; KUCHUK, A et al.Thin solid films. 2014, Vol 564, pp 179-185, issn 0040-6090, 7 p.Article

Synthesis, structure and optical properties of thin films from GeS2-In2S3 system deposited by thermal co-evaporationTODOROV, R; PETKOV, K; KIND, M et al.Thin solid films. 2014, Vol 558, pp 298-305, issn 0040-6090, 8 p.Article

X-ray photoelectron spectroscopy depth-profiling analysis of surface films formed on Cu―Ni (90/10) alloy in seawater in the absence and presence of 1,2,3-benzotriazoleAPPA RAO, B. V; CHAITANYA KUMAR, K; HEBALKAR, Neha Y et al.Thin solid films. 2014, Vol 556, pp 337-344, issn 0040-6090, 8 p.Article

Distinguishing mechanisms of morphological instabilities in phase change materials during switchingSANTALA, M. K; RAOUX, S; TOPURIA, T et al.Thin solid films. 2014, Vol 571, pp 39-44, issn 0040-6090, 6 p., 1Article

Tin nitride thin films fabricated by reactive radio frequency magnetron sputtering at various nitrogen gas ratiosSUJIN CHOI; JISOO KANG; JUYUN PARK et al.Thin solid films. 2014, Vol 571, pp 84-89, issn 0040-6090, 6 p., 1Article

Probing high-pressure reactions in heterogeneous materials by Raman spectroscopyCEPPATELLI, Matteo; GORELLI, Federico Aiace; HAINES, Julien et al.Zeitschrift für Kristallographie. Crystalline materials. 2014, Vol 229, Num 2, pp 83-91, issn 2194-4946, 9 p.Article

Second harmonic generation measurements at high pressures on powder samplesBAYARJARGAL, Lkhamsuren; WINKLER, Björn.Zeitschrift für Kristallographie. Crystalline materials. 2014, Vol 229, Num 2, pp 92-100, issn 2194-4946, 9 p.Article

The Mott insulators at extreme conditions; structural consequences of pressure-induced electronic transitionsROZENBERG, Gregory Kh; WEIMING XU; PASTERNAK, Moshe P et al.Zeitschrift für Kristallographie. Crystalline materials. 2014, Vol 229, Num 3, pp 210-222, issn 2194-4946, 13 p.Article

Fabrication of β-AgGaO2 thin films by radio frequency magnetron sputteringSUZUKI, Issei; NAGATANI, Hiraku; ARIMA, Yuta et al.Thin solid films. 2014, Vol 559, pp 112-115, issn 0040-6090, 4 p.Conference Paper

The structural transition from epitaxial Fe/Pt multilayers to an ordered FePt film using low energy ion beam sputtering deposition with no buffer layerLEE, Chih-Hao; CHEN, Yu-Sheng; LIU, Li-Jung et al.Thin solid films. 2014, Vol 570, pp 288-292, issn 0040-6090, 5 p., bConference Paper

Characterization of amorphous and nanocomposite Nb―Si―C thin films deposited by DC magnetron sputteringNEDFORS, Nils; TENGSTRAND, Olof; FLINK, Axel et al.Thin solid films. 2013, Vol 545, pp 272-278, issn 0040-6090, 7 p.Article

Comparative studies of laser annealing technique and furnace annealing by X-ray diffraction and Raman analysis of lithium manganese oxide thin films for lithium-ion batteriesPRÖLL, J; WEIDLER, P. G; KOHLER, R et al.Thin solid films. 2013, Vol 531, pp 160-171, issn 0040-6090, 12 p.Article

Controlling the Dehydrogenation Reaction toward Reversibility of the LiBH4―Ca(BH4)2 Eutectic SystemYIGANG YAN; REMHOF, Arndt; MAURON, Philippe et al.Journal of physical chemistry. C. 2013, Vol 117, Num 17, pp 8878-8886, issn 1932-7447, 9 p.Article

Glass transition temperature of Pd―Cu―Ni―P thin film metallic glass―a 2D approachCHAKRABARTI, Haimanti; BASU CHAUDHURI, Chhanda; KANJILAL, Baishali et al.Journal of non-crystalline solids. 2013, Vol 359, pp 51-55, issn 0022-3093, 5 p.Article

Microstructure and thermal stability of corundum-type (Al0.5Cr0.5)2O3 solid solution coatings grown by cathodic arc evaporationEDLMAYR, V; POHLER, M; LETOFSKY-PAPST, I et al.Thin solid films. 2013, Vol 534, pp 373-379, issn 0040-6090, 7 p.Article

Monitoring the Activation of a Flexible Metal―Organic Framework Using Structurally Sensitive Spectroscopy TechniquesYUAN CHEN; JINGMING ZHANG; JING LI et al.Journal of physical chemistry. C. 2013, Vol 117, Num 39, pp 20068-20077, issn 1932-7447, 10 p.Article

Oxidation of nano-multilayered CrN/AlMgSiN thin films between 600 and 900 °C in airDONG BOK LEE; SUN KYU KIM.Thin solid films. 2013, Vol 531, pp 306-311, issn 0040-6090, 6 p.Article

Quantification of InxGa1―xP composition modulation by nanometric scale HAADF simulationsPASTORE, C. E; GUTIERREZ, M; ARAUJO, D et al.Applied surface science. 2013, Vol 269, pp 138-142, issn 0169-4332, 5 p.Article

Relationship between bonding characteristics and etch-durability of amorphous carbon layerKWON, J. H; PARK, S. Y. L; SEO, K. C et al.Thin solid films. 2013, Vol 531, pp 328-331, issn 0040-6090, 4 p.Article

Synthesis and phase evolution in Nb/Si multilayers obtained by sequential laser ablationKASHYAP, S; CHATTOPADHYAY, K.Thin solid films. 2013, Vol 531, pp 312-319, issn 0040-6090, 8 p.Article

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