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Spatio-temporal evolution of thin Alfven resonance layerDMITRIENKO, I. S.Journal of plasma physics. 2010, Vol 76, pp 709-734, issn 0022-3778, 26 p., 5Article

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Gate driver for SiC JFETs with protection against normally-on behaviour induced faultGUEDON, F; SINGH, S. K; MCMAHON, R. A et al.Electronics letters. 2011, Vol 47, Num 6, pp 375-377, issn 0013-5194, 3 p.Article

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