Discharge Ignition Near a DielectricSOBOTA, Ana; VAN VELDHUIZEN, Eddie M; STOFFELS, Winfred W et al.IEEE transactions on plasma science. 2008, Vol 36, Num 4, pp 912-913, issn 0093-3813, 2 p., 1Article

Mechanismen der Blasenbildung in Anstrichfilmen auf Metall = Cloquage des peintures sur métal = Blistering of coatings on metalLAMPE, K; HANSEN, C. M.Farbe + Lack. 1984, Vol 90, Num 6, pp 464-468, issn 0014-7699Article

The breakdown strength of two-layer dielectricsLEBEDEV, S. M; GEFLE, O. S; POKHOLKOV, Yu. P et al.IEE conference publication. 1999, pp 4.304.P2-4.307.P2, issn 0537-9989, isbn 0-85296-719-5Conference Paper

An analysis of air breakdown in electrostatic recordingKIMURA, M; NAKAJIMA, J; MATSUDA, T et al.IEEE transactions on industry applications. 1984, Vol 20, Num 4, pp 869-872, issn 0093-9994Conference Paper

Points lumineux et disruption dans la structure des transistors à base de GaAsKERNER, B. S; KOZLOV, N. A; NECHAEV, A. M et al.Fizika i tehnika poluprovodnikov. 1983, Vol 17, Num 11, pp 1931-1934, issn 0015-3222Article

DC Electrical Breakdown in a Metal Pin-Water Electrode SystemBRUGGEMAN, Peter; VAN SLYCKEN, Joost; DEGROOTE, Joris et al.IEEE transactions on plasma science. 2008, Vol 36, Num 4, pp 1138-1139, issn 0093-3813, 2 p., 1Article

High-voltage constraints for vacuum packaged microstructuresWILSON, Chester G; GIANCHANDANI, Yogesh B; WENDT, Amy E et al.Journal of microelectromechanical systems. 2003, Vol 12, Num 6, pp 835-839, issn 1057-7157, 5 p.Article

The exact distribution of breakdown time delayNADARAJAH, Saralees; KOTZ, Samuel.IEEE transactions on plasma science. 2007, Vol 35, Num 1, pp 118-120, issn 0093-3813, 3 p.Article

Description of the discharge process in spark plugs and its correlation with the electrode erosion patternsSOLDERA, Flavio A; MÜCKLICH, Frank T; HRASTNIK, Klaus et al.IEEE transactions on vehicular technology. 2004, Vol 53, Num 4, pp 1257-1265, issn 0018-9545, 9 p.Article

Characterisation of discharge events during plasma electrolytic oxidationDUNLEAVY, C. S; GOLOSNOY, I. O; CURRAN, J. A et al.Surface & coatings technology. 2009, Vol 203, Num 22, pp 3410-3419, issn 0257-8972, 10 p.Article

Weibull statistical analysis of area effect on the breakdown strength in polymer filmsUL-HAQ, Saeed; GOVINDA RAJU, G. R.CEIDP : conference on electrical insulation and dielectric phenomena. 2002, pp 518-521, isbn 0-7803-7502-5, 4 p.Conference Paper

Etude de la disruption électrique de l'oxyde de tantale non cristallinLALEHKO, V. A; SHMIDT, T. V.Fizika tverdogo tela. 1989, Vol 31, Num 2, pp 187-192, issn 0367-3294Article

Breakdown of the quantum Hall effect due to electron heatingKOMIYAMA, S; TAKAMASU, T; MIYAMIZU, S et al.Solid state communications. 1985, Vol 54, Num 6, pp 479-484, issn 0038-1098Article

SOURCE SUIVEUSE AVEC PROTECTION DE LA PORTE DU TRANSISTOR A EFFET DE CHAMP VIS-A-VIS DU CLAQUAGEMASHLYKIN AN.1979; PRIB. TEH. EKSP.; ISSN 0032-8162; SUN; DA. 1979; NO 6; PP. 93-94; BIBL. 1 REF.Article

SUR LE CHOIX DE LA TOPOLOGIE D'UN TRANSISTOR STABLE VIS-A-VIS D'UN CLAQUAGE SECONDAIREBAJZDRENKO AA.1978; POLUPROVODN. TEKH. MIKROELEKTRON.; UKR; DA. 1978; NO 28; PP. 95-99; BIBL. 7 REF.Article

On the behaviour of insulations with interfaces in medium voltage cable accessories-model investigationsLAMBRECHT, J; PILLING, J; BARSCH, R et al.IEE conference publication. 1999, pp 4.14.S17-4.17.S17, issn 0537-9989, isbn 0-85296-719-5Conference Paper

Ectons and their role in electrical discharges in vacuum and gasesMESYATS, G. A.Journal de physique. IV. 1997, Vol 7, Num 4, pp C4.93-C4.112, issn 1155-4339Conference Paper

Analysis of the limiter erosion in T-3M tokamakBARATOV, D. G; DEMYANENKO, V. N; ZELENOV, E. V et al.IEEE transactions on plasma science. 1985, Vol 13, Num 5, pp 331-333, issn 0093-3813Article

Dependence of breakdown voltage on the junction curvature in concentration profiled diodesGHATOL, A. A; SUNDARSINGH, V. P.Microelectronics. 1984, Vol 15, Num 6, pp 5-14, issn 0026-2692Article

Micro-décharges thermostimulées dans le polyéthylène après une application d'une tension électrique à basse températureKERIMOV, M. K; SULEJ MANOV, B. A; GEZALOV, KH. B et al.Žurnal tehničeskoj fiziki. 1984, Vol 54, Num 7, pp 1407-1408, issn 0044-4642Article

Memory curves in the rare gasesPEJOVIC, M. M; MIJOVIC, B. J; BOSAN, D. A et al.Journal of physics. D, Applied physics (Print). 1983, Vol 16, Num 8, pp L149-L151, issn 0022-3727Article

PHYSICALS BASIS OF DIELECTRIC BREAKDOWNJONSCHER AK.1980; J. PHYS. D; ISSN 0022-3727; GBR; DA. 1980; VOL. 13; NO 7; PP. L143-L148; BIBL. 2 REF.Article

A study of electrical ageing of cross-linked polyethylene by dielectric spectroscopySCARPA, P. C. N; LEGUENZA, E. L; DAS-GUPTA, D. K et al.International symposium on electrets. 1999, pp 395-398, isbn 0-7803-5025-1Conference Paper

Profile effect on surface flashover in a uniform fieldALLEN, N. L; MIKROPOULOS, P. N.IEE conference publication. 1999, pp 3.216.P3-3.219.P3, issn 0537-9989, isbn 0-85296-719-5Conference Paper

On the failure mechanisms of titanium nitride/titanium silicide barrier contacts under high current stressKUAN-YU FU; PYLE, R. E.I.E.E.E. transactions on electron devices. 1988, Vol 35, Num 12, pp 2151-2159, issn 0018-9383Article