Limitations of Current Formulations when Decreasing the Coating Layer Thickness of Papers for Inkjet PrintingLAMMINMÄKI, Taina; KETTLE, John; RAUTKOSKI, Hille et al.Industrial & engineering chemistry research. 2011, Vol 50, Num 12, pp 7251-7263, issn 0888-5885, 13 p.Article

Particle Layer Thickness Effect on Particle Entrainment in a Mechanically Agitated BathTAKAHASHI, Yusuke; IGUCHI, Manabu.ISIJ international. 2008, Vol 48, Num 6, pp 875-877, issn 0915-1559, 3 p.Article

Effects of heater surface precoating and plasma treatment on deposited TiN film thicknessZHONG, Z. W; LYE, T. M.Surface engineering. 2003, Vol 19, Num 4, pp 274-278, issn 0267-0844, 5 p.Article

Linear and nonlinear optical properties of Ge-As-S filmsTOLMACHOV, I. D; STRONSKI, A. V.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7138, pp 71381X.1-71381X.6, issn 0277-786X, isbn 978-0-8194-7379-0 0-8194-7379-0, 1VolConference Paper

Determination of the critical product layer thickness in the reaction of CaO with CO₂ALVAREZ, Diego; ABANADES, J. Carlos.Industrial & engineering chemistry research. 2005, Vol 44, Num 15, pp 5608-5615, issn 0888-5885, 8 p.Article

Quality Estimation of Thick-film Resistor Terminations Based on Electrical Parameters ExtractionKIEŁBASINSKI, Konrad; JAKUBOWSKA, Małgorzata; KALENIK, Jerzy et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 6937, pp 69371T.1-69371T.6, issn 0277-786X, isbn 978-0-8194-7124-6 0-8194-7124-0, 2Conference Paper

Mass transfer in the membrane phase contactor with an enzyme gel layer immobilized on a membraneTRUSEK-HOLOWNIA, A; NOWORYTA, A.Desalination (Amsterdam). 2004, Vol 162, Num 1-3, pp 335-342, issn 0011-9164, 8 p.Conference Paper

On the meaning of the diffusion layer thickness for slow electrode reactionsMOLINA, A; GONZALEZ, J; LABORDA, E et al.PCCP. Physical chemistry chemical physics (Print). 2013, Vol 15, Num 7, pp 2381-2388, issn 1463-9076, 8 p.Article

Laser microsintering of tungsten in vacuumEBERT, Robby; ULLMANN, Frank; HARTWIG, Lars et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7589, issn 0277-786X, isbn 978-0-8194-7985-3, 75891G.1-75891G.12Conference Paper

Bildanalytische Schichtdickenbestimmung an Al-Diffusionsbeschichtungen = The determination of Al-diffusion layer thickness by image processingBERGHOF-HASSELBÄCHER, E; ROHR, V; NICOLAS, E et al.Praktische Metallographie. 2006, Vol 43, Num 3, pp 127-142, issn 0032-678X, 16 p.Article

Influence of baffle on improving the thickness uniformity of thin film deposited by magnetron sputtering systemHE YU; YADONG JIANG; TAO WANG et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7658, issn 0277-786X, isbn 978-0-8194-8088-0, 76581N.1-76581N.5, 2Conference Paper

Design considerations for p-i-n thyristor structuresRANADEEP DUTTA; ROTHWARF, A.IEEE transactions on power electronics. 1992, Vol 7, Num 2, pp 430-435, issn 0885-8993Article

Effect of material parameters on the open-circuit voltage in a GaInAsSb thermophotovoltaic cellXINCUN PENG; XIN GUO; BAOLIN ZHANG et al.Infrared physics & technology. 2010, Vol 53, Num 1, pp 37-42, issn 1350-4495, 6 p.Article

Applications of terahertz pulsed technology in the pharmaceutical industryTADAY, Philip F.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7601, issn 0277-786X, isbn 0-8194-7997-7 978-0-8194-7997-6, 1Vol, 760102.1-760102.6Conference Paper

Design of transmission linear partial polarizers using a negative film-substrate systemZAGHLOUL, A. R. M; BERZETT, W. A; KEELING, D. A et al.SPIE proceedings series. 2005, pp 58700N.1-58700N.12, isbn 0-8194-5875-9, 1VolConference Paper

A new method for identifying osmotically limited and gel layer controlled pressure independent flux in ultrafiltrationZAIDI, S. K; KARODE, S. K; KIRPALANI, D et al.Canadian journal of chemical engineering. 2004, Vol 82, Num 2, pp 343-348, issn 0008-4034, 6 p.Article

Second harmonic generation from alternate-layer LB films : quadratic enhancement with film thicknessASHWELL, G. J; JACKSON, P. D; LOCHUN, D et al.Proceedings - Royal Society. Mathematical and physical sciences. 1994, Vol 445, Num 1924, pp 385-398, issn 0962-8444Article

Effect of the Ferromagnetic Layer Thickness on the Blocking Temperature in IrMn/CoFe Exchange CouplesVALLEJO-FERNANDEZ, G; KAESWURM, B; FERNANDEZ-OUTON, L. E et al.IEEE transactions on magnetics. 2008, Vol 44, Num 11, pp 2835-2838, issn 0018-9464, 4 p., 1Conference Paper

Analysis of film thickness for magnetron sputtering system with more than one workbenchWANG TAO; YU HE; WU ZHIMING et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7506, issn 0277-786X, isbn 978-0-8194-7892-4 0-8194-7892-X, 75062B.1-75062B.9, 2Conference Paper

Characteristics of nanostructure and electrical properties of Ti thin films as a function of substrate temperature and film thicknessSAVALONI, H; KHOJIER, K; ALAEE, M. S et al.Journal of materials science. 2007, Vol 42, Num 8, pp 2603-2611, issn 0022-2461, 9 p.Article

The effect of film thickness variations in periodic cracking: Analysis and experimentsTAYLOR, A. A; EDLMAYR, V; CORDILL, Mj et al.Surface & coatings technology. 2011, Vol 206, Num 7, pp 1830-1836, issn 0257-8972, 7 p.Conference Paper

Designs of Masks in Thickness UniformityJAING, Cheng-Chung.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7655, issn 0277-786X, isbn 978-0-8194-8085-9, 76551Q.1-76551Q.8, 2Conference Paper

Ultrasonic measurement of condensate film thicknessKIMBALL, Jeramy T; BAILEY, Michael R; HERMANSON, James C et al.The Journal of the Acoustical Society of America. 2008, Vol 124, Num 4, issn 0001-4966, EL.196-EL.202, 1Article

Synthesis of composite materials of carbon nanofibres and ceramic monoliths with uniform and tuneable nanofibre layer thicknessGARCIA-BORDEJE, Enrique; KVANDE, Ingvar; DE CHEN et al.Carbon (New York, NY). 2007, Vol 45, Num 9, pp 1828-1838, issn 0008-6223, 11 p.Article

Stability of landsat-4 thematic mapper outgassing modelsMICIJEVIC, Esad; CHANDER, Gyanesh.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 62960E.1-62960E.11, issn 0277-786X, isbn 0-8194-6375-2, 1VolConference Paper