Polarization ratios for repeatedly reflected X-ray beamsLAWRENCE, J. L.Acta crystallographica. Section A, Crystal physics, diffraction, theoretical and general crystallography. 1983, Vol 39, Num 5, pp 753-755, issn 0567-7394Article

Experiments on dynamical magnetic neutron diffraction by DyFeO₃SCHMIDT, H. H; KONIG, K; DANIEL, H et al.Acta crystallographica. Section A, Crystal physics, diffraction, theoretical and general crystallography. 1983, Vol 39, Num 5, pp 682-685, issn 0567-7394Article

Polarisation-sensitive switch: An integrated intensity-independent solution for 1.3 μm based on the polarisation anisotropy of ordered InGaAsPKRÄMER, S; NEUMANN, S; PROST, W et al.Physica status solidi. A. Applied research. 2005, Vol 202, Num 6, pp 992-996, issn 0031-8965, 5 p.Conference Paper

Einfluss der Dispersion auf die nach der Transmissionsmethode ermittelten Infrarotintensitäten = Influence de la dispersion sur les intensités IR déterminées par la méthode de transmission = Influence of dispersion on infrared intensities determined by the transmission methodKÖSER, H. J. K.Fresenius' Zeitschrift für analytische Chemie. 1984, Vol 317, Num 8, pp 845-852, issn 0016-1152Article

The 'seed-skewness' method for integration of peaks on imaging plates. II. Analysis of bias due to finite size of the peak mask and treatment of α₁-α₂ splittingBOLOTOVSKY, R; COPPENS, P.Journal of applied crystallography. 1997, Vol 30, pp 244-253, issn 0021-8898, 3Article

Comments on «A geometrical correction for precise lattice constant determination» by Bradaczek, Leps, and UebachBERGER, H.Zeitschrift für Naturforschung. Teil A : Physik, physikalische Chemie, Kosmophysik. 1984, Vol 39, Num 1, pp 109-110, issn 0340-4811Article

Rayleigh light scattering by liquids composed of interacting anisotropic molecules. Spherical tensor approach within the second order approximation of the DID modelBANCEWICZ, T.Molecular physics (Print). 1983, Vol 50, Num 1, pp 173-191, issn 0026-8976Article

MEASUREMENT OF X-RAY INTEGRATED INTENSITY WITH DIAGNOSTIC IDENTIFICATION OF PEAK AND BACKGROUNDMATHIESON AM.1983; ACTA CRYSTALLOGRAPHICA. SECTION A. CRYSTAL PHYSICS, DIFFRACTION, THEORETICAL AND GENERAL CRYSTALLOGRAPHY; ISSN 0567-7394; DNK; DA. 1983; VOL. 39; NO 1; PP. 79-83; BIBL. 5 REF.Article

DETERMINATION DE L'INTENSITE INTEGREE EN STEP-SCANNINGRIGOULT J.1979; J. APPL. CRYSTALLOGR.; DNK; DA. 1979; VOL. 12; NO 1; PP. 116-118; ABS. ENG; BIBL. 3 REF.Article

LORENTZ FACTORS FOR LARGE-MOSAIC CRYSTALSAXE JD; HASTINGS JB.1983; ACTA CRYSTALLOGRAPHICA. SECTION A. CRYSTAL PHYSICS, DIFFRACTION, THEORETICAL AND GENERAL CRYSTALLOGRAPHY; ISSN 0567-7394; DNK; DA. 1983; VOL. 39; NO 4; PP. 593-594; BIBL. 3 REF.Article

ON THE DERIVATION OF INTEGRATED REFLECTED ENERGY FORMULAEKALMAN ZH.1979; ACTA CRYSTALLOGR., A; DNK; DA. 1979; VOL. 35; NO 4; PP. 634-641; BIBL. 2 REF.Article

Raman study of ion-induced defects in N-layer grapheneJORIO, Ado; LUCCHESE, Marcia M; STAVALE, Fernando et al.Journal of physics. Condensed matter (Print). 2010, Vol 22, Num 33, issn 0953-8984, 334204.1-334204.5Article

XPS MultiQuant: multimodel XPS quantification softwareMOHAI, M.Surface and interface analysis. 2004, Vol 36, Num 8, pp 828-832, issn 0142-2421, 5 p.Conference Paper

Caractéristiques intégrales de la diffraction des rayons X dans les monocristaux à distribution désordonnée des dislocationsOLEKHNOVICH, N. M.Metallofizika (Kiev). 1986, Vol 8, Num 1, pp 48-53, issn 0204-3580Article

Maximum dynamic range of clipped correlation of integrated laser speckle intensityOGIWARA, A; OHTSUBO, J.Journal of the Optical Society of America. A, Optics and image science. 1988, Vol 5, Num 3, pp 403-405, issn 0740-3232Article

Courbes de diffraction intégrales «presque intrinsèques» dans les conditions de réflexion totale externe et mesure des amplitudes de structure dans les couches superficielles des cristauxIMAMOV, R. M; KONDRASHKINA, E. A.Kristallografiâ. 1986, Vol 31, Num 3, pp 582-583, issn 0023-4761Article

Correlation between the improved stability and low temperature hydrogen effusion in hydrogenated amorphous silicon films grown from hydrogen dilution of silaneYOON, Jong-Hwan.Solid state communications. 2002, Vol 124, Num 8, pp 289-292, issn 0038-1098, 4 p.Article

Fluctuations in intramolecular line shapes-Random matrix theoryMUKAMEL, S; SUE, J; PANDEY, A et al.Chemical physics letters. 1984, Vol 105, Num 2, pp 134-139, issn 0009-2614Article

Etude de la composante cinématique de la diffusion des rayons X en diffraction de Laue par divers plans dans des cristaux minces réelsNIZKOVA, A. I; GUREEV, A. N; DATSENKO, L. I et al.Fizika tverdogo tela. 1984, Vol 26, Num 3, pp 811-814, issn 0367-3294Article

Variation oscillante de l'intensité d'une réflexion RX en fonction d'un ultrason excité dans le cristalEHNTIN, I. R; PUCHKOVA, I. A.Fizika tverdogo tela. 1984, Vol 26, Num 11, pp 3320-3324, issn 0367-3294Article

Magnetic structure of Gd₅Ge₄TAN, L; KREYSSIG, A; PECHARSKY, V. K et al.Physical review B. Condensed matter and materials physics. 2005, Vol 71, Num 21, pp 214409.1-214409.10, issn 1098-0121Article

Localization and integration of diffraction spots from two-dimensional X-ray detector images by digital filteringWAHL, M; KÖRBER, F. C. F.Zeitschrift für Kristallographie. 1997, Vol 212, Num 7, pp 478-485, issn 0044-2968Article

Rapport des intensités de la dispersion diffuse et de la dispersion cohérente des rayons X pour les monocristaux de silicium comportant des défauts du type amasOLEKHNOVICH, N. M; KARPEJ, A. L; OLEKHNOVICH, A. I et al.Metallofizika (Kiev). 1984, Vol 6, Num 5, pp 46-50, issn 0204-3580Article

Integrated intensities using a six-circle surface X-ray diffractometerVLIEG, E.Journal of applied crystallography. 1997, Vol 30, pp 532-543, issn 0021-8898, 5Article

Continuous-wave saturation of two-component, inhomogeneously broadened, anisotropic EPR spectraPALI, T; HORVATH, L. I; DEREK MARSH et al.Journal of magnetic resonance. Series A (Print). 1993, Vol 101, Num 2, pp 215-219, issn 1064-1858Article