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Industrial applications of spectroscopic ellipsometryTOMPKINS, Harland G.Thin solid films. 2004, Vol 455-56, pp 772-778, issn 0040-6090, 7 p.Conference Paper

Spectroscopic ellipsometry on biological materials: investigation of hydration dynamics and structural propertiesSCHULZ, B; CHAN, D; BÄCKSTRÖM, J et al.Thin solid films. 2004, Vol 455-56, pp 731-734, issn 0040-6090, 4 p.Conference Paper

Spectroscopic anisotropy micro-ellipsometry for determination of lateral dimensions of form birefringent structuresBLOE, H; SCHULTZE, J. W; MICHAELIS, A et al.Thin solid films. 2002, Vol 414, Num 2, pp 246-250, issn 0040-6090Article

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Expanding horizons: new developments in ellipsometry and polarimetryASPNES, D. E.Thin solid films. 2004, Vol 455-56, pp 3-13, issn 0040-6090, 11 p.Conference Paper

Accurate calibration and optimized measurement: use of an achromatic compensator in rotating polarizer spectroscopic ellipsometryBROCH, L; EN NACIRI, A; JOHANN, L et al.Thin solid films. 2004, Vol 455-56, pp 61-65, issn 0040-6090, 5 p.Conference Paper

Development and test of a new grating-polarimeter and its application in ellipsometric measurementsMASETTI, E; KRASILNIKOVA, A.Thin solid films. 2004, Vol 455-56, pp 138-142, issn 0040-6090, 5 p.Conference Paper

General virtual interface algorithm for in situ spectroscopic ellipsometric data analysisJOHS, Blaine.Thin solid films. 2004, Vol 455-56, pp 632-638, issn 0040-6090, 7 p.Conference Paper

Realtime layer-by-layer analysis for multilayer fabrication monitoring by an automatic null ellipsometerTSURU, T; TSUTOU, T; YAMAMOTO, M et al.Thin solid films. 2004, Vol 455-56, pp 705-709, issn 0040-6090, 5 p.Conference Paper

Accurate interband-energy measurements from Ellipsometric spectraJIE LIAN; QINGPU WANG; XINGKUI CHENG et al.Optics and laser technology. 2003, Vol 35, Num 1, pp 49-53, issn 0030-3992, 5 p.Article

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Principe et applications de l'ellipsométrie spectroscopique = Principle and applications of spectroscopic ellipsometryCASTELLON, Bernard.Photoniques (Orsay). 2002, Num 7, pp 40-43, issn 1629-4475Article

Sensitivity analysis of ellipsometry applied to uniaxial optical filmsFLUERARU, C; SCHRADER, S; MOTSCHMANN, H et al.Thin solid films. 2000, Vol 379, Num 1-2, pp 15-22, issn 0040-6090Article