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Results 1 to 25 of 5605

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Investigation of isothermal and no-isothermal oxidation of SiC powder using an analytic kinetic modelYONG LI; YUN YANG; LIN, Zhi-Ming et al.Applied surface science. 2010, Vol 257, Num 2, pp 463-467, issn 0169-4332, 5 p.Article

Interfacial properties of thermally oxidized Ta2Si on SiPKREZ-TOMAS, A; JENNINGS, M. R; MAWBY, P. A et al.Surface and interface analysis. 2008, Vol 40, Num 8, pp 1164-1167, issn 0142-2421, 4 p.Article

Nitric acid oxidation on carbon dispersion and suspension stabilityNING ZHANG; WANG, Liu-Yan; HAO LIU et al.Surface and interface analysis. 2008, Vol 40, Num 8, pp 1190-1194, issn 0142-2421, 5 p.Article

On interface properties of ultra-thin and very-thin oxide/a-Si:H structures prepared by oxygen based plasmas and chemical oxidationPINCIK, Emil; KOBAYASHI, Hikaru; RUSNAK, Jaroslav et al.Applied surface science. 2007, Vol 253, Num 16, pp 6697-6715, issn 0169-4332, 19 p.Article

Explosive oxidation of HPHT diamond particlesLEE, Jae-Kap; ANDERSON, Michael W; GRAY, Fraser A et al.Diamond and related materials. 2006, Vol 15, Num 9, pp 1206-1209, issn 0925-9635, 4 p.Article

Oxidation products of the niobium tungsten oxide Nb4W13O47 : A high-resolution scanning transmission electron microscopy studyKRUMEICH, Frank; NESPER, Reinhard.Journal of solid state chemistry (Print). 2006, Vol 179, Num 6, pp 1857-1863, issn 0022-4596, 7 p.Article

Oxynitridation of Si(100) surface with thermally excited N2O gasENTA, Y; SUTO, K; TAKEDA, S et al.Thin solid films. 2006, Vol 500, Num 1-2, pp 129-132, issn 0040-6090, 4 p.Article

Selective oxidation of CO in the presence of H2, H2O and CO2 utilising Au/α-Fe2O3 catalysts for use in fuel cellsLANDON, Philip; FERGUSON, Jonathan; OVERWEG, Arjan et al.Journal of material chemistry. 2006, Vol 16, Num 2, pp 199-208, issn 0959-9428, 10 p.Article

Reaction rates of refractory metal oxidation in cold oxygen plasmaSABURI, T; SUZUKI, T; KIUCHI, K et al.Thin solid films. 2006, Vol 506-07, pp 331-336, issn 0040-6090, 6 p.Conference Paper

Ordering in thermally oxidized siliconMUNKHOLM, A; BRENNAN, I. S.Physical review letters. 2004, Vol 93, Num 3, pp 036106.1-036106.4, issn 0031-9007Article

Reaction of the oxygen molecule at the Si(100)-SiO2 interface during silicon oxidationBONGIORNO, Angelo; PASQUARELLO, Alfredo.Physical review letters. 2004, Vol 93, Num 8, pp 086102.1-086102.4, issn 0031-9007Article

Measurement of the electrical resistance of aluminium samples in sulphuric acid solutions by optical interferometry techniquesHABIB, Khaled.Optik (Stuttgart). 2004, Vol 115, Num 4, pp 145-150, issn 0030-4026, 6 p.Article

Microstructure and oxidation behaviour of silicate coating on Si3N4: comparison with native oxide layersLEE, S.-H; RIXECKER, G; ALDINGER, F et al.British ceramic transactions. 2004, Vol 103, Num 3, pp 110-114, issn 0967-9782, 5 p.Article

Probing the cytotoxicity of semiconductor quantum dotsDERFUS, Austin M; CHAN, Warren C. W; BHATIA, Sangeeta N et al.Nano letters (Print). 2004, Vol 4, Num 1, pp 11-18, issn 1530-6984, 8 p.Article

On the rumpling mechanism in nickel-aluminide coatings. Part II: characterization of surface undulations and bond coat swellingTOLPYGO, V. K; CLARKE, D. R.Acta materialia. 2004, Vol 52, Num 17, pp 5129-5141, issn 1359-6454, 13 p.Article

Oxidation process of MOOxCy to MoO3: kinetics and mechanismALEMAN-VAZQUEZ, L. O; TORRES-GARCIA, E; RODRIGUEZ-GATTORNO, G et al.Journal of solid state chemistry (Print). 2004, Vol 177, Num 10, pp 3281-3289, issn 0022-4596, 9 p.Article

Effects of Si content and free Si on oxidation behavior of Ti-Si-N coating layersJUN BO CHOI; KURN CHO; LEE, Mi-Hye et al.Thin solid films. 2004, Vol 447-48, pp 365-370, issn 0040-6090, 6 p.Conference Paper

In situ ellipsometric and electrochemical monitoring of the oxidation of a Pb-Ca-Sn alloy used in the lead acid batteriesSTEIN, N; BOURGUIGNON, G; RABOIN, L et al.Thin solid films. 2004, Vol 455-56, pp 735-741, issn 0040-6090, 7 p.Conference Paper

Oxidation behaviour of thin silver films deposited on plastic web characterized by spectroscopic ellipsometry (SE)SAHM, H; CHARTON, C; THIELSCH, R et al.Thin solid films. 2004, Vol 455-56, pp 819-823, issn 0040-6090, 5 p.Conference Paper

Oxidation process of Mo2C(0001) studied by photoelectron spectroscopyEDAMOTO, K; SUGIHARAA, M; OZAWA, K et al.Applied surface science. 2004, Vol 237, Num 1-4, pp 498-502, issn 0169-4332, 5 p.Conference Paper

Effect of ZnCl2 vapor on high temperature oxidation of pure chromiumMA, H. T; WANG, L; LI, Y. S et al.Journal of materials science letters. 2003, Vol 22, Num 10, pp 763-765, issn 0261-8028, 3 p.Article

Formation of N2O gas bubbles in anodic films on NbNx alloysHABAZAKI, H; MATSUO, T; KONNO, H et al.Thin solid films. 2003, Vol 429, Num 1-2, pp 159-166, issn 0040-6090, 8 p.Article

Investigation of mechanical properties of anodized aluminum using dilatometric measurementsSOKOL, V; VRUBLEVSKY, I; PARKUN, V et al.Analytical and bioanalytical chemistry. 2003, Vol 375, Num 7, pp 968-973, 6 p.Article

Oxidation behaviour of Fe3Al nanoparticles prepared by hydrogen plasma-metal reactionTONG LIU; HUAIYU SHAO; XINGGUO LI et al.Nanotechnology (Bristol. Print). 2003, Vol 14, Num 5, pp 542-545, issn 0957-4484, 4 p.Article

Phase stability of La1-xCaxCr03-δ in oxidizing atmosphereONUMA, Shigenori; MIYOSHI, Shogo; YASHIRO, Keiji et al.Journal of solid state chemistry (Print). 2003, Vol 170, Num 1, pp 68-74, issn 0022-4596, 7 p.Article

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