kw.\*:("02.70.Dh SQUIDs")
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Rapid flaw depth estimation from SQUID-based eddy current nondestructive evaluationPATTABIRAMAN, M; NAGENDRAN, R; JANAWADKAR, M. P et al.NDT & E international. 2007, Vol 40, Num 4, pp 289-293, issn 0963-8695, 5 p.Article