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Background subtraction III : The application of REELS data to background removal in AES and XPSSEAH, M. P.Surface science. 2001, Vol 471, Num 1-3, pp 185-202, issn 0039-6028Article

X-ray spectral simulation and experimental detection of phosphorus segregation to grain boundaries in the presence of molybdenumPAPWORTH, Adam J; WATANABE, Masashi; WILLIAMS, David B et al.Ultramicroscopy. 2001, Vol 88, Num 4, pp 265-274, issn 0304-3991Article

Use of XPS in the determination of chemical environment and oxidation state of iron and sulfur samples: constitution of a data basis in binding energies for Fe and S reference compounds and applications to the evidence of surface species of an oxidized pyrite in a carbonate mediumDESCOSTES, M; MERCIER, F; THROMAT, N et al.Applied surface science. 2000, Vol 165, Num 4, pp 288-302, issn 0169-4332Article

Optimization of digital filters for the detection of trace elements in EELS. III - Gaussian, homomorphic and adaptive filtersMICHEL, J; BONNET, N.Ultramicroscopy. 2001, Vol 88, Num 4, pp 231-242, issn 0304-3991Article

Fluorescence-based photoelectron features in Auger spectraZALM, P. C; TOUSSAINT, S. L. G; CROMBEEN, J. E et al.Surface and interface analysis. 2000, Vol 29, Num 9, pp 602-607, issn 0142-2421Article

Quantitative AES VII. The ionization cross-section in AESSEAH, M. P; GILMORE, I. S.Surface and interface analysis. 1998, Vol 26, Num 11, pp 815-824, issn 0142-2421Article

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Photoelectron signal simulation from textured samples covered by a thin filmVUTOVA, K; MLADENOV, G; TANAKA, T et al.Vacuum. 2001, Vol 62, Num 2-3, pp 297-302, issn 0042-207XConference Paper

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Quantitative AES. VI. Backscattering and backgrounds : An analysis of elemental systematics and corrections of absolute intensitySEAH, M. P; GILMORE, I. S.Surface and interface analysis. 1998, Vol 26, Num 10, pp 723-735, issn 0142-2421Article

Background subtraction II. General behaviour of REELS and the Tougaard universal cross section in the removal of backgrounds in AES and XPSSEAH, M. P; GILMORE, I. S; SPENCER, S. J et al.Surface science. 2000, Vol 461, Num 1-3, pp 1-15, issn 0039-6028Article

Application of factor analysis in EDXRFMOLT, K; SCHRAMM, R.Fresenius' journal of analytical chemistry. 1997, Vol 359, Num 1, pp 61-66, issn 0937-0633Conference Paper

Cone beam X-ray microtomography for three-dimensional liberation analysis in the 21st centuryLIN, C. L; MILLER, J. D.International journal of mineral processing. 1996, Vol 47, Num 1-2, pp 61-73, issn 0301-7516Article

About the preferential sputtering of chalcogen from transition metal dichalcogenide compounds and the determination of compound stoichiometry from XPS peak positionsBERNEDE, J. C.Applied surface science. 2001, Vol 171, Num 1-2, pp 15-20, issn 0169-4332Article

Contamination and the quantitative exploitation of EELS low-loss experimentsSCHAMM, S; ZANCHI, G.Ultramicroscopy. 2001, Vol 88, Num 3, pp 211-217, issn 0304-3991Article

Parallel electron energy-loss spectroscopy free from gain variationFENG, J. L; HO, R; SHAO, Z et al.Ultramicroscopy. 1999, Vol 76, Num 4, pp 221-231, issn 0304-3991Article

Angle-resolved XPS depth-profiling strategiesCUMPSON, P. J.Applied surface science. 1999, Vol 144-45, pp 16-20, issn 0169-4332Conference Paper

Why changes in bond lengths and cohesion lead to core-level shifts in metals, and consequences for the spatial difference methodMULLER, D. A.Ultramicroscopy. 1999, Vol 78, Num 1-4, pp 163-174, issn 0304-3991Conference Paper

Quantitative AES IX and quantitative XPS II : Auger and x-ray photoelectron intensities and sensitivity factors from spectral digital databases reanalysed using a REELS databaseSEAH, M. P; GILMORE, I. S; SPENCER, S. J et al.Surface and interface analysis. 2001, Vol 31, Num 8, pp 778-795, issn 0142-2421Article

From LEED to MULSAMPRUTTON, Martin.Surface and interface analysis. 2000, Vol 29, Num 9, pp 561-571, issn 0142-2421Article

Surface composition of Co_xNi_1-xO solid solutions by X-ray photoelectron and auger spectroscopiesNYDEGGER, M. W; COUDERC, G; LANGELL, M. A et al.Applied surface science. 1999, Vol 147, Num 1-4, pp 58-66, issn 0169-4332Article

Chemical reactivity of CdCl₂ wet-deposited on CdTe films studied by X-ray photoelectron spectroscopyNILES, D. W; WATERS, D; ROSE, D et al.Applied surface science. 1998, Vol 136, Num 3, pp 221-229, issn 0169-4332Article

Ta/Ni/Ta multilayered ohmic contacts on n-type SiCYANG, H; PENG, T. H; WANG, W. J et al.Applied surface science. 2007, Vol 254, Num 2, pp 527-531, issn 0169-4332, 5 p.Article