Simulation requirements for vectors in ATE formatsRAGHURAMAN, R.International Test Conference. 2004, pp 1100-1107, isbn 0-7803-8580-2, 1Vol, 8 p.Conference Paper

A step towards a new generation of group communication systemsMENA, Sergio; SCHIPER, André; WOJCIECHOWSKI, Pawed et al.Lecture notes in computer science. 2003, pp 414-432, issn 0302-9743, isbn 3-540-40317-5, 19 p.Conference Paper

Time to end the tyranny: Leveson and the failure of the fourth estateWRAGG, Paul.Communications law (Haywards Heath). 2013, Vol 18, Num 1, pp 11-20, issn 1746-7616, 10 p.Article

Can object (instance) diagrams help first year students understand program behaviour?THOMAS, Lynda; RATCLIFFE, Mark; THOMASSON, Benjy et al.Lecture notes in computer science. 2004, pp 368-371, issn 0302-9743, isbn 3-540-21268-X, 4 p.Conference Paper

Test results of total ionizing dose conducted at the jet propulsion laboratoryRIVAS, Rosa M; JOHNSTON, Allan H; MIYAHIRA, Tetsuo F et al.IEEE radiation effects data workshop. 2004, pp 36-41, isbn 0-7803-8697-3, 1Vol, 6 p.Conference Paper

A web-based graduate course on design-for-reliability of electronic systemsMCCLUSKEV, Patrick.Proceedings - Electronic Components Conference. 2002, pp 1507-1509, issn 0569-5503, isbn 0-7803-7430-4, 3 p.Conference Paper

Critical infrastructure integration modeling and simulationTOLONE, William J; WILSON, David; RAJA, Anita et al.Lecture notes in computer science. 2004, pp 214-225, issn 0302-9743, isbn 3-540-22125-5, 12 p.Conference Paper

Novel failure mechanism involving the motion of oxygen vacancies in chip capacitorsCOYLE, Roy Tom.SPIE proceedings series. 2003, pp 43-48, isbn 0-8194-5189-4, 6 p.Conference Paper

Fracture mechanics in applicationsIRWIN, G. R.Forensic engineering. 1990, Vol 2, Num 1-2, pp 81-84, issn 0888-8817, 4 p.Article

The identifiability of the competing risks modelHECKMAN, J. J; HONORE, B. E.Biometrika. 1989, Vol 76, Num 2, pp 325-330, issn 0006-3444, 6 p.Article

Case 1: The fatigued motor shaftSOFRONAS, T.Hydrocarbon processing (International ed.). 2001, Vol 80, Num 2, issn 0018-8190, p. 85Article

Software FMEA for Safety-Critical System Based on Co-analysis of System Model and Software ModelLI, Guoqi.IEICE transactions on information and systems. 2012, Vol 95, Num 12, pp 3101-3105, issn 0916-8532, 5 p.Article

The success and failure of methodologies: a comment on Connell (2001) : evaluating soft ORORMEROD, R. J.The Journal of the Operational Research Society. 2001, Vol 52, Num 10, pp 1176-1179, issn 0160-5682Article

ON THE ROLE OF THE COLLECTION PRINCIPLE FOR ∑⁰₂-FORMULAS IN SECOND-ORDER REVERSE MATHEMATICSCHONG, C. T; LEMPP, Steffen; KNIGHT, Julia et al.Proceedings of the American Mathematical Society. 2010, Vol 138, Num 3, pp 1093-1100, issn 0002-9939, 8 p.Article

Ready for the final countdown?SPEAR, M; NATHAN, S.Process engineering. 1999, Vol 80, Num 12, pp 17-18, issn 0370-1859Article

Repair system where the repairmen change depending on the failed machinesYAMASHIRO, M; YUASA, Y.Microelectronics and reliability. 1996, Vol 36, Num 2, pp 231-234, issn 0026-2714Article

The impact of diversity upon common mode failuresLITTLEWOOD, B.Reliability engineering & systems safety. 1996, Vol 51, Num 1, pp 101-113, issn 0951-8320Article

Analysis of a protective system having two types of failureSINGH, S. K; SINGH, R. P.Microelectronics and reliability. 1990, Vol 30, Num 3, pp 473-480, issn 0026-2714Article

The failurë of CIM?WILD, R.Computer-integrated manufacturing systems. 1989, Vol 2, Num 3, pp 130-131, issn 0951-5240Article

The Age of AccountabilityALAN GRIER, David.Computer (Long Beach, CA). 2010, Vol 43, Num 5, pp 6-8, issn 0018-9162, 3 p.Article

Influence of the organic pollution on the reliability of HE9 connectorsCRDTINON, L; EL HADACHI, M; AUGEREAU, F et al.Microelectronics and reliability. 2008, Vol 48, Num 8-9, pp 1129-1132, issn 0026-2714, 4 p.Conference Paper

O (n log n) filtering algorithms for unary resource constraintVILIM, Petr.Lecture notes in computer science. 2004, pp 335-347, issn 0302-9743, isbn 3-540-21836-X, 13 p.Conference Paper

Physics-based reliability assessment of embedded passivesDAMANI, Manoj; PUCHA, Raghuram V; BHATTACHARYA, Swapan et al.Proceedings - Electronic Components Conference. 2004, issn 0569-5503, isbn 0-7803-8365-6, 2Vol, Vol 2, 2027-2031Conference Paper

Selective recovery in distributed systemsNEOGY, Sannistha; SINHA, Anupam; K DAS, Pradip et al.Analog and digital techniques in electrical engineering. Conference. 2004, isbn 0-7803-8560-8, Vol2, 61-64Conference Paper

Strategies for enhanced dual failure restorability with static or reconfigurable p-cycle networksSCHUPKE, Dominic A; GROVER, Wayne D; CLOUQUEUR, Matthieu et al.IEEE International Conference on Communications. 2004, isbn 0-7803-8533-0, vol3, 1628-1633Conference Paper