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Design of new in situ spectroscopic phase modulated ellipsometerBENFERHAT, R.Le Vide, les couches minces. 1991, Vol 47, Num 258, pp 264-273, issn 0223-4335Article

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Nonintrusive wafer temperature measurement using in situ ellipsometryKROESEN, G. M. W; OEHRLEIN, G. S; BESTWICK, T. D et al.Journal of applied physics. 1991, Vol 69, Num 5, pp 3390-3392, issn 0021-8979Article

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Spatially resolved birefringence of the retinal nerve fiber layer assessed with a retinal laser ellipsometerDREHER, A. W; REITER, K; WEINREB, R. N et al.Applied optics. 1992, Vol 31, Num 19, pp 3730-3735, issn 0003-6935Article

Analysis and application of single-element rotating-polarizer (SERP) ellipsometer: film-thickness determinationZAGHLOUL, A.-R. M; EL-BAHY, M. M; ABOU-SEADA, M. S et al.Optics communications. 1987, Vol 61, Num 6, pp 363-368, issn 0030-4018Article

First measurement of the magnetic birefringence of helium gasCAMERON, R; CANTATORE, G; RUOSO, G et al.Physics letters. A. 1991, Vol 157, Num 2-3, pp 125-128, issn 0375-9601Article

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Static stokes ellipsometer : general analysis and optimizationBRUDZEWSKI, K.Journal of modern optics (Print). 1991, Vol 38, Num 5, pp 889-896, issn 0950-0340, 8 p.Article

Thin film monitoring with ellipsometry in in-line processing equipmentHAYASHI, Y.Japanese journal of applied physics. 1990, Vol 29, Num 11, pp 2514-2518, issn 0021-4922, 1Article

Numerical inverse method of determining film parameters of uniaxial anistropic film with an ellipsometerZHU, R; LIN, C; WEI, Y et al.Applied optics. 1992, Vol 31, Num 22, pp 4497-4500, issn 0003-6935Article

Identification of contaminant coatings over rough surfaces using polarized infrared scatteringMARK HAUGLAND, S; BAHAR, E; CARRIERI, A. H et al.Applied optics. 1992, Vol 31, Num 19, pp 3847-3852, issn 0003-6935Article

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