kw.\*:("Couche mince transparente")
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MEASURING THE REFRACTIVE INDEX AND THICKNESS OF THIN TRANSPARENT FILMS: METHOD.DANEU V; SANCHEZ A.1974; APPL. OPT.; U.S.A.; DA. 1974; VOL. 13; NO 1; PP. 122-128; BIBL. 8 REF.Article
ELLIPSOMETRIC METHOD FOR SEPARATE MEASUREMENTS OF N AND D OF A TRANSPARENT FILM.YAMAGUCHI T; TAKAHASHI H.1975; APPL. OPT.; U.S.A.; DA. 1975; VOL. 14; NO 8; PP. 2010-2015; BIBL. 8 REF.Article
A simple route towards high-concentration surfactant-free graphene dispersionsJIANTONG LI; FEI YE; VAZIRI, Sam et al.Carbon (New York, NY). 2012, Vol 50, Num 8, pp 3113-3116, issn 0008-6223, 4 p.Article
Fabrication of oxide-free graphene suspension and transparent thin films using amide solvent and thermal treatmentOH, Seyoung; HWANKIM, Sung; YONGSEUNGCHI et al.Applied surface science. 2012, Vol 258, Num 22, pp 8837-8844, issn 0169-4332, 8 p.Article
Effect of cross-linkable polymer on the morphology and properties of transparent multi-walled carbon nanotube conductive filmsHUANG, Yuan-Li; TIEN, Hsi-Wen; MA, Chen-Chi M et al.Applied surface science. 2011, Vol 258, Num 1, pp 136-142, issn 0169-4332, 7 p.Article
A new optical method for determining stripe domain widthVERTESY, G.Journal of physics. D, Applied physics (Print). 1984, Vol 17, Num 4, pp L65-L68, issn 0022-3727Article
Transparent conductive thin film of ultra large reduced graphene oxide monolayersNEKAHI, A; MARASHI, P. H; HAGHSHENAS, D et al.Applied surface science. 2014, Vol 295, pp 59-65, issn 0169-4332, 7 p.Article
A fast operating laser device for measuring the thicknesses of transparent solid and liquid filmsFEDORTSOV, A. B; LETENKO, D. G; CHURKIN, Y. V et al.Review of scientific instruments. 1992, Vol 63, Num 7, pp 3579-3582, issn 0034-6748Article
7th International Symposium on Transparent Oxide Thin Films for Electronics and Optics (TOEO-7)HOSONO, Hideo; GINLEY, David; SHIGESATO, Yuzo et al.Thin solid films. 2012, Vol 520, Num 10, issn 0040-6090, 155 p.Conference Proceedings
Ellipsométrie de structures lamellaires in situ (solution du problème inverse)BILENKO, D. I; DVORKIN, B. A; DRUZHININA, T. YU et al.Optika i spektroskopiâ. 1983, Vol 55, Num 5, pp 885-890, issn 0030-4034Article
Optimizing the ellipsometric analysis of a transparent layer on glassTOMPKINS, Harland G; SMITH, Steven; CONVEY, Diana et al.Surface and interface analysis. 2000, Vol 29, Num 12, pp 845-850, issn 0142-2421Article
Characterization of inhomogeneous films by multiple-angle ellipsometryCOLARD, S; MIHAILOVIC, M.Thin solid films. 1998, Vol 336, Num 1-2, pp 362-365, issn 0040-6090Conference Paper
Fabrication of a binary-phase-only filter (BPOF) on transparency filmBRANDSTETTER, R; LEIB, K.Optics and laser technology. 1991, Vol 23, Num 4, pp 247-250, issn 0030-3992Article
International Symposia on Transparent Conductive Materials, October 2012KIRIAKIDIS, George.Thin solid films. 2014, Vol 555, issn 0040-6090, 187 p.Conference Proceedings
Thin-film transparent thermocouplesKREIDER, K. G.Sensors and actuators. A, Physical. 1992, Vol 34, Num 2, pp 95-99, issn 0924-4247Conference Paper
Deposition scheme of transparent and semiconducting polymer films from methane plasma-prepared using ECR apparatusFUJITA, T; INAGAKI, C; UYAMA, H et al.Journal of the Electrochemical Society. 1990, Vol 137, Num 5, pp 1645-1647, issn 0013-4651Article
Ellipsometric data processing: an efficient method and an analysis of the relative errorsCHARLOT, D; MARUANI, A.Applied optics. 1985, Vol 24, Num 20, pp 3368-3373, issn 0003-6935Article
ALTERNATIVE TO ELLIPSOMETRY FOR CHARACTERIZING TRANSPARENT PLANAR THIN FILMSREISINGER AR; MORRIS HB; LAWLEY KL et al.1981; OPT. ENG.; ISSN 0091-3286; USA; DA. 1981; VOL. 20; NO 1; PP. 111-114; BIBL. 7 REF.Article
DEVELOPMENT OF AN AUTOMATIC ELLIPSOMETERBLOEM HH; GOETZ WE; JACKSON RN et al.1980; ELECTRO-OPT. SYST. DESIGN; USA; DA. 1980; VOL. 12; NO 3; PP. 38-45; BIBL. 13 REF.Article
PRINCIPAL ANGLE, PRINCIPLE AZIMUTH, AND PRINCIPAL-ANGLE ELLIPSOMETRY OF FILM-SUBSTRATE SYSTEMS.AZZAM RMA; ZAGHLOUL ARM.1977; J. OPT. SOC. AMER.; U.S.A.; DA. 1977; VOL. 67; NO 8; PP. 1058-1065; BIBL. 21 REF.Article
Determination of optical constants of thin films from transmittance traceBHATTACHARYYA, S. R; GAYEN, R. N; PAUL, R et al.Thin solid films. 2009, Vol 517, Num 18, pp 5530-5536, issn 0040-6090, 7 p.Article
Graphene-Based Liquid Crystal DeviceBLAKE, Peter; BRIMICOMBE, Paul D; GERM, Andre K et al.Nano letters (Print). 2008, Vol 8, Num 6, pp 1704-1708, issn 1530-6984, 5 p.Article
Preparation of transparent and conductive thin films of metallic single-walled carbon nanotubesMAEDA, Yutaka; HASHIMOTO, Masahiro; JING LU et al.Journal of material chemistry. 2008, Vol 18, Num 35, pp 4189-4192, issn 0959-9428, 4 p.Article
Electrodeposited carbon nanotubes as template for the preparation of semi-transparent conductive thin films by in situ polymerization of methyl methacrylateVALENTINI, Luca; BITTOLO BON, Silvia; KENNY, Josè M et al.Carbon (New York, NY). 2007, Vol 45, Num 13, pp 2685-2691, issn 0008-6223, 7 p.Article
Optical band-edge absorption of oxide compound SnO2ROMAN, L. S; VALASKI, R; CANESTRARO, C. D et al.Applied surface science. 2006, Vol 252, Num 15, pp 5361-5364, issn 0169-4332, 4 p.Conference Paper