Pascal and Francis Bibliographic Databases

Help

Search results

Your search

kw.\*:("Ferroelectric thin films")

Document Type [dt]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Publication Year[py]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Discipline (document) [di]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Language

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Author Country

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Results 1 to 25 of 967

  • Page / 39
Export

Selection :

  • and

Generation of oxygen vacancies in the surface of ferroelectric Pb(Nb,Zr,Ti)03RAMOS-MOORE, E; DIAZ-DROGUETT, D. E; SPRING, P et al.Applied surface science. 2011, Vol 257, Num 10, pp 4695-4698, issn 0169-4332, 4 p.Article

Enhanced dielectric and ferroelectric properties of Pb13x/2Lax(Zr0.5Ti0.5)O3 thin films with low lanthanum substitutionZHANG, S. Q; LI, W. L; WANG, L. D et al.Applied surface science. 2011, Vol 257, Num 9, pp 4021-4025, issn 0169-4332, 5 p.Article

Periodicity and orientation dependence of electrical properties of [(Pb0.90La0.10)Ti0.975O3/PbTiO3]n (n = 1-6) multilayer thin filmsJIAGANG WU; DINGQUAN XIAO; JIANGUO ZHU et al.Applied surface science. 2009, Vol 255, Num 19, pp 8305-8308, issn 0169-4332, 4 p.Article

Dynamic hysteresis of ferroelectric Pb(Zr0.52Ti0.48)O3 thin filmsLIU, J.-M; YU, L. C; YUAN, G. L et al.Microelectronic engineering. 2003, Vol 66, Num 1-4, pp 798-805, issn 0167-9317, 8 p.Conference Paper

Relationship between orientation and ferroelectric properties in Ir/PZT/Ir epitaxial capacitorsOKUWADA, K; ISHIDA, J; YAMADA, T et al.Proceedings - IEEE International Symposium on Applications of Ferroelectrics. 2002, pp 115-118, issn 1099-4734, isbn 0-7803-7414-2, 4 p.Conference Paper

PROCEEDINGS OF THE TWELFTH INTERNATIONAL MEETING ON FERROELECTRICITY (IMF-12). Part VI of XIXI YAO; ZHENRONG LI; XIAOYONG WEI et al.Ferroelectrics (Print). 2010, Vol 406, issn 0015-0193, 269 p.Conference Proceedings

Calculation of intrinsic hysteresis loops of ferroelectric thin filmsTAN, E.-K; OSMAN, J; TILLEY, D. R et al.Solid state communications. 2000, Vol 117, Num 2, pp 59-64, issn 0038-1098Article

Effects of the transverse Ising model parameters on the polarizations of multi-surface ferroelectric thin filmsYANG XIONG; KUANG, Xiao-Yu.Solid state communications. 2009, Vol 149, Num 33-34, pp 1373-1378, issn 0038-1098, 6 p.Article

Flexoelectricity induced increase of critical thickness in epitaxial ferroelectric thin filmsHAO ZHOU; JIAWANG HONG; YIHUI ZHANG et al.Physica. B, Condensed matter. 2012, Vol 407, Num 17, pp 3377-3381, issn 0921-4526, 5 p.Article

Magnetoelastic coupling in multilayered ferroelectric/ferromagnetic thin films: A quantitative evaluationCHIOLERIO, A; QUAGLIO, M; LAMBERTI, A et al.Applied surface science. 2012, Vol 258, Num 20, pp 8072-8077, issn 0169-4332, 6 p.Article

The ferroelectric and ferromagnetic characterization of CoFe2O4/Pb(Mg1/3Nb2/3)O3―PbTiO3 multilayered thin filmsGUO, Hong-Li; GUO LIU; LI, Xue-Dong et al.Applied surface science. 2011, Vol 257, Num 15, pp 6573-6576, issn 0169-4332, 4 p.Article

Correlation Radius in Thin Ferroelectric FilmsGLINCHUK, M. D; MOROZOVSKA, A. N; ELISEEV, E. A et al.Ferroelectrics (Print). 2010, Vol 400, pp 243-254, issn 0015-0193, 12 p.Article

Modification of ferroelectric hysteresis in Pb(Nb,Zr,Ti)O3 thin films induced by CO2 adsorptionRAMOS-MOORE, E; LEDERMAN, D; CABRERA, A. L et al.Applied surface science. 2011, Vol 258, Num 3, pp 1181-1183, issn 0169-4332, 3 p.Article

Effects of lanthanum doping on the microstructure and electrical properties of sol-gel derived Pb1-3x/2Lax(Zr0.5Ti0.5)O3 thin filmsZHANG, S. Q; LI, W. L; LI, N et al.Physica. B, Condensed matter. 2010, Vol 405, Num 11, pp 2585-2588, issn 0921-4526, 4 p.Article

Annealing Temperature Effect on Internal Strain and Ferroelectric Properties of Bi3.25La0.75Ti3O12 Thin FilmsXIUMEI WU; YI KAN; XIAOMEI LU et al.Ferroelectrics (Print). 2010, Vol 400, pp 263-268, issn 0015-0193, 6 p.Article

Static and Dynamic Properties of Thin Films with Space ChargesBAUDR, Laurent.Ferroelectrics (Print). 2009, Vol 391, pp 99-107, issn 0015-0193, 9 p.Conference Paper

Polarization Fatigue of NiCr/PZT/BaPbO3 Capacitors on Platinized Silicon WafersSUCHANECK, G; GERLACH, G.Ferroelectrics (Print). 2010, Vol 405, pp 242-248, issn 0015-0193, 7 p.Conference Paper

PROCEEDINGS OF THE TWELFTH INTERNATIONAL MEETING ON FERROELECTRICITY (IMF-12). Part V of XIXI YAO; ZHENRONG LI; XIAOYONG WEI et al.Ferroelectrics (Print). 2010, Vol 405, issn 0015-0193, 337 p.Conference Proceedings

Proceedings of Symposium J on Synthesis Processing and Characterization of Nanoscale Functional Oxide Films - EMRS 2006 Conference, Nice, May 29-June 2, 2006ALEXE, M; CRACIUN, V; GABORIAUD, R et al.Thin solid films. 2007, Vol 515, Num 16, issn 0040-6090, 336 p.Conference Proceedings

Piezoelectric films for MEMS applicationsTROLIER-MCKINSTRY, Susan.Nippon seramikkusu kyokai gakujutsu ronbunshi. 2001, Vol 109, Num 5, pp S76-S79, issn 0914-5400Article

Proceedings of the Second Asian Meeting on Ferroelectricity (AMF-2), Singapore, December 7-11, 1998. Part IV of IVZHU WEIGUANG; YAO XI.Ferroelectrics (Print). 1999, Vol 232, Num 1-4, issn 0015-0193, 300 p.Conference Proceedings

Proceedings of THE 9TH EUROPEAN CONFERENCE ON APPLICATIONS OF POLAR DIELECTRICS (ECAPD-9):PART II OF IV, Rome, Italy, August 25-29, 2008MICHELOTTI, Francesco.Ferroelectrics (Print). 2009, Vol 390, issn 0015-0193, 202 p.Conference Proceedings

Pyroelectric and sensor properties of ferroelectric thin films for energy conversionBUCHANAN, R. C; JIE HUANG.Journal of the European Ceramic Society. 1999, Vol 19, Num 6-7, pp 1467-1471, issn 0955-2219Conference Paper

Low-voltage pulse exciting electron emission from ferroelectric copolymer film cathode: Role of film thickness and emission stabilityLI, J. J; LU, C; XIA, X. X et al.Applied surface science. 2010, Vol 256, Num 21, pp 6433-6436, issn 0169-4332, 4 p.Article

How to extract spontaneous polarization information from experimental data in electric force microscopyFRANKE, K; HUELZ, H; WEIHNACHT, M et al.Surface science. 1998, Vol 415, Num 1-2, pp 178-182, issn 0039-6028Article

  • Page / 39