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Tip-induced nano-scale manipulation of Si and DLC surfaces : the state of the tipMYHRA, Sverre; WATSON, Gregory S.SPIE proceedings series. 2005, pp 464-473, isbn 0-8194-5610-1, 10 p.Conference Paper

Defining the parameters of a cantilever tip AFM by reference structureBYKOV, V. A; NOVIKOV, Yu. A; RAKOV, A. V et al.Ultramicroscopy. 2003, Vol 96, Num 2, pp 175-180, issn 0304-3991, 6 p.Article

Q-controlled dynamic force spectroscopyHÖLSCHER, Hendrik.Surface science. 2002, Vol 515, Num 2-3, pp 517-522, issn 0039-6028Article

A relocated technique of atomic force microscopy (AFM) samples and its application in molecular biologyAIGUO WU; ZHUANG LI; LIHUA YU et al.Ultramicroscopy. 2002, Vol 92, Num 3-4, pp 201-207, issn 0304-3991, 7 p.Article

Study of tip-sample interaction in scanning force microscopyLUNA, M; COLCHERO, J; GOMEZ-HERRERO, J et al.Applied surface science. 2000, Vol 157, Num 4, pp 285-289, issn 0169-4332Conference Paper

Fabrication of PdIr-coated conductive atomic force microscope tip and its application in nanofabricationHAIFENG CHEN; JIAQING SONG; YINCHUAN WANG et al.Molecular crystals and liquid crystals science and technology. Section A, Molecular crystals and liquid crystals. 1999, Vol 337, pp 309-312, issn 1058-725XConference Paper

Description of the frequency dependence of the amplitude and phase angle of a silicon cantilever tapping on a silicon substrate by the harmonic approximationBAR, G; BRANDSCH, R; WHANGBO, M.-H et al.Surface science. 1998, Vol 411, Num 1-2, pp L802-L809, issn 0039-6028Article

Evaluation of the capacitive force between an atomic force microscopy tip and a metallic surfaceHUDLET, S; SAINT JEAN, M; GUTHMANN, C et al.The European physical journal. B, Condensed matter physics. 1998, Vol 2, Num 1, pp 5-10, issn 1434-6028Article

Dynamic modeling and high precision tracking control of atomic force microscope under high data sampling rateHSU, S.-H; FU, L.-C; LIN, Y.-S et al.IFAC international workshop on motion controlAtelier international IFAC sur motion control. 1998, pp 19-24Conference Paper

Interpretation of atomic force microscope (AFM) signals from surface charge on insulatorsWINTLE, H. J.Measurement science & technology (Print). 1997, Vol 8, Num 5, pp 508-513, issn 0957-0233Article

La microscopie à force atomique et le contrôle des surfaces à l'échelle submicrométrique = Atomic force microscopy for surface analysis at submicronic scaleTROYON, M; LEI, H. N; WANG, Z et al.Matériaux et techniques. 1997, Vol 85, Num 5-6, pp 45-47, issn 0032-6895Article

The simultaneous measurement of elastic, electrostatic and adhesive properties by scanning force microscopy: pulsed-force mode operationROSA-ZEISER, A; WEILANDT, E; HILD, S et al.Measurement science & technology (Print). 1997, Vol 8, Num 11, pp 1333-1338, issn 0957-0233Article

Atomic force microscopy using cantilevers with integrated tips and piezoelectric layers for actuation and detectionINDERMÜHLE, P.-F; SCHÜRMANN, G; RACINE, G.-A et al.Journal of micromechanics and microengineering (Print). 1997, Vol 7, Num 3, pp 218-220, issn 0960-1317Conference Paper

Scanning probe microscopy. Part 3: Studies of polymer surfaces with atomic force microscopyMAGONOV, S. N; HEATON, M. G.American laboratory (Fairfield). 1996, Vol 28, Num 6, pp 59-63, issn 0044-7749Article

Simulations of the effects of tip apex geometries on atomic force microscopy imagesKOMIYAMA, M; TAZAWA, K; TSUJIMICHI, K et al.Japanese journal of applied physics. 1996, Vol 35, Num 7, pp 4101-4104, issn 0021-4922, 1Article

The drag on a microcantilever oscillating near a wallCLARKE, R. J; COX, S. M; WILLIAMS, P. M et al.Journal of Fluid Mechanics. 2005, Vol 545, pp 397-426, issn 0022-1120, 30 p.Article

Nonlinear dynamics of vibrating microcantilevers in tapping-mode atomic force microscopyYAGASAKI, Kazuyuki.Physical review B. Condensed matter and materials physics. 2004, Vol 70, Num 24, pp 245419.1-245419.10, issn 1098-0121Article

Imaging of flexural and torsional resonance modes of atomic force microscopy cantilevers using optical interferometryREINSTAEDTLER, Michael; RABE, Ute; SCHERER, Volker et al.Surface science. 2003, Vol 532-35, pp 1152-1158, issn 0039-6028, 7 p.Conference Paper

Measuring the spring constant of atomic force microscope cantilevers: thermal fluctuations and other methodsLEVY, R; MAALOUM, M.Nanotechnology (Bristol. Print). 2002, Vol 13, Num 1, pp 33-37, issn 0957-4484Article

Bundle structure formation on a polymer film at various temperatures and scanning velocitiesWANG, X. P; LOY, M. M. T; XUDONG XIAO et al.Nanotechnology (Bristol. Print). 2002, Vol 13, Num 4, pp 478-483, issn 0957-4484, 6 p.Article

Noncontact atomic force microscopy in liquid environment with quartz tuning fork and carbon nanotube probeKAGESHIMA, Masami; JENSENIUS, Henriette; DIENWIEBEL, Martin et al.Applied surface science. 2002, Vol 188, Num 3-4, pp 440-444, issn 0169-4332Conference Paper

Patterning DNA on μm scale on micaFUJITA, M; MIZUTANI, W; GAD, M et al.Ultramicroscopy. 2002, Vol 91, Num 1-4, pp 281-285, issn 0304-3991, 5 p.Conference Paper

Friction-induced microstructure growthPAL, S; BANERJEE, S.Journal of physics. D, Applied physics (Print). 2001, Vol 34, Num 3, pp 253-256, issn 0022-3727Article

Thermal enhancement of AFM phase contrast for imaging diblock copolymer thin film morphologyFASOLKA, Michael J; MAYES, Anne M; MAGONOV, Sergei N et al.Ultramicroscopy. 2001, Vol 90, Num 1, pp 21-31, issn 0304-3991Article

Phase change detection of attractive force gradient by using a quartz resonator in noncontact atomic force microscopyNISHI, R; HOUDA, I; ARAMATA, T et al.Applied surface science. 2000, Vol 157, Num 4, pp 332-336, issn 0169-4332Conference Paper

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