Classifications of discrete livesROY, D; GUPTA, R. P.Microelectronics and reliability. 1992, Vol 32, Num 10, pp 1459-1473, issn 0026-2714Article

Reliability theory and predictions versus realityPETERSSON, Anders.IEEE Applied Power Electronics Conference and Exposition. 2004, isbn 0-7803-8269-2, 3Vol, vol2, 1236-1239Conference Paper

An analytical interpretation of the General Equation of ReliabilityNIEUWHOF, G. W. E.Reliability engineering. 1986, Vol 14, Num 2, pp 149-161, issn 0143-8174Article

Pipeline failure rates-1: Method helps pool multisource dataCALEYO, Francisco; ALFONSO, Lester; ALCANTARA, Juan et al.Oil & gas journal. 2006, Vol 104, Num 36, issn 0030-1388, 64-72 [5 p.]Article

Comment on: extension of the Duane plotting techniqueFLORESCU, R. A.IEEE transactions on reliability. 1986, Vol 35, Num 4, pp 429-430, issn 0018-9529Article

A practical reliability allocation method considering modified criticality factorsOM PRAKASH YADAV; XING ZHUANG.Reliability engineering & systems safety. 2014, Vol 129, pp 57-65, issn 0951-8320, 9 p.Article

C462. More on the relative efficacy of probability scoring rulesJOHNSTONE, D.Journal of statistical computation and simulation (Print). 2002, Vol 72, Num 1, pp 11-14, issn 0094-9655, 4 p.Article

m-Consecutive-k-out-of-n:F systemsPAPASTAVRIDIS, S.IEEE transactions on reliability. 1990, Vol 39, Num 3, pp 386-388, issn 0018-9529, 3 p.Article

Monotonicity and aging properties of random sumsJUN CAI; WILLMOT, Gordon E.Statistics & probability letters. 2005, Vol 73, Num 4, pp 381-392, issn 0167-7152, 12 p.Article

A new framework for part failure-rate prediction modelsWONG, K. L.IEEE transactions on reliability. 1995, Vol 44, Num 1, pp 139-146, issn 0018-9529Article

Design of maintenance conceptsGITS, C. W.International journal of production economics. 1992, Vol 24, Num 3, pp 217-226, issn 0925-5273Conference Paper

Sequential test for the ratio of two constant failure ratesOKSOY, D.IEEE transactions on reliability. 1987, Vol 36, Num 5, pp 605-612, issn 0018-9529Article

On exponential scores statistic for testing against positive agingKOCHAR, S. C; DESHPANDE, J. V.Statistics & probability letters. 1985, Vol 3, Num 2, pp 71-73, issn 0167-7152Article

Interval estimates of average failure rate and unavailability per demandGOODMAN, J.Reliability engineering. 1986, Vol 14, Num 2, pp 107-121, issn 0143-8174Article

Afternoon colonoscopies have higher failure rates than morning colonoscopiesSANAKA, Madhusudhan R; SHAH, Nirav; MULLEN, Kevin D et al.The American journal of gastroenterology. 2006, Vol 101, Num 12, pp 2726-2730, issn 0002-9270, 5 p.Article

Forderung an die Qualität bestückter Leiterplatten aus der Sicht mittelständischer Betriebe = Impératifs de qualité des cartes imprimées toutes équipées du point de vue des fabricants de moyenne importance = Quality requirement of monted printed boards from the point of view of middle importance manufacturersSCHUHWERK, A.VDI-Berichte. 1984, Num 519, pp 69-82, issn 0083-5560Article

Exponential approximations for two classes of aging distributionsBROWN, M; GUANGPING GE.Annals of probability. 1984, Vol 12, Num 3, pp 869-875, issn 0091-1798Article

Une extension de l'approche résistance/contrainte appliquée à la modélisation des lois de défaillance des composants électroniquesRINGLER, J.Revue de statistique appliquée. 1983, Vol 31, Num 2, pp 19-42, issn 0035-175XArticle

Reliability evaluation of fault-tolerant systems. Effect of variability in failure ratesIYER, R. K.IEEE transactions on computers. 1948, Vol 33, Num 2, pp 197-200, issn 0018-9340Article

On diversity, and the elusiveness of independenceLITTLEWOOD, Bev.Lecture notes in computer science. 2002, pp 249-251, issn 0302-9743, isbn 3-540-44157-3, 3 p.Conference Paper

Behaviour analysis of a urea decomposition system in the fertilizer industry under general repair policyDINESH KUMAR; PANDEY, P. C; JAI SINGH et al.Microelectronics and reliability. 1991, Vol 31, Num 5, pp 851-854, issn 0026-2714Article

Constant failure rate―a paradigm in transition?MCLINN, J. A.Quality and reliability engineering international. 1990, Vol 6, Num 4, pp 237-241, issn 0748-8017Article

On coupling of renewal processes with use of failure ratesLINDVALL, T.Stochastic processes and their applications. 1986, Vol 22, Num 1, pp 1-15, issn 0304-4149Article

On closure of the IFR class under formation of coherent systemsSAMANIEGO, F. J.IEEE transactions on reliability. 1985, Vol 34, Num 1, pp 69-72, issn 0018-9529Article

A Bayes explanation of an apparent failure rate paradoxBARLOW, R. E.IEEE transactions on reliability. 1985, Vol 34, Num 2, pp 107-108, issn 0018-9529Article